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  • EIA-198-2-E:1998

    1/1/1998 - PDF sécurisé - English - USA - EIA - - Ceramic Dielectric Capacitors Classes I, II, III, and IV Part II: Test Methods
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    €214.20

  • EIA RS-217-A:1961

    1/1/1961 - PDF sécurisé - English - USA - EIA - - Wound Cut Cores
    Learn More
    €65.70

  • EIA-257:1962

    1/1/1962 - PDF sécurisé - English - USA - EIA - - Mercury Warning Label R(1979)
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    €54.00

  • EIA-260:1962

    1/1/1962 - PDF sécurisé - English - USA - EIA - - Tape-Wound Toroidal Cores R(1983)
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    €62.10

  • EIA-268:1963

    1/1/1963 - PDF sécurisé - English - USA - EIA - - Infrared-Filter Transmission R(1982)
    Learn More
    €56.70

  • EIA-280-C:1992

    4/20/1992 - PDF sécurisé - English - USA - EIA - - Solderless Wrapped Electrical Connections
    Learn More
    €90.00

  • EIA-287:1963

    11/1/1963 - PDF sécurisé - English - USA - EIA - - Mercury Content Label
    Learn More
    €54.00

  • EIA-293:1964

    1/1/1964 - PDF sécurisé - English - USA - EIA - - Sonic Wire Delay Lines R(1982)
    Learn More
    €57.60

  • EIA JESD 306:1965

    5/1/1965 - PDF sécurisé - English - USA - EIA - - Measurement of Small Signal HF, VHF, and UHF Power Gain of Transistors
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    €34.20

  • EIA JESD 307:1992

    1/1/1992 - PDF sécurisé - English - USA - EIA - - Voltage Regulator Diode Noise Voltage Measurement
    Learn More
    €34.20

  • EIA JESD 311A:1981

    11/1/1981 - PDF sécurisé - English - USA - EIA - - Measurement of Transistor Noise Figure at MF, HF, and VHF
    Learn More
    €43.20

  • EIA JESD 320-A:1992

    12/1/1992 - PDF sécurisé - English - USA - EIA - - Conditions for Measurement of Diode Static Parameters
    Learn More
    €33.30

  • EIA-322:1965

    1/1/1965 - PDF sécurisé - English - USA - EIA - - Wire-Wound Power-Type Rheostats R(1988)
    Learn More
    €72.00

  • EIA-339:1967

    1/1/1967 - PDF sécurisé - English - USA - EIA - - Layer-To-Layer Adhesion of Magnetic Tape, Recommended Test Method R(1974)
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    €56.70

  • EIA JESD 340:1967

    11/1/1967 - PDF sécurisé - English - USA - EIA - - Standard for the Measurement of CRE
    Learn More
    €38.70

  • EIA-364-44A:1998

    3/1/1998 - PDF sécurisé - English - USA - EIA - - TP-44A Corona Test Procedure for Electrical Connectors
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    €67.50

  • EIA-364-54A:1999

    5/1/1999 - PDF sécurisé - English - USA - EIA - - TP-54A Magnetic Permeability Test Procedure for Electrical Connectors, Contacts, and Sockets
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    €64.80

  • EIA-364-79:1998

    8/1/1998 - PDF sécurisé - English - USA - EIA - - TP-79 INSERT BOND STRENGTH TEST PROCEDURE FOR ELECTRICAL CONNECTORS
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    €64.80

  • EIA-364-85:1996

    6/1/1996 - PDF sécurisé - English - USA - EIA - - TP-85 GENERAL TEST PROCEDURE FOR ASSESSING WEAR AND MECHANICAL DAMAGE TESTING OF CONTACT FINISHES FOR ELECTRICAL CONNECTORS
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    €82.80

  • EIA-364-92:1997

    4/1/1997 - PDF sécurisé - English - USA - EIA - - TP-92 Wire Bending Test Procedure for Insulation Displacement Contacts (IDC) for Electrical Connectors
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    €62.10

  • EIA-364-94:1997

    6/1/1997 - PDF sécurisé - English - USA - EIA - - TP-94 TRANSVERSE EXTRACTION FORCE TEST PROCEDURE FOR INSULATION DISPLACEMENT CONTACTS (IDC) FOR ELECTRICAL CONNECTORS
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    €62.10

  • EIA-364-95:1999

    4/1/1999 - PDF sécurisé - English - USA - EIA - - TP-95 Full Mating and Mating Stability Test Procedure for Electrical Connectors
    Learn More
    €67.50

  • EIA-364-97:1997

    6/1/1997 - PDF sécurisé - English - USA - EIA - - TP-97 HOUSING PANEL RETENTION TEST PROCEDURE FOR ELECTRICAL CONNECTORS
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    €62.10

  • EIA-364-98:1997

    6/1/1997 - PDF sécurisé - English - USA - EIA - - TP-98 Housing Locking Mechanism Strength Test Procedure for Electrical Connectors
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    €57.60

  • EIA-364-102:1998

    12/1/1998 - PDF sécurisé - English - USA - EIA - - TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems
    Learn More
    €72.00

  • EIA JESD 371:1970

    2/1/1970 - PDF sécurisé - English - USA - EIA - - Measurement of Small-Signal VHF-UHF Transistor Short-Circuit Forward Current Transfer Ratio
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    €36.90

