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JEDEC

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  • ESDA/JEDEC JS-002:2018

    ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level
    1/1/2019 - PDF - English - JEDEC
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    €178.64

  • EIA JESD 22-A113H:2016

    Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
    11/1/2016 - PDF sécurisé - English - JEDEC
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    €51.92

  • EIA JEP 151:2015

    Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
    9/1/2015 - PDF - English - JEDEC
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    €55.80

  • EIA JEP 001A:2014

    FOUNDRY PROCESS QUALIFICATION GUIDELINES (Wafer Fabrication Manufacturing Sites)
    2/1/2014 - PDF sécurisé - English - JEDEC
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    €267.52

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