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31.220.01 : Electromechanical components in general

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  • IEC 60512-11-1 (2019-05)

    IEC 60512-11-1:2019 Connectors for electrical and electronic equipment - Tests and measurements - Part 11-1: Climatic tests - Test 11a - Climatic sequence
    5/16/2019 - PDF - English, French - CEI
    Learn More
    €41.00

  • IEC 60603-7 AMD 2 (2019-01)

    IEC 60603-7:2008/AMD2:2019 Amendment 2 - Connectors for electronic equipment - Part 7: Detail specification for 8-way, unshielded, free and fixed connectors
    1/11/2019 - PDF - English, French - CEI
    Learn More
    €41.00

  • IEC 60603-7 Edition 3.2 (2019-01)

    IEC 60603-7:2008+AMD1:2011+AMD2:2019 consolidated version Connectors for electronic equipment - Part 7: Detail specification for 8-way, unshielded, free and fixed connectors
    1/11/2019 - PDF - English, French - CEI
    Learn More
    €406.00

  • IEC 60512-23-3 (2018-12)

    IEC 60512-23-3:2018 Connectors for electrical and electronic equipment - Tests and measurements - Part 23-3: Screening and filtering tests - Test 23c: Shielding effectiveness of connectors and accessories - Line injection method
    12/14/2018 - PDF - English, French - CEI
    Learn More
    €71.00

  • IEC 60512-23-3 Redline version (2018-12)

    IEC 60512-23-3:2018 RLV Connectors for electrical and electronic equipment - Tests and measurements - Part 23-3: Screening and filtering tests - Test 23c: Shielding effectiveness of connectors and accessories - Line injection method
    12/14/2018 - PDF - English - CEI
    Learn More
    €92.00

  • BS EN IEC 61076-2-111:2018

    Connectors for electrical and electronic equipment - Product requirements. Part 2-111: Circular connectors - Detail specification for power connectors with M12 screw-locking (IEC 61076-2-111:2017)
    3/26/2018 - PDF - English - BSI
    Learn More
    €303.60

  • UNE-EN 62359:2011/A1:2018

    Ultrasonics - Field characterization - Test methods for the determination of thermal and mechanical indices related to medical diagnostic ultrasonic fields (Endorsed by Asociación Española de Normalización in March of 2018.)
    3/1/2018 - PDF - English - AENOR
    Learn More
    €80.00

  • IEC 60512-8-3 (2018-01)

    IEC 60512-8-3:2018 Connectors for electrical and electronic equipment - Tests and measurements - Part 8-3: Static load tests (fixed connectors) - Test 8c: Robustness of actuating lever
    1/12/2018 - PDF - English, French - CEI
    Learn More
    €41.00

  • NF C05-625-2-4, NF EN 50625-2-4 (11/2017)

    Collection, logistics & treatment requirements for WEEE - Part 2-4 : treatment requirements for photovoltaic panels
    11/17/2017 - PDF - French - UTE
    Learn More
    €91.08

  • NF C05-625-2-4, NF EN 50625-2-4 (11/2017)

    Collection, logistics & treatment requirements for WEEE - Part 2-4 : treatment requirements for photovoltaic panels
    11/17/2017 - PDF - English - UTE
    Learn More
    €91.08

  • ASTM F3291-17

    Standard Test Method for Measuring the Force-Resistance of a Membrane Force Sensor
    11/1/2017 - PDF - English - ASTM
    Learn More
    €38.00

  • UNE-CLC/TS 50625-3-3:2017

    Collection, logistics & treatment requirements for WEEE - Part 3-3: Specification for de-pollution - WEEE containing CRTs and flat panel displays (Endorsed by Asociación Española de Normalización in November of 2017.)
    11/1/2017 - PDF - English - AENOR
    Learn More
    €81.00