  • EIA JESD 372:1970

    5/1/1970 - PDF sécurisé - English - USA - EIA - - The Measurement of Small-Signal VHF-UHF Transistor Admittance Parameters
    Learn More
    €38.70

  • EIA JESD 398:1972

    7/1/1972 - PDF sécurisé - English - USA - EIA - - Measurement of Small Values of Transistor Capacitance
    Learn More
    €38.70

  • EIA JESD 471:1980

    2/1/1980 - PDF sécurisé - English - USA - EIA - - Symbol and Label for Electrostatic Sensitive Devices
    Learn More
    €34.20

  • EIA JESD 482-A:1984

    8/1/1984 - PDF sécurisé - English - USA - EIA - - List of Preferred Values for Use on Various Types of Small Signal and Regulator Diodes
    Learn More
    €41.40

  • EIA-498BA00:1990

    1/1/1990 - PDF sécurisé - English - USA - EIA - - Blank Detail Specification for Keyboard Switches
    Learn More
    €64.80

  • EIA-535BAAC-A:1998

    11/1/1998 - PDF sécurisé - English - USA - EIA - - Fixed Tantalum Chip Capacitor Style 1 Protected (Molded)
    Learn More
    €70.20

  • EIA JESD 353:1968

    4/1/1968 - PDF sécurisé - English - USA - EIA - - The Measurement of Transistor Noise Figure at Frequencies up to 20 kHz by Sinusoidal Signal-Generator Method
    Learn More
    €36.00

  • EIA JESD 354:1968

    4/1/1968 - PDF sécurisé - English - USA - EIA - - The Measurement of Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies of up to 20 kHz
    Learn More
    €36.00

  • EIA-359-A:1985

    1/1/1985 - PDF sécurisé - English - USA - EIA - - Standard Colors for Color Identification and Coding
    Learn More
    €124.20

  • EIA-359-A-1:1988

    1/1/1988 - PDF sécurisé - English - USA - EIA - - Special Colors
    Learn More
    €112.50

  • EIA-362:1969

    1/1/1969 - PDF sécurisé - English - USA - EIA - - Tensile Properties of Magnetic Tape, Recm. Test Method R(1974)
    Learn More
    €62.10

  • EIA-364-05B:1998

    5/1/1998 - PDF sécurisé - English - USA - EIA - - TP-05B Contact Insertion, Release and Removal Force Test Procedure for Electrical Connectors
    Learn More
    €64.80

  • EIA-364-14B:1999

    4/1/1999 - PDF sécurisé - English - USA - EIA - - TP-14B Ozone Exposure Test Procedure for Electrical Connectors
    Learn More
    €65.70

  • EIA JESD 435:1976

    4/1/1976 - PDF sécurisé - English - USA - EIA - - Standard for the Measurement of Small-Signal Transistor Scattering Parameters
    Learn More
    €44.10

  • EIA CB-12:1990

    1/1/1990 - PDF sécurisé - English - USA - EIA - - Gold Plating Study Test Report
    Learn More
    €75.60

  • EIA CB-11:1986

    1/1/1986 - PDF sécurisé - English - USA - EIA - - Surface Mounting of Multilayer Ceramic Chip Capacitors, Guidelines for
    Learn More
    €99.90

  • EIA/TIA-455-15A:1992

    3/1/1992 - PDF sécurisé - English - USA - EIA - - FOTP- 15 Altitude/Immersion of Fiber Optic Components
    Learn More
    €68.40

  • EIA/TIA-455-32A:1990

    2/21/1990 - PDF sécurisé - English - USA - EIA - - FOTP-32 Fiber Optic Circuit Discontinuities
    Learn More
    €23.94

  • EIA/TIA-455-35A:1990

    4/27/1990 - PDF sécurisé - English - USA - EIA - - FOTP-35 Fiber Optic Component Dust (Fine Sand) Test
    Learn More
    €21.78

  • EIA/TIA-455-42A:1989

    10/20/1989 - PDF sécurisé - English - USA - EIA - - FOTP-42 Optical Crosstalk in Fiber Optic Components
    Learn More
    €22.32

  • EIA/TIA-455-82B:1992

    2/1/1992 - PDF sécurisé - English - USA - EIA - - FOTP 82-B Fluid Penetration Test for Fluid-Blocked Fiber Optic Cable
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    €22.86

  • EIA/TIA-455-184:1991

    5/3/1991 - PDF sécurisé - English - USA - EIA - - FOTP-184 Coupling Proof Overload Test for Fiber Optic Interconnecting Devices
    Learn More
    €21.78

  • EIA/TIA-455-185:1991

    5/3/1991 - PDF sécurisé - English - USA - EIA - - FOTP-185 Strength of Coupling Mechanism For Fiber Optic Interconnecting Devices
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    €21.78

  • EIA/TIA-455-190:1992

    3/1/1992 - PDF sécurisé - English - USA - EIA - - FOTP-190 Low Air Pressure (High Altitude) Testing of Fiber Optic Components
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    €22.86

  • EIA/TIA-559:1989

    3/1/1989 - PDF sécurisé - English - USA - EIA - - Single-Mode Fiber Optic System Transmission Design
    Learn More
    €29.61

  • EIA/TIA-559-1:1992

    10/1/1992 - PDF sécurisé - English - USA - EIA - - Single-Mode Fiber Optic System Transmission Design
    Learn More
    €30.69

