19/30404655 DC:2019

19/30404655 DC:2019

BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate

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Details

Substrates (insulating),Electrical equipment,Computer hardware,Components,Electrical components,Computer components,Common terms,Electronic equipment and components,Semiconductor technology

Additional Info

Author British Standards Institution (BSI)
Committee EPL/47 - Electrical
Published by BSI
Document type Draft standard
ICS 31.080.01 : Semiconductor devices in general
31.080.99 : Other semiconductor devices
Number of pages 23
Cross references 47/2599/CD
Keyword 19/30404655 DC