  • UNE-CLC/TS 50625-5:2017

    Collection, logistics & Treatment requirements for WEEE - Part 5: Specification for the final treatment of WEEE fractions - Copper and precious metals (Endorsed by Asociación Española de Normalización in November of 2017.)
    11/1/2017 - PDF - English - AENOR
    Learn More
    €75.00

  • UNE-CLC/TS 50625-3-4:2017

    Collection, logistics & treatment requirements for WEEE - Part 3-4: Specification for de-pollution - temperature exchange equipment (Endorsed by Asociación Española de Normalización in November of 2017.)
    11/1/2017 - PDF - English - AENOR
    Learn More
    €108.00

  • JIS C 5630-26:2017

    Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
    10/20/2017 - PDF - Japanese - JSA
    Learn More
    €36.27

  • DIN CLC/TS 50625-4 VDE V 0042-13-4:2017-10

    Collection, logistics & treatment requirements for WEEE - Part 4: Specification for the collection and logistics associated with WEEE; German version CLC/TS 50625-4:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €61.54

  • DIN CLC/TS 50625-5 VDE V 0042-13-5:2017-10

    Collection, logistics & Treatment requirements for WEEE - Part 5: Specification for the final treatment of WEEE fractions - Copper and precious metals; German version CLC/TS 50625-5:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €77.84

  • PD CLC/TS 50625-4:2017

    Collection, logistics & treatment requirements for WEEE. Specification for the collection and logistics associated with WEEE
    9/7/2017 - PDF - English - BSI
    Learn More
    €144.90

  • DIN VDE 0042-14 VDE 0042-14:2017-09

    Requirements for the preparation for re-use of waste electrical and electronic equipment
    9/1/2017 - Paper - German - VDE
    Learn More
    €42.45

  • CLC/TS 50625-4 (06/2017)

    Collection, logistics & treatment requirements for WEEE - Part 4: Specification for the collection and logistics associated with WEEE
    6/1/2017 - PDF - French - AFNOR
    Learn More
    €63.03

  • CLC/TS 50625-4 (06/2017)

    Collection, logistics & treatment requirements for WEEE - Part 4: Specification for the collection and logistics associated with WEEE
    6/1/2017 - PDF - English - AFNOR
    Learn More
    €63.03

  • DIN EN 62047-25:2017-04

    Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area (IEC 62047-25:2016); German version EN 62047-25:2016
    4/1/2017 - PDF - German - DIN
    Learn More
    €103.00

  • IEEE 2700:2017

    IEEE Standard for Sensor Performance Parameter Definitions
    1/1/2017 - PDF - English - IEEE
    Learn More
    €75.24

  • DIN EN 62047-26:2016-12

    Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (IEC 62047-26:2016); German version EN 62047-26:2016
    12/1/2016 - PDF - German - DIN
    Learn More
    €114.10

  • DIN EN 62047-1:2016-12

    Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (IEC 62047-1:2016); German version EN 62047-1:2016
    12/1/2016 - PDF - German - DIN
    Learn More
    €125.30

  • ITU-T L.1102

    Use of printed labels for communicating information on rare metals in information and communication technology goods
    7/1/2016 - PDF - English - ITU
    Learn More
    €25.00

  • DIN CLC/TS 50625-3-1 VDE V 0042-13-31:2016-04

    Collection, logistics & treatment requirements for WEEE - Part 3-1: Specification for de-pollution - General; German version CLC/TS 50625-3-1:2015
    4/1/2016 - Paper - German - VDE
    Learn More
    €81.46

  • SCTE 186:2016

    Product Environmental Requirements for Cable Telecommunications
    1/1/2016 - PDF sécurisé - English - SCTE
    Learn More
    €45.00

  • DIN EN 62047-16:2015-12

    Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods (IEC 62047-16:2015); German version EN 62047-16:2015
    12/1/2015 - PDF - German - DIN
    Learn More
    €82.60