  • EIA/TIA/IS-63:1990

    8/1/1990 - PDF sécurisé - English - USA - EIA - - Procedures for Automatic Interworking Between Automode Modems and Modems Conforming to Recommendations V.32, V.22bis, and V.22
    Learn More
    €20.97

  • EIA JEP 65:1967

    1/1/1967 - PDF sécurisé - English - USA - EIA - - Verification of Maximum Ratings of Power Transistors, Test Procedures for
    Learn More
    €46.80

  • EIA JEP 69-B:1973

    1/1/1973 - PDF sécurisé - English - USA - EIA - - Preferred Lead Configurations for Field-Effect Transistors
    Learn More
    €34.20

  • EIA JEP 78:1969

    1/1/1969 - PDF sécurisé - English - USA - EIA - - Relative Spectral Response Curves for Semiconductor Infrared Detectors
    Learn More
    €46.80

  • EIA JEP 79:1969

    9/1/1969 - PDF sécurisé - English - USA - EIA - - Life Test Methods for Photoconductive Cells
    Learn More
    €46.80

  • EIA JEP 103A:1996

    7/1/1996 - PDF sécurisé - English - USA - EIA - - Suggested Product-Documentation Classification and Disclaimers R(2003)
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    €34.20

  • EIA JEP 110:1988

    1/1/1988 - PDF sécurisé - English - USA - EIA - - Guidelines for the Measurement of Thermal Resistance of GaAs FETs
    Learn More
    €38.70

  • EIA JEP 115:1989

    8/1/1989 - PDF sécurisé - English - USA - EIA - - Power MOSFET Electrical Dose Rate Test Method
    Learn More
    €36.90

  • EIA JEP 116:1991

    1/1/1991 - PDF sécurisé - English - USA - EIA - - CMOS Semicustom Design Guidelines
    Learn More
    €98.10

  • EIA JEP 118:1993

    1/1/1993 - PDF sécurisé - English - USA - EIA - - Guidelines for GaAs MMIC and FET Life Testing
    Learn More
    €43.20

  • EIA JEP 123:1995

    1/1/1995 - PDF sécurisé - English - USA - EIA - - Guideline for Measurement of Electronic Package Inductance and Capacitance Model Parameters
    Learn More
    €44.10

  • EIA JEP 126:1996

    1/1/1996 - PDF sécurisé - English - USA - EIA - - Guideline for Developing and Documenting Package Electrical Models Derived from Computational Analysis
    Learn More
    €34.20

  • EIA JEP 128:1996

    1/1/1996 - PDF sécurisé - English - USA - EIA - - Guide for Standard Probe Pad Sizes and Layouts for Wafer-Level Electrical Testing
    Learn More
    €36.00

  • EIA JEP 132:1998

    7/1/1998 - PDF sécurisé - English - USA - EIA - - Process Characterization Guideline
    Learn More
    €53.10

  • EIA JEP 134:1998

    9/1/1998 - PDF sécurisé - English - USA - EIA - - Guidelines for Preparing Customer-Supplied Background Information Relating to a Semiconductor-Device Failure Analysis
    Learn More
    €40.50

  • EIA JESD 1:1982

    1/1/1982 - PDF sécurisé - English - USA - EIA - - Leadless Chip Carrier Pinouts Standardized for Linear's
    Learn More
    €36.90

  • EIA JESD 2:1982

    1/1/1982 - PDF sécurisé - English - USA - EIA - - Digital Bipolar Pinouts for Chip Carriers
    Learn More
    €36.90

  • EIA JESD 3-C:1994

    1/1/1994 - PDF sécurisé - English - USA - EIA - - Standard Data Transfer Format Between Data Preparation System and Programmable Logic Device Programmer
    Learn More
    €54.90

  • EIA JESD 4:1983

    11/1/1983 - PDF sécurisé - English - USA - EIA - - Definition of External Clearance and Creepage Distances of Discrete Semiconductor Packages for Thyristors and Rectifier Diodes
    Learn More
    €34.20

  • EIA JESD 5:1982

    2/1/1982 - PDF sécurisé - English - USA - EIA - - Mesurement of Temperature Coefficient of Voltage Regulator Diodes
    Learn More
    €34.20

  • EIA JESD 6:1967

    2/1/1967 - PDF sécurisé - English - USA - EIA - - Measurement of Small Values of Transistor Capacitance
    Learn More
    €42.30

  • EIA JESD 7-A:1986

    1/1/1986 - PDF sécurisé - English - USA - EIA - - 54/74HCXXXX and 54/74HCTXXXX High Speed CMOS Devices, Description of
    Learn More
    €98.10

  • EIA JESD 8-2:1993

    1/1/1993 - PDF sécurisé - English - USA - EIA - - Standard for Operating Voltages and Interface Levels for Low Voltage Emitter-Coupled Logic (ECL) Integrated Circuits
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    €36.00

  • EIA JESD 8-4:1993

    1/1/1993 - PDF sécurisé - English - USA - EIA - - Center-Tap-Terminated (CTT) Low-Level, High- Speed Interface Standard for Digital Integrated Circuits
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    €34.20

  • EIA JESD 8-6:1995

    1/1/1995 - PDF sécurisé - English - USA - EIA - - High Speed Transceiver Logic (HSTL) A 1.5V Output Buffer Supply Voltage Based Interface Standard for Digital Integrated Circuits
    Learn More
    €43.20

