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JEDEC

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  • EIA JESD 230-B:2014

    7/1/2014 - PDF sécurisé - English - USA - JEDEC - - NAND Flash Interface Interoperability
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    €86.45

  • EIA JESD 75-6:2006

    3/1/2006 - PDF sécurisé - English - USA - JEDEC - - PSO-N/PQFN Pinouts Standardized for 14-, 16-, 20-, and 24-Lead Logic Functions
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    €38.95

  • EIA JESD 37:1992

    10/1/1992 - PDF sécurisé - English - USA - JEDEC - - Standard for Lognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Method
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    €56.05

  • EIA JESD 237:2014

    3/1/2014 - PDF sécurisé - English - USA - JEDEC - - Reliability Qualification of Power Amplifier Modules
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    €63.65

  • EIA JESD 22-A109-B:2011

    11/1/2011 - PDF sécurisé - English - USA - JEDEC - - Hermeticity
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    €45.60

  • EIA JESD 22-A100-D:2013

    7/1/2013 - PDF sécurisé - English - USA - JEDEC - - Cycled Temperature-Humidity-Bias Life Test
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    €50.35

  • EIA JESD 213:2010

    3/1/2010 - PDF sécurisé - English - USA - JEDEC - - Common Test Method for Detecting Component Surface Finish Materials
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    €38.95

  • EIA JESD 202:2006

    3/1/2006 - PDF sécurisé - English - USA - JEDEC - - Method for Characterizing the Electromigration Failure Time Distribution of Interconnects Under Constant-Current and Temperature Stress
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    €57.95

  • EIA JESD 51-53:2012

    5/1/2012 - PDF sécurisé - English - USA - JEDEC - - Terms, Definitions and Units Glossary for LED Thermal Testing
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    €53.20

  • EIA JEP 148-B:2014

    1/1/2014 - PDF sécurisé - English - USA - JEDEC - - Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment
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    €74.10

  • EIA JESD 79-3-3:2013

    12/1/2013 - PDF sécurisé - English - USA - JEDEC - - 3D Stacked SDRAM
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    €110.20

  • EIA JESD 22-B109B:2014

    7/1/2014 - PDF sécurisé - English - USA - JEDEC - - Flip Chip Tensile Pull
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    €53.20

  • EIA JESD 22-B117-B:2014

    5/1/2014 - PDF sécurisé - English - USA - JEDEC - - Solder Ball Shear
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    €58.90

  • EIA JESD 8-22-B:2014

    4/1/2014 - PDF sécurisé - English - USA - JEDEC - - HSUL 12 LPDDR2 and LPDDR3 I/O with Optional ODT
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    €74.10

  • EIA JEP 153-A:2014

    3/1/2014 - PDF sécurisé - English - USA - JEDEC - - Characterization and Monitoring of Thermal Stress Test Oven Temperatures
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    €57.00

  • EIA JESD 79-3-1-A + Change 1:2013

    5/1/2013 - PDF sécurisé - English - USA - JEDEC - - Addendum No. 1 to JESD79-3 - 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, DDR3L-1600, and DDR3L-1866
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    €63.65

  • EIA JESD 51-12 + Change 1:2012

    11/1/2012 - PDF sécurisé - English - USA - JEDEC - - Guidelines for Reporting and Using Electronic Package Thermal Information
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    €68.40

  • EIA JEP 144-A:2011

    11/1/2011 - PDF sécurisé - English - USA - JEDEC - - Guideline for Internal Gas Analysis for Microelectronic Packages
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    €54.15

  • EIA JESD 216-B:2014

    5/1/2014 - PDF sécurisé - English - USA - JEDEC - - Serial Flash Discoverable Parameters (SFDP)
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    €86.45

  • EIA JESD 246:2014

    1/1/2014 - PDF sécurisé - English - USA - JEDEC - - Customer Notification Process for Disasters
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    €48.45

  • EIA JESD 49-A + Change 1:2013

    10/1/2013 - PDF sécurisé - English - USA - JEDEC - - Procurement Standard for Semiconductor Die Products Including Known Good Die (KGD)
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    €57.00

