18/30386543 DC:2018

18/30386543 DC:2018

BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate

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Details

Substrates (insulating),Electrical equipment,Computer hardware,Components,Electrical components,Computer components,Common terms,Electronic equipment and components,Semiconductor technology

Additional Info

Author British Standards Institution (BSI)
Committee EPL/47 - Electrical
Published by BSI
Document type Draft standard
ICS 31.080 : Semiconductor devices
31.080.01 : Semiconductor devices in general
31.080.99 : Other semiconductor devices
Number of pages 28
Cross references IEC 63229 Ed.1.0
Keyword 18/30386543 DC