  • EIA JESD 8-8:1996

    1/1/1996 - PDF sécurisé - English - USA - EIA - - Stub Series Terminated Logic for 3.3 Volts (SSTL-3)
    Learn More
    €42.30

  • EIA JESD 10:1976

    1/1/1976 - PDF sécurisé - English - USA - EIA - - Low Frequency Power Transistors
    Learn More
    €132.30

  • EIA JESD 11:1984

    1/1/1984 - PDF sécurisé - English - USA - EIA - - Chip Carrier Pinouts Standardized for CMOS 4000, HC and HCT Series of Logic Circuits
    Learn More
    €36.90

  • EIA JESD 12:1985

    1/1/1985 - PDF sécurisé - English - USA - EIA - - Standard for Gate Array Benchmark Set
    Learn More
    €38.70

  • EIA JESD 12-1B:1993

    1/1/1993 - PDF sécurisé - English - USA - EIA - - Terms and Definitions for Gate Arrays and Cell-Based Digital Integrated Circuits
    Learn More
    €43.20

  • EIA JESD 12-2:1986

    1/1/1986 - PDF sécurisé - English - USA - EIA - - Standard for Cell-Based Integrated Circuit Benchmark Set
    Learn More
    €54.90

  • EIA JESD 12-3:1986

    1/1/1986 - PDF sécurisé - English - USA - EIA - - CMOS Gate Array Macrocell Standard
    Learn More
    €42.30

  • EIA JESD 12-4:1987

    1/1/1987 - PDF sécurisé - English - USA - EIA - - Method of Specification of Performance Parameters for CMOS Semicustom Integrated Circuits
    Learn More
    €43.20

  • EIA JESD 12-5:1988

    1/1/1988 - PDF sécurisé - English - USA - EIA - - Design for Testability Guidelines
    Learn More
    €98.10

  • EIA JESD 12-6:1991

    1/1/1991 - PDF sécurisé - English - USA - EIA - - Interface Standard for Semicustom Integrated Circuits
    Learn More
    €38.70

  • EIA JESD 13-B:1980

    1/1/1980 - PDF sécurisé - English - USA - EIA - - Description of 'B' Series CMOS Devices, Spec. for
    Learn More
    €56.70

  • EIA JESD 14:1986

    11/1/1986 - PDF sécurisé - English - USA - EIA - - Semiconductor Power Control Modules
    Learn More
    €42.30

  • EIA JESD 16-A:1995

    4/1/1995 - PDF sécurisé - English - USA - EIA - - Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM)
    Learn More
    €67.50

  • EIA JESD 18-A:1993

    1/1/1993 - PDF sécurisé - English - USA - EIA - - Standard for Description of Fast CMOS TTL Compatible Logic
    Learn More
    €56.70

  • EIA JESD 20:1990

    1/1/1990 - PDF sécurisé - English - USA - EIA - - Standard for Description of 54/74ACXXXXX and 54/74ACTXXXXX Advanced High-Speed CMOS Devices
    Learn More
    €132.30

  • EIA JESD 24:1985

    1/1/1985 - PDF sécurisé - English - USA - EIA - - Power MOSFET's
    Learn More
    €63.90

  • EIA JESD 24-1:1989

    10/1/1989 - PDF sécurisé - English - USA - EIA - - Method for Measurement of Power Device Turn-Off Switching Loss
    Learn More
    €36.90

  • EIA JESD 24-2:1991

    1/1/1991 - PDF sécurisé - English - USA - EIA - - Gate Charge Test Method
    Learn More
    €36.90

  • EIA JESD 24-3:1990

    11/1/1990 - PDF sécurisé - English - USA - EIA - - Thermal Impedance Measurements for Vertical Power MOSFETs (Delta Source-Drain Voltage Method)
    Learn More
    €42.30

  • EIA JESD 24-4:1990

    11/1/1990 - PDF sécurisé - English - USA - EIA - - Thermal Impedance Measurements for Bipolar Transistors (Delta Base- Emitter Voltage Method)
    Learn More
    €42.30

  • EIA JESD 24-5:1990

    8/1/1990 - PDF sécurisé - English - USA - EIA - - Single Pulse Unclamped Inductive Switching (UIS) Avalanche Test Method
    Learn More
    €34.20

  • EIA JESD 24-6:1991

    10/1/1991 - PDF sécurisé - English - USA - EIA - - Thermal Impedance Measurements for Insulated Gate Bipolar Transistors
    Learn More
    €42.30

  • EIA JESD 24-7:1992

    8/1/1992 - PDF sécurisé - English - USA - EIA - - Commutating Diode Safe Operating Area Test Procedure for Measuring DV/DT During Reverse Recovery of Power Transistors
    Learn More
    €36.00

  • EIA JESD 24-8:1992

    8/1/1992 - PDF sécurisé - English - USA - EIA - - Method for Repetitive Inductive Load Avalanche Switching
    Learn More
    €36.00

  • EIA JESD 24-9:1992

    8/1/1992 - PDF sécurisé - English - USA - EIA - - Short Circuit Withstand Time Test Method
    Learn More
    €36.00

