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  • AEC Q100 Rev H:2014

    Failure Mechanism Based Stress Test Qualification for Integrated Circuits
    9/11/2014 - PDF sécurisé - English - AEC
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    €21.25

  • AEC Q101 Rev D1:2013

    Failure Mechanism based Stress Test Qualification for Discrete Semiconductors in Automotive Applications
    9/6/2013 - PDF sécurisé - English - AEC
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    €23.00

  • AEC Q100-004 Rev D:2012

    Failure Mechanism Based Stress Test Qualification for Integrated Circuits - Attachment 4: IC Latch-Up Test
    8/7/2012 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q002 Rev B:2012

    Guidelines for Statistical Yield Analysis
    1/12/2012 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q001 Rev D:2011

    Guidelines for Part Average Testing
    12/9/2011 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q200-001 Rev B:2010

    Stress test qualification for passive components - Attachment 1: Flame retardance test
    6/1/2010 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q200-002 Rev B:2010

    Stress test qualification for passive components - Attachment 2: Human body model electrostatic discharge test
    6/1/2010 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q200-003 Rev B:2010

    Stress test qualification for passive components - Attachment 3: Beam load (break strength) test
    6/1/2010 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q200-005 Rev A:2010

    Stress test qualification for passive components - Attachment 5: Board flex test
    6/1/2010 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q200-006 Rev A:2010

    Stress test qualification for passive components - Attachment 6: Terminal strength (SMD) / Shear stress test
    6/1/2010 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q200-007 Rev A:2010

    Stress test qualification for passive components - Attachment 7: Voltage surge test
    6/1/2010 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q200 Rev D:2010

    Stress test qualification for passive components
    6/1/2010 - PDF sécurisé - English - AEC
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    €17.71

  • AEC Q005 Rev A:2010

    PB-free test requirements
    6/1/2010 - PDF sécurisé - English - AEC
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    €17.71

  • AEC Q100-007 Rev B:2007

    Failure Mechanism Based Stress Test Qualification for Integrated Circuits; Attachment 7 - Fault Simulation and Fault Grading
    9/18/2007 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q100-009 Rev B:2007

    Failure Mechanism Based Stress Test Qualification for Integrated Circuits; Attachment 9 - Electrical Distributions Assessment
    8/27/2007 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q100-012:2006

    Failure Mechanism Based Stress Test Qualification for Integrated Circuits; Attachment 12 - Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems
    9/14/2006 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q101-006:2006

    Stress Test Qualification for Automotive Grade Discrete Semiconductors; Attachment 6 - Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems
    9/14/2006 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q101-003 Rev A:2005

    Stress Test Qualification for Automotive Grade Discrete Semiconductors; Attachment 3 - Wire Bond Shear Test
    7/18/2005 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q101-001 Rev A:2005

    Stress Test Qualification for Automotive Grade Discrete Semiconductors; Attachment 1 - Human Body Model (HBM) Electrostatic Discharge (ESD) Test
    7/18/2005 - PDF sécurisé - English - AEC
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    €17.71

  • AEC Q101-005:2005

    Stress Test Qualification for Automotive Grade Discrete Semiconductors; Attachment 5 - Capacitive Discharge Model (CDM) Electrostatic Discharge (ESD) Test
    7/18/2005 - PDF sécurisé - English - AEC
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    €17.71

  • AEC Q100-008 Rev A:2003

    Failure Mechanism Based Stress Test Qualification for Integrated Circuits; Attachment 8 - Early Life Failure Rate (ELFR)
    7/18/2003 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q100-010 Rev A:2003

    Failure Mechanism Based Stress Test Qualification for Integrated Circuits; Attachment 10 - Solder Ball Shear Test
    7/18/2003 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q200-004 Rev A:2000

    Stress test qualification for passive components - Attachment 4: Measurement procedures for resettable fuses
    6/1/2000 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q100-001 Rev C:1998

    Failure Mechanism Based Stress Test Qualification for Integrated Circuits; Attachment 1 - Wire Bond Shear Test
    10/8/1998 - PDF sécurisé - English - AEC
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    €25.00

  • AEC Q101-004:1996

    Stress Test Qualification for Automotive Grade Discrete Semiconductors; Attachment 4 - Miscellaneous Test Methods
    5/15/1996 - PDF sécurisé - English - AEC
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    €25.00

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