  • DIN EN 62047-17:2015-12

    Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films (IEC 62047-17:2015); German version EN 62047-17:2015
    12/1/2015 - PDF - German - DIN
    Learn More
    €108.80

  • UNE-EN 50625-2-2:2015

    Collection, logistics & Treatment requirements for WEEE - Part 2-2: Treatment requirements for WEEE containing CRTs and flat panel displays
    11/25/2015 - PDF - Spanish - AENOR
    Learn More
    €49.00

  • UNE-EN 60512-29-100:2015

    Connectors for electronic equipment - Tests and measurements - Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors - Tests 29a to 29g (Endorsed by AENOR in November of 2015.)
    11/1/2015 - PDF - English - AENOR
    Learn More
    €99.00

  • NF C05-625-2-2, NF EN 50625-2-2 (09/2015)

    Collection, logistics and treatment requirements for WEEE - Part 2-2 : treatment requirements for WEEE containing CRTs and flat panel displays
    9/12/2015 - PDF - French - UTE
    Learn More
    €91.08

  • NF C05-625-2-2, NF EN 50625-2-2 (09/2015)

    Collection, logistics and treatment requirements for WEEE - Part 2-2 : treatment requirements for WEEE containing CRTs and flat panel displays
    9/12/2015 - PDF - English - UTE
    Learn More
    €91.08

  • NF C05-625-2-1, NF EN 50625-2-1 (08/2015)

    Collection, logistics and treatment requirements for WEEE - Part 2-1 : treatment requirements for lamps
    8/1/2015 - PDF - French - UTE
    Learn More
    €91.08

  • NF C05-625-2-1, NF EN 50625-2-1 (08/2015)

    Collection, logistics and treatment requirements for WEEE - Part 2-1 : treatment requirements for lamps
    8/1/2015 - PDF - English - UTE
    Learn More
    €91.08

  • UNE-EN 50625-2-1:2015

    Collection, logistics and treatment requirements for WEEE - Part 2-1: Treatment requirements for lamps
    6/24/2015 - PDF - Spanish - AENOR
    Learn More
    €53.00

  • DIN EN 62047-21:2015-04

    Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials (IEC 62047-21:2014); German version EN 62047-21:2014
    4/1/2015 - PDF - German - DIN
    Learn More
    €89.00

  • DIN EN 62047-22:2015-04

    Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014); German version EN 62047-22:2014
    4/1/2015 - PDF - German - DIN
    Learn More
    €75.40

  • BS EN 50625-2-1:2014

    Collection, logistics and treatment requirements for WEEE. Treatment requirements for lamps
    1/31/2015 - PDF - English - BSI
    Learn More
    €202.40

  • PD CLC/TS 50625-3-1:2015

    Collection, logistics & treatment requirements for WEEE. Specification for de-pollution. General
    1/31/2015 - PDF - English - BSI
    Learn More
    €202.40

  • CLC/TS 50625-3-1 (01/2015)

    Collection, logistics & treatment requirements for WEEE - Part 3-1: Specification for de-pollution - General
    1/1/2015 - PDF - French - AFNOR
    Learn More
    €72.38

  • JIS C 5630-18:2014

    Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
    12/22/2014 - PDF - Japanese - JSA
    Learn More
    €25.00

  • JIS C 5630-19:2014

    Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
    12/22/2014 - PDF - Japanese - JSA
    Learn More
    €36.27

  • UNE-EN 50625-1:2014

    Collection, logistics & Treatment requirements for WEEE - Part 1: General treatment requirements
    12/17/2014 - PDF - Spanish - AENOR
    Learn More
    €60.00

  • DIN EN 50625-1 VDE 0042-13-1:2014-09

    Collection, logistics & Treatment requirements for WEEE - Part 1: General treatment requirements; German version EN 50625-1:2014
    9/1/2014 - Paper - German - VDE
    Learn More
    €98.49