  • EIA JESD 24-10:1994

    8/1/1994 - PDF sécurisé - English - USA - EIA - - Test Method for Measurement of Reverse Recovery Time trr for Power MOSFET Drain-Source Diodes
    Learn More
    €36.90

  • EIA JESD 24-11:1996

    8/1/1996 - PDF sécurisé - English - USA - EIA - - Power MOSFET Equivalent Series Gate Resistance Test Method
    Learn More
    €34.20

  • EIA JESD 25:1972

    11/1/1972 - PDF sécurisé - English - USA - EIA - - Measurement of Small-Signal Transistor Scattering Parameters
    Learn More
    €51.30

  • EIA JESD 32:1996

    1/1/1996 - PDF sécurisé - English - USA - EIA - - Standard for China Description File
    Learn More
    €42.30

  • EIA JESD 35-1:1995

    9/1/1995 - PDF sécurisé - English - USA - EIA - - General Guidelines for Designing Test Structures for the Wafer-Level Testing of Thin Dielectrics
    Learn More
    €46.80

  • EIA JESD 35-2:1996

    2/1/1996 - PDF sécurisé - English - USA - EIA - - Test Criteria for the Wafer-Level Testing of Thin Dielectrics
    Learn More
    €38.70

  • EIA JESD 36:1996

    1/1/1996 - PDF sécurisé - English - USA - EIA - - Standard for Description of Low-Voltage TTL-Compatible, 5 V-Tolerant CMOS Logic Devices
    Learn More
    €40.50

  • EIA JESD 38:1995

    1/1/1995 - PDF sécurisé - English - USA - EIA - - Standard for Failure Analysis Report Format
    Learn More
    €38.70

  • EIA JESD 51:1995

    1/1/1995 - PDF sécurisé - English - USA - EIA - - Methodology for the Thermal Measurement of Component Packages (Single Semiconductor Device)
    Learn More
    €36.00

  • EIA JESD 51-1:1995

    1/1/1995 - PDF sécurisé - English - USA - EIA - - Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
    Learn More
    €70.20

  • EIA JESD 51-3:1996

    1/1/1996 - PDF sécurisé - English - USA - EIA - - Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
    Learn More
    €36.90

  • EIA JESD 51-4:1997

    2/1/1997 - PDF sécurisé - English - USA - EIA - - Thermal Test Chip Guideline (Wire Bond Type Chip)
    Learn More
    €40.50

  • EIA JESD 51-5:1999

    2/1/1999 - PDF sécurisé - English - USA - EIA - - Extension of Thermal Test Board Standards for Packages with Direct Thermal Attachment Mechanisms
    Learn More
    €34.20

  • EIA JESD 51-7:1999

    2/1/1999 - PDF sécurisé - English - USA - EIA - - High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
    Learn More
    €36.90

  • EIA JESD 52:1995

    1/1/1995 - PDF sécurisé - English - USA - EIA - - Description of Low Voltage TTL-Compatible CMOS Logic Devices
    Learn More
    €40.50

  • EIA JESD 54:1996

    1/1/1996 - PDF sécurisé - English - USA - EIA - - Standard for Description of 54/74ABTXXX and 74BCXXX TTL-Compatibility BiCMOS Logic Devices
    Learn More
    €54.90

  • EIA JESD 55:1996

    1/1/1996 - PDF sécurisé - English - USA - EIA - - Standard for Description of Low-Voltage TTL-Compatible BiCMOS Logic Devices
    Learn More
    €44.10

  • EIA JESD 57:1996

    1/1/1996 - PDF sécurisé - English - USA - EIA - - Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation
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    €60.30

  • EIA JESD 59:1997

    6/1/1997 - PDF sécurisé - English - USA - EIA - - Bond Wire Modeling Standard
    Learn More
    €40.50

  • EIA JESD 63:1998

    2/1/1998 - PDF sécurisé - English - USA - EIA - - Standard Method for Calculating the Electromigration Model Parameters for Current Density and Temperature
    Learn More
    €54.90

  • EIA JESD 70:1999

    6/1/1999 - PDF sécurisé - English - USA - EIA - - 2.5 V BiCMOS Logic Device Family Specification with 5 V Tolerant Inputs and Outputs
    Learn More
    €36.90

  • EIA JESD 73:1999

    6/1/1999 - PDF sécurisé - English - USA - EIA - - Description of 5 V Bus Switch Devices with TTL-Compatible Control Inputs
    Learn More
    €36.00

  • EIA/TIA-455-131:1997

    8/20/1997 - PDF sécurisé - English - USA - EIA - - FOTP-131 Measurement of Optical Fiber Ribbon Residual Twist
    Learn More
    €79.20

  • EIA/TIA-4920000-B:1997

    11/1/1997 - PDF sécurisé - English - USA - EIA - - Generic Specification for Optical Fibers
    Learn More
    €32.31

  • EIA/TIA-232-F:1997

    10/1/1997 - PDF sécurisé - English - USA - EIA - - Interface Between Data Terminal Equipment and Data Circuit- Terminating Equipment Employing Serial Binary Data Interchange
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    €32.58

  • EIA/TIA-404-B:1996

    3/1/1996 - PDF sécurisé - English - USA - EIA - - Standard for Start-Stop Signal Quality for Non-Synchronous Data Terminal Equipment
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    €26.10

