BS IEC 62373-1:2020

BS IEC 62373-1:2020

Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI MOSFET

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Details

Transistors,Metal oxide semiconductors,Electronic equipment and components,Temperature,Semiconductors,Voltage measurement,Semiconductor devices,Testing conditions

Additional Info

Author British Standards Institution (BSI)
Committee EPL/47 - Electrical
Published by BSI
Document type Standard
EAN ISBN 978 0 580 51373 2
ICS 31.080.30 : Transistors
Number of pages 26
Keyword BS IEC 62373-1:2020