  • EIA JESD 8-21-A:2013

    9/1/2013 - PDF sécurisé - English - USA - JEDEC - - POD135 - 1.35 V Pseudo Open Drain I/O
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    €63.65

  • EIA JEP 162:2013

    1/5/2013 - PDF sécurisé - English - USA - JEDEC - - System Level ESD Part II: Implementation of Effective ESD Robust Designs
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    €181.45

  • EIA JESD 99-C:2012

    12/4/2012 - PDF sécurisé - English - USA - JEDEC - - Terms, Definitions, and Letter Symbols for Microelectronic Devices
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    €154.85

  • EIA JESD 226:2013

    1/4/2013 - PDF sécurisé - English - USA - JEDEC - - RF BIASED LIFE (RFBL) TEST METHOD
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    €57.00

  • EIA JEP 170:2013

    1/4/2013 - PDF sécurisé - English - USA - JEDEC - - Guidelines for Visual Inspection and Control of Flip Chip Type Components (FCxGA)
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    €56.05

  • EIA JESD 22-A111-A:2010

    11/1/2010 - PDF sécurisé - English - USA - JEDEC - - Evaluation Procedure for Determining Capability to Bottom Side Board Attach by Full Body Solder Immersion of Small Surface Mount Solid State Devices
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    €53.20

  • EIA JEP 156:2009 (R2012)

    3/1/2009 - PDF sécurisé - English - USA - JEDEC - - Chip-Package Interaction Understanding, Identification and Evaluation
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    €63.65

  • EIA JESD 89-A + Addenda 3:2007 (R2012)

    11/1/2007 - PDF sécurisé - English - USA - JEDEC - - Test Method for Beam Accelerated Soft Error Rate
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    €267.90

  • EIA JESD 72:2001 (R2007)

    6/1/2001 - PDF sécurisé - English - USA - JEDEC - - Test Methods and Acceptance Procedures for the Evaluation of Polymeric Materials
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    €49.40

  • EIA JESD 224:2013

    3/1/2013 - PDF sécurisé - English - USA - JEDEC - - Universal Flash Storage (UFS) Test
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    €289.75

  • EIA JESD 22-A107-C:2013

    4/1/2013 - PDF sécurisé - English - USA - JEDEC - - Salt Atmosphere
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    €45.60

  • EIA JEP 70-C:2013

    10/1/2013 - PDF sécurisé - English - USA - JEDEC - - Guide to Standards and Publications Relating to Quality and Reliability of Electronic Hardware
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    €100.70

  • EIA JESD 22-C101-F:2013

    10/1/2013 - PDF sécurisé - English - USA - JEDEC - - Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components
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    €56.05

  • EIA JESD 670-A:2013

    10/1/2013 - PDF sécurisé - English - USA - JEDEC - - QUALITY SYSTEM ASSESSMENT
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    €68.40

  • EIA JESD 234:2013

    10/1/2013 - PDF sécurisé - English - USA - JEDEC - - TEST STANDARD FOR THE MEASUREMENT OF PROTON RADIATION SINGLE EVENT EFFECTS IN ELECTRONIC DEVICES
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    €74.10

  • EIA JESD 22-B110-B:2013

    7/1/2013 - PDF sécurisé - English - USA - JEDEC - - Mechanical Shock - Component and Subassembly
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    €51.30

  • EIA JEP 150:2005 + Change 1:2013

    6/1/2013 - PDF sécurisé - English - USA - JEDEC - - Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface-Mount Components
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    €63.65

  • EIA JESD 209-2-F:2012

    6/1/2012 - PDF sécurisé - English - USA - JEDEC - - Low Power Double Data Rate 2 (LPDDR2)
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    €289.75

  • EIA JEP 167:2013

    4/1/2013 - PDF sécurisé - English - USA - JEDEC - - Characterization of Interfacial Adhesion in Semiconductor Packages
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    €68.40

  • EIA JESD 307:1965 (R2002)

    5/1/1965 - PDF sécurisé - English - USA - JEDEC - - Voltage Regulator Diode Noise Voltage Measurement
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    €36.10

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