IEC 63287-2:2023

IEC 63287-2:2023

IEC 63287-2:2023 Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

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Details

IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

Additional Info

Author International Electrotechnical Commission (IEC)
Committee TC 47
Published by IEC
Document type Standard
Edition 1.0
ICS 31.080.01 : Semiconductor devices in general
Number of pages 30
Keyword IEC63287-2,IEC 63287-2:2023,IEC 63287-2,TC 47