  • DIN EN 50625-1 VDE 0042-13-1:2014-09

    Collection, logistics & Treatment requirements for WEEE - Part 1: General treatment requirements; German version EN 50625-1:2014
    9/1/2014 - Paper - English - VDE
    Learn More
    €163.35

  • NF C05-625-1, NF EN 50625-1 (07/2014)

    Collection, logistic and treatment requirements for WEEE - Part 1 : general treatment requirements
    7/4/2014 - PDF - French - UTE
    Learn More
    €112.42

  • NF C05-625-1, NF EN 50625-1 (07/2014)

    Collection, logistic and treatment requirements for WEEE - Part 1 : general treatment requirements
    7/4/2014 - PDF - English - UTE
    Learn More
    €112.42

  • EIA JESD 22-B109B:2014

    Flip Chip Tensile Pull
    7/1/2014 - PDF sécurisé - English - EIA
    Learn More
    €49.28

  • DIN EN 62047-11:2014-04

    Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems (IEC 62047-11:2013); German version EN 62047-11:2013
    4/1/2014 - PDF - German - DIN
    Learn More
    €103.00

  • DIN EN 62047-18:2014-04

    Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (IEC 62047-18:2013); German version EN 62047-18:2013
    4/1/2014 - PDF - German - DIN
    Learn More
    €89.00

  • DIN EN 62047-19:2014-04

    Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (IEC 62047-19:2013); German version EN 62047-19:2013
    4/1/2014 - PDF - German - DIN
    Learn More
    €114.10

  • BS EN 50625-1:2014

    Collection, logistics & Treatment requirements for WEEE. General treatment requirements
    3/31/2014 - PDF - English - BSI
    Learn More
    €236.90

  • ITU-T L.1101

    Measurement methods to characterize rare metals in information and communication technology goods
    3/1/2014 - PDF - English - ITU
    Learn More
    €25.00

  • JIS C 5630-12:2014

    Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
    2/20/2014 - PDF - Japanese - JSA
    Learn More
    €36.27

  • JIS C 5630-13:2014

    Semiconductor devices - Micro-electromechanical devices - Part 13: Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
    2/20/2014 - PDF - Japanese - JSA
    Learn More
    €25.00

  • SCTE 203:2014

    Product Environmental Requirements for Cable Telecommunications Facilities - Test Methods
    1/1/2014 - PDF sécurisé - English - SCTE
    Learn More
    €45.00

  • NF C93-400-24-1, NF EN 60512-24-1 (04/2013)

    Connectors for electronic equipment - Tests and measurements - Part 24-1 : magnetic interference tests - Test 24a : residual magnetism
    4/27/2013 - PDF - French - UTE
    Learn More
    €48.40

  • DIN EN 50581 VDE 0042-12:2013-02

    Technical documentation for the assessment of electrical and electronic products with respect to the restriction of hazardous substances; German version EN 50581:2012
    2/1/2013 - Paper - English - VDE
    Learn More
    €82.06

  • UNE-EN 60512-24-1:2012

    Connectors for electronic equipment - Tests and measurements - Part 24-1: Magnetic interference tests - Test 24a: Residual magnetism (Endorsed by AENOR in January of 2013.)
    1/1/2013 - PDF - English - AENOR
    Learn More
    €27.00

  • BS EN 60512-24-1:2012

    Connectors for electronic equipment. Tests and measurements. Magnetic interference tests. Test 24a: Residual magnetism
    12/31/2012 - PDF - English - BSI
    Learn More
    €121.90

  • UNE-EN 60512-99-001:2012

    Connectors for electronic equipment - Tests and measurements - Part 99-001: Test schedule for engaging and separating connectors under electrical load - Test 99a: Connectors used in twisted pair communication cabling with remote power (Endorsed by AENOR in December of 2012.)
    12/1/2012 - PDF - English - AENOR
    Learn More
    €61.00