  • EIA/TIA-455-54B:1998

    8/1/1998 - PDF sécurisé - English - USA - EIA - - FOTP- 54-B Mode Scrambler Requirements for Overfilled Launching Conditions to Multimode Fibers
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    €23.94

  • EIA/TIA-455-57-B:1994

    5/12/1994 - PDF sécurisé - English - USA - EIA - - FOTP-57 Preparation and Examination of Optical Fiber Endface for Testing Purposes
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    €25.02

  • EIA/TIA-455-64:1998

    3/1/1998 - PDF sécurisé - English - USA - EIA - - FOTP-64 Procedure for Measuring Radiation-Induced Attenuation in Optical Fibers and Optical Cables
    Learn More
    €28.80

  • EIA/TIA-455-72:1997

    10/1/1997 - PDF sécurisé - English - USA - EIA - - FOTP- 72 Procedure for Assessing Temperature and Humidity Cycling Exposure Effects on Optical Characteristics of Optical Fibers
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    €23.94

  • EIA/TIA-455-85-A:1992

    5/26/1992 - PDF sécurisé - English - USA - EIA - - FOTP-85 Fiber Optic Cable Twist Test
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    €23.94

  • EIA/TIA-455-89-B:1998

    7/1/1998 - PDF sécurisé - English - USA - EIA - - FOTP-89 Optical Fiber Cable Jacket Elongation and Tensile Strength
    Learn More
    €22.05

  • EIA/TIA-455-192:1999

    5/13/1999 - PDF sécurisé - English - USA - EIA - - FOTP-192 H-Parameter Test Method for Polarization-Maintaining Optical Fiber
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    €23.40

  • EIA/TIA-485-A:1998

    3/1/1998 - PDF sécurisé - English - USA - EIA - - Electrical Characteristics of Generators and Receivers for Use in Balanced Digital Multipoint Systems
    Learn More
    €83.70

  • EIA/TIA-526:1992

    9/1/1992 - PDF sécurisé - English - USA - EIA - - Standard Test Procedures for Fiber Optic Systems
    Learn More
    €23.67

  • EIA/TIA-526-11:1991

    12/1/1991 - PDF sécurisé - English - USA - EIA - - OFSTP-11 Measurement of Single-Reflection Power Penalty for Fiber Optic Terminal Equipment
    Learn More
    €22.86

  • EIA/TIA-561:1990

    3/20/1990 - PDF sécurisé - English - USA - EIA - - Simple 8-Position Non-Synchronous Interface Between Data Terminal Equipment and Data Circuit- Terminating Equipment Employing Serial Binary Data Interchange
    Learn More
    €24.48

  • EIA/TIA-562:1989

    10/27/1989 - PDF sécurisé - English - USA - EIA - - Electrical Characteristics for an Unbalanced Digital Interface
    Learn More
    €23.94

  • EIA/TIA-590-A:1997

    1/1/1997 - PDF sécurisé - English - USA - EIA - - Standard for Physical Location and Protection of Below Ground Fiber Optic Cable Plant
    Learn More
    €26.10

  • EIA/TIA-596:1992

    10/26/1992 - PDF sécurisé - English - USA - EIA - - Network Channel Terminating Equipment for Public Switched Digital Service
    Learn More
    €50.94

  • EIA/TIA-612:1993

    12/1/1993 - PDF sécurisé - English - USA - EIA - - Electrical Characteristics for an Interface at Data Signaling Rates up to 52 Mbit/s
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    €25.02

  • EIA/TIA-613:1993

    11/1/1993 - PDF sécurisé - English - USA - EIA - - High Speed Serial Interface for Data Terminal Equipment and Data Circuit- Terminating Equipment
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    €25.02

  • EIA/TIA-687:1997

    10/1/1997 - PDF sécurisé - English - USA - EIA - - Medium Speed Interface for Data Terminal Equipment and Data Circuit Terminating Equipment
    Learn More
    €28.26

  • EIA/TIA-6200000:1995

    5/1/1995 - PDF sécurisé - English - USA - EIA - - Generic Specification for Passive Optical Branching Devices
    Learn More
    €29.88

  • EIA/TIA-455-193:1999

    5/12/1999 - PDF sécurisé - English - USA - EIA - - FOTP-193 Polarization Crosstalk Method for Polarization- Maintaining Optical Fiber and Components
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    €23.94

  • EIA-364-99:1999

    6/1/1999 - PDF sécurisé - English - USA - EIA - - TP-99 Gage Location and Retention Test Procedure for Electrical Connectors
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    €64.80

  • EIA JEP 138:1999

    8/1/1999 - PDF sécurisé - English - USA - EIA - - User Guidelines for IR Thermal Imaging Determination of Die Temperature
    Learn More
    €36.90

  • EIA JESD 71:1999

    8/1/1999 - PDF sécurisé - English - USA - EIA - - Standard Test and Programming Language (STAPL)
    Learn More
    €60.30

  • EIA-364-103:1999

    2/1/1999 - PDF sécurisé - English - USA - EIA - - TP-103 Propagation Delay Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems
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    €72.00

  • EIA JESD 66:1999

    11/1/1999 - PDF sécurisé - English - USA - EIA - - Transient Voltage Suppressor Standard for Thyristor Surge Protective Device Rating Verification and Characteristic Testing
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    €81.90

  • EIA JESD 75:1999

    11/1/1999 - PDF sécurisé - English - USA - EIA - - Ball Grid Array Pinouts Standardized for 32-Bit Logic Functions
    Learn More
    €34.20

