17/30366375 DC:2017

17/30366375 DC:2017

BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method

€24.00
Alert me in case of modifications on this product

Details

Transistors,Metal oxide semiconductors,Electronic equipment and components,Temperature,Semiconductors,Voltage measurement,Semiconductor devices,Testing conditions

Additional Info

Author British Standards Institution (BSI)
Committee EPL/47 - Electrical
Published by BSI
Document type Draft standard
ICS 31.080.30 : Transistors
Number of pages 16
Keyword 17/30366375 DC