  • DIN EN 62047-14:2012-10

    Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (IEC 62047-14:2012); German version EN 62047-14:2012
    10/1/2012 - PDF - German - DIN
    Learn More
    €96.00

  • DIN EN 62047-13:2012-10

    Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (IEC 62047-13:2012); German version EN 62047-13:2012
    10/1/2012 - PDF - German - DIN
    Learn More
    €96.00

  • UNE-EN 60512-1-100:2012

    Connectors for electronic equipment - Tests and measurements - Part 1-100: General - Applicable publications
    9/19/2012 - PDF - Spanish - AENOR
    Learn More
    €47.00

  • UNE-EN 60512-16-21:2012

    Connectors for electronic equipment - Tests and measurements - Part 16-21: Mechanical tests on contacts and terminations - Test 16u: Whisker test via the application of external mechanical stresses (Endorsed by AENOR in September of 2012.)
    9/1/2012 - PDF - English - AENOR
    Learn More
    €61.00

  • DIN EN 62047-12:2012-06

    Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (IEC 62047-12:2011); German version EN 62047-12:2011
    6/1/2012 - PDF - German - DIN
    Learn More
    €114.10

  • UNE-EN 60512-7-2:2011

    Connectors for electronic equipment - Tests and measurements - Part 7-2: Impact tests (free connectors) - Test 7b: Mechanical strength impact (Endorsed by AENOR in April of 2012.)
    4/1/2012 - PDF - English - AENOR
    Learn More
    €40.00

  • BS EN 60512-9-2:2012

    Connectors for electronic equipment. Tests and measurements. Endurance tests. Test 9b. Electrical load and temperature
    3/31/2012 - PDF - English - BSI
    Learn More
    €121.90

  • DIN EN 62047-5:2012-03

    Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches (IEC 62047-5:2011); German version EN 62047-5:2011
    3/1/2012 - PDF - German - DIN
    Learn More
    €125.30

  • DIN EN 62047-9:2012-03

    Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 62047-9:2011); German version EN 62047-9:2011
    3/1/2012 - PDF - German - DIN
    Learn More
    €108.80

  • DIN EN 62047-10:2012-03

    Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (IEC 62047-10:2011); German version EN 62047-10:2011
    3/1/2012 - PDF - German - DIN
    Learn More
    €82.60

  • BS EN 60512-7-2:2012

    Connectors for electronic equipment. Tests and measurements. Impact tests (free connectors). Test 7b. Mechanical strength impact
    2/29/2012 - PDF - English - BSI
    Learn More
    €121.90

  • DIN EN 62047-7:2012-02

    Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (IEC 62047-7:2011); German version EN 62047-7:2011
    2/1/2012 - PDF - German - DIN
    Learn More
    €114.10

  • IEC 60603-7 Edition 3.1 (2011-12)

    IEC 60603-7:2008+AMD1:2011 consolidated version Connectors for electronic equipment - Part 7: Detail specification for 8-way, unshielded, free and fixed connectors
    12/16/2011 - PDF - English, French - CEI
    Learn More
    €355.00

  • DIN EN 62047-8:2011-12

    Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011); German version EN 62047-8:2011
    12/1/2011 - PDF - German - DIN
    Learn More
    €96.00

  • IEC 60512-9-2 (2011-11)

    IEC 60512-9-2:2011 Connectors for electronic equipment - Tests and measurements - Part 9-2: Endurance tests - Test 9b: Electrical load and temperature
    11/28/2011 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-7-2 (2011-11)

    IEC 60512-7-2:2011 Connectors for electronic equipment - Tests and measurements - Part 7-2: Impact tests (free components) - Test 7b: Mechanical strength impact
    11/17/2011 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60603-7 AMD 1 (2011-09)

    IEC 60603-7:2008/AMD1:2011 Amendment 1 - Connectors for electronic equipment - Part 7: Detail specification for 8-way, unshielded, free and fixed connectors
    9/29/2011 - PDF - English, French - CEI
    Learn More
    €20.00