  • EIA JESD 80:1999

    11/1/1999 - PDF sécurisé - English - USA - EIA - - Standard for Description of 2.5 V CMOS Logic Devices
    Learn More
    €34.20

  • EIA/TIA-455-141:1999

    9/10/1999 - PDF sécurisé - English - USA - EIA - - FOTP-141 Twist Test for Optical Fiber Ribbons
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    €69.30

  • EIA-364-90:2000

    1/1/2000 - PDF sécurisé - English - USA - EIA - - TP-90 Crosstalk Ratio Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems
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    €73.80

  • EIA-364-108:2000

    7/1/2000 - PDF sécurisé - English - USA - EIA - - TP-108 Impedance, Reflection Coefficient, Return Loss, and VSWR Measured in the Time and Frequency Domain Test Procedure for Electrical Connectors, Cable Assemblies or Interconnection Systems
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    €91.80

  • EIA-364-66A:2000

    5/1/2000 - PDF sécurisé - English - USA - EIA - - TP-66A EMI Shielding Effectiveness Test Procedure for Electrical Connectors
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    €87.30

  • EIA JEP 120-A:2000

    5/1/2000 - PDF sécurisé - English - USA - EIA - - Index of Terms and Abbreviations Defined in JEDEC Publications
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    €98.10

  • EIA JESD 51-9:2000

    7/1/2000 - PDF sécurisé - English - USA - EIA - - Test Boards for Area Array Surface Mount Package Thermal Measurements
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    €43.20

  • EIA JESD 51-10:2000

    7/1/2000 - PDF sécurisé - English - USA - EIA - - Test Boards for Through-Hole Perimeter Leaded Package Thermal Measurements
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    €40.50

  • EIA JESD 82:2000

    7/1/2000 - PDF sécurisé - English - USA - EIA - - Definition of CDCV857 PLL Clock Driver for Registered DDR DIMM Applications
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    €42.30

  • EIA JESD 286-B:2000

    2/1/2000 - PDF sécurisé - English - USA - EIA - - Standard for Measuring Forward Switching Characteristics of Semiconductor Diodes
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    €45.90

  • EIA/TIA-136-122-B:2000

    3/31/2000 - PDF sécurisé - English - USA - EIA - - TDMA- Third Generation Wireless- Digital Control Channel Layer 2
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    €37.44

  • EIA/TIA-136-230:2000

    3/31/2000 - PDF sécurisé - English - USA - EIA - - TDMA- Third Generation Wireless-Minimum Performance Specifications for US-1 Voice Coder
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    €36.36

  • EIA/TIA-136-334:2000

    3/31/2000 - PDF sécurisé - English - USA - EIA - - TDMA- Third Generation Wireless-Packet Data Service-Subnetwork Dependent Convergence Protocol
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    €21.24

  • EIA/TIA-136-337:2000

    3/31/2000 - PDF sécurisé - English - USA - EIA - - TDMA- Third Generation Wireless-Packet Data Service- Tunneling of Signaling Messages
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    €23.94

  • EIA/TIA-136-750:1999

    11/29/1999 - PDF sécurisé - English - USA - EIA - - TDMA Cellular/PCS General UDP Transport Service (GUTS)
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    €23.94

  • EIA/TIA-334-C:2000

    5/1/2000 - PDF sécurisé - English - USA - EIA - - Signal Quality at Interface Between Data Terminal Equipment and Synchronous Data Circuit- Terminating Equipment for Serial Data Transmission
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    €23.94

  • EIA/TIA-455-123:2000

    6/9/2000 - PDF sécurisé - English - USA - EIA - - FOTP-123 Measurement of Optical Fiber Ribbon Dimensions
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    €79.20

  • EIA JESD 76:2000

    4/1/2000 - PDF sécurisé - English - USA - EIA - - Description of 1.8 V CMOS Logic Devices
    Learn More
    €34.20

  • EIA/TIA-455-107-A:1999

    3/1/1999 - PDF sécurisé - English - USA - EIA - - FOTP-107 Determination of Component Reflectance or Link/System Return Loss Using a Loss Test Set
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    €26.10

  • EIA/TIA-644-A:2001

    2/1/2001 - PDF sécurisé - English - USA - EIA - - Electrical Characteristics of Low Voltage Differential Signaling (LVDS) Interface Circuits
    Learn More
    €80.85

  • EIA JEP 136:1999

    8/1/1999 - PDF sécurisé - English - USA - EIA - - Signature Analysis
    Learn More
    €42.30

  • EIA-364-68A:2001

    4/1/2001 - PDF sécurisé - English - USA - EIA - - TP-68A Actuating Mechanism Test Procedure for Electrical Connectors
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    €62.10

  • EIA JESD 51-11:2001

    6/1/2001 - PDF sécurisé - English - USA - EIA - - Test Boards for Through-Hole Area Array Leaded Package Thermal Measurements
    Learn More
    €40.50

  • EIA JESD 72:2001

    6/1/2001 - PDF sécurisé - English - USA - EIA - - Test Methods and Acceptance Procedures for the Evaluation of Polymeric Materials
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    €46.80

  • EIA JESD 75-2:2001

    7/1/2001 - PDF sécurisé - English - USA - EIA - - Ball Grid Array Pinouts Standardized for 16-Bit Logic Functions
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    €34.20