  • UNE-EN 60512-8-2:2011

    Connectors for electronic equipment - Tests and measurements -- Part 8-2: Static load tests (fixed connectors) - Test 8b: Static load, axial (Endorsed by AENOR in September of 2011.)
    9/1/2011 - PDF - English - AENOR
    Learn More
    €37.00

  • UNE-EN 60512-8-3:2011

    Connectors for electronic equipment - Tests and measurements - Part 8-3: Static load tests (fixed connectors) - Test 8c: Robustness of actuating lever (Endorsed by AENOR in September of 2011.)
    9/1/2011 - PDF - English - AENOR
    Learn More
    €40.00

  • UNE-EN 60512-9-4:2011

    Connectors for electronic equipment - Tests and measurements - Part 9-4: Endurance tests - Test 9d: Durability of contact retention system and seals (maintenance, ageing) (Endorsed by AENOR in September of 2011.)
    9/1/2011 - PDF - English - AENOR
    Learn More
    €30.00

  • UNE-EN 60512-17-2:2011

    Connectors for electronic equipment - Tests and measurements - Part 17-2: Cable clamping tests - Test 17b: Cable clamp resistance to cable rotation (Endorsed by AENOR in September of 2011.)
    9/1/2011 - PDF - English - AENOR
    Learn More
    €30.00

  • BS EN 60512-9-3:2011

    Connectors for electronic equipment. Tests and measurements. Endurance tests. Test 9c. Mechanical operation (engaging/separating) with electrical load
    8/31/2011 - PDF - English - BSI
    Learn More
    €121.90

  • JIS C 5630-6:2011 (R2016)

    Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
    8/22/2011 - PDF - Japanese - JSA
    Learn More
    €25.00

  • BS EN 60512-8-2:2011

    Connectors for electronic equipment. Tests and measurements. Static load tests (fixed connectors). Test 8b. Static load, axial
    7/31/2011 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-9-4:2011

    Connectors for electronic equipment. Tests and measurements. Endurance tests. Test 9d. Durability of contact retention system and seals (maintenance, ageing)
    7/31/2011 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-17-2:2011

    Connectors for electronic equipment. Tests and measurements. Cable clamping tests. Test 17b. Cable clamp resistance to cable rotation
    7/31/2011 - PDF - English - BSI
    Learn More
    €121.90

  • IEC 60512-9-3 (2011-06)

    IEC 60512-9-3:2011 Connectors for electronic equipment - Tests and measurements - Part 9-3: Endurance tests - Test 9c: Mechanical operation (engaging and separating) with electrical load
    6/22/2011 - PDF - English, French - CEI
    Learn More
    €41.00

  • UNE-EN 62359:2011

    Ultrasonics - Field characterization - Test methods for the determination of thermal and mechanical indices related to medical diagnostic ultrasonic fields (Endorsed by AENOR in June of 2011.)
    6/1/2011 - PDF - English - AENOR
    Learn More
    €112.00

  • IEC 60512-8-2 (2011-04)

    IEC 60512-8-2:2011 Connectors for electronic equipment - Tests and measurements - Part 8-2: Static load tests (fixed connectors) - Test 8b: Static load, axial
    4/7/2011 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-9-4 (2011-04)

    IEC 60512-9-4:2011 Connectors for electronic equipment - Tests and measurements - Part 9-4: Endurance tests - Test 9d: Durability of contact retention system and seals (maintenance, ageing)
    4/7/2011 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-17-2 (2011-04)

    IEC 60512-17-2:2011 Connectors for electronic equipment - Tests and measurements - Part 17-2: Cable clamping tests - Test 17b: Cable clamp resistance to cable rotation
    4/7/2011 - PDF - English, French - CEI
    Learn More
    €20.00

  • DIN EN 62047-4:2011-03

    Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 62047-4:2008); German version EN 62047-4:2010
    3/1/2011 - PDF - German - DIN
    Learn More
    €103.00