  • EIA JESD 75-3:2001

    7/1/2001 - PDF sécurisé - English - USA - EIA - - Ball Grid Array Pinouts Standardized for 8-Bit Logic Functions
    Learn More
    €33.30

  • EIA JESD 76-1:2001

    6/1/2001 - PDF sécurisé - English - USA - EIA - - Standard Description of 1.2 V CMOS Logic Devices (Wide Range Operations)
    Learn More
    €34.20

  • EIA JESD 76-2:2001

    6/1/2001 - PDF sécurisé - English - USA - EIA - - Standard Description of 1.2 V CMOS Logic Devices (Normal Range Operations)
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    €34.20

  • EIA JESD 82-2:2001

    7/1/2001 - PDF sécurisé - English - USA - EIA - - Desription of a 3.3 V, 18-Bit, LVTTL I/O Register for PC133 Registered DIMM Applications
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    €50.40

  • EIA JESD 87:2001

    7/1/2001 - PDF sécurisé - English - USA - EIA - - Standard Test Structures for Reliability Assessment of AICu Metallizations with Barrier Materials
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    €38.70

  • EIA JESD 73-1:2001

    8/1/2001 - PDF sécurisé - English - USA - EIA - - Standard for Description of 3.3 V NFET Bus Switch Devices
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    €36.00

  • EIA JESD 73-2:2001

    8/1/2001 - PDF sécurisé - English - USA - EIA - - Standard for Description of 3.3 V NFET Bus Switch Devices with Integrated Charge Pumps
    Learn More
    €36.00

  • EIA JESD 76-3:2001

    8/1/2001 - PDF sécurisé - English - USA - EIA - - Standard Description of 1.5 V CMOS Logic Devices
    Learn More
    €34.20

  • EIA JESD 75-1:2001

    10/1/2001 - PDF sécurisé - English - USA - EIA - - Ball Grid Array Pinouts Standardized for 16, 18 and 20-Bit Logic Functions Using a 54 Ball Package
    Learn More
    €34.20

  • EIA JESD 8-13:2001

    10/1/2001 - PDF sécurisé - English - USA - EIA - - Scalable Low-Voltage Signalling for 400 mV (SLVS-400)
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    €36.90

  • EIA JESD 73-3:2001

    11/1/2001 - PDF sécurisé - English - USA - EIA - - Standard for Description of 3867: 2.5 V, 10-Bit, 2-Port, DDR FET Switch
    Learn More
    €36.00

  • EIA JESD 73-4:2001

    11/1/2001 - PDF sécurisé - English - USA - EIA - - 7Standard for Description of 3867: 2.5 V, Dual 5-Bit, 2-Port, DDR FET Switch
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    €36.00

  • EIA-364-69A:2002

    3/1/2002 - PDF sécurisé - English - USA - EIA - - TP-69A Inductance Measurement Test Procedure for Electrical Connectors and Sockets (10 nH - 100 nH)
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    €67.50

  • EIA/TIA-455-172:1986

    4/1/1986 - PDF sécurisé - English - USA - EIA - - FOTP-172 Flame Resistance of Firewall Connector
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    €21.78

  • EIA JESD 28-A:2001

    12/1/2001 - PDF sécurisé - English - USA - EIA - - Procedure for Measuring N-Channel MOSFET Hot-Carrier-Induced Degradation under DC Stress
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    €42.30

  • EIA/TIA-102.BAAB-B:2005

    3/24/2005 - PDF sécurisé - English - USA - EIA - - Project 25 Common Air Interface Conformance Test
    Learn More
    €59.04

  • EIA-364-82A:2005

    3/1/2005 - PDF sécurisé - English - USA - EIA - - TP-82A CORROSIVITY OF PLASTICS TEST PROCEDURE FOR ELECTRICAL CONNECTOR AND SOCKET HOUSINGS
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    €67.50

  • EIA-364-81A:2005

    3/1/2005 - PDF sécurisé - English - USA - EIA - - TP-81A COMBUSTION CHARACTERISTICS TEST PROCEDURE FOR ELECTRICAL CONNECTOR HOUSINGS, CONNECTOR ASSEMBLIES AND SOCKETS
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    €65.70

  • EIA/TIA-1040.1.03:2005

    4/1/2005 - PDF sécurisé - English - USA - EIA - - Regenerative Satellite Mesh-A (RMS-A) Air Interface - Physical Layer Specification - Part 3: Channel Coding
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    €24.48

  • EIA JESD 82-13A:2005

    5/1/2005 - PDF sécurisé - English - USA - EIA - - Definition of the SSTVN16859 2.5-2.6 V 13-Bit to 26-Bit SSTL 2 Registered Buffer for PC1600, PC2100, PC2700 and PC3200 DDR DIMM Applications
    Learn More
    €43.20

  • EIA-364-12A:2005

    6/1/2005 - PDF sécurisé - English - USA - EIA - - TP-12A RESTRICTED ENTRY TEST PROCEDURE FOR ELECTRICAL CONNECTORS
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    €62.10

  • EIA/TIA-894:2005

    8/1/2005 - PDF sécurisé - English - USA - EIA - - Selectable Mode Vocoder Minimum Performance Specification - Option 56 for Wideband Spread Spectrum Digital Systems
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    €69.84

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