  • BS EN 60512-17-1:2010

    Connectors for electronic equipment. Tests and measurements. Cable clamping tests. Test 17a. Cable clamp robustness
    11/30/2010 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-17-3:2010

    Connectors for electronic equipment. Tests and measurements. Cable clamping tests. Test 17c. Cable clamp resistance to cable pull (tensile)
    11/30/2010 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-17-4:2010

    Connectors for electronic equipment. Tests and measurements. Cable clamping tests. Test 17d. Cable clamp resistance to cable torsion
    11/30/2010 - PDF - English - BSI
    Learn More
    €121.90

  • UNE-EN 60512-17-1:2010

    Connectors for electronic equipment - Tests and measurements -- Part 17-1: Cable clamping tests - Test 17a: Cable clamp robustness (Endorsed by AENOR in November of 2010.)
    11/1/2010 - PDF - English - AENOR
    Learn More
    €27.00

  • UNE-EN 60512-17-3:2010

    Connectors for electronic equipment - Tests and measurements -- Part 17-3: Cable clamping tests - Test 17c: Cable clamp resistance to cable pull (tensile) (Endorsed by AENOR in November of 2010.)
    11/1/2010 - PDF - English - AENOR
    Learn More
    €27.00

  • UNE-EN 60512-17-4:2010

    Connectors for electronic equipment - Tests and measurements -- Part 17-4: Cable clamping tests - Test 17d: Cable clamp resistance to cable torsion (Endorsed by AENOR in November of 2010.)
    11/1/2010 - PDF - English - AENOR
    Learn More
    €27.00

  • UNE-EN 60512-8-1:2010

    Connectors for electronic equipment - Tests and measurements -- Part 8-1: Static load tests (fixed connectors) - Test 8a: Static load, transverse (Endorsed by AENOR in November of 2010.)
    11/1/2010 - PDF - English - AENOR
    Learn More
    €27.00

  • UNE-EN 60512-23-2:2010

    Connectors for electronic equipment - Tests and measurements -- Part 23-2: Screening and filtering tests - Test 23b: Suppression characteristics of integral filters (Endorsed by AENOR in November of 2010.)
    11/1/2010 - PDF - English - AENOR
    Learn More
    €27.00

  • BS EN 60512-8-1:2010

    Connectors for electronic equipment. Tests and measurements. Static load tests (fixed connectors). Test 8a. Static load, transverse
    10/31/2010 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-23-2:2010

    Connectors for electronic equipment. Tests and measurements. Screening and filtering tests. Test 23b. Suppression characteristics of integral filters
    10/31/2010 - PDF - English - BSI
    Learn More
    €121.90

  • UNE-EN 60512-20-1:2010

    Connectors for electronic equipment - Tests and measurements -- Part 20-1: Fire hazard tests - Test 20a: Flammability, needle-flame (Endorsed by AENOR in October of 2010.)
    10/1/2010 - PDF - English - AENOR
    Learn More
    €30.00

  • UNE-EN 60512-20-3:2010

    Connectors for electronic equipment - Tests and measurements -- Part 20-3: Fire hazard tests - Test 20c: Flammability, glow-wire (Endorsed by AENOR in October of 2010.)
    10/1/2010 - PDF - English - AENOR
    Learn More
    €30.00

  • UNE-EN 60512-21-1:2010

    Connectors for electronic equipment - Tests and measurements -- Part 21-1: R.F. resistance tests - Test 21a: R.F. shunt resistance (Endorsed by AENOR in October of 2010.)
    10/1/2010 - PDF - English - AENOR
    Learn More
    €33.00

  • UNE-EN 60512-22-1:2010

    Connectors for electronic equipment - Tests and measurements -- Part 22-1: Capacitance tests - Test 22a: Capacitance (Endorsed by AENOR in October of 2010.)
    10/1/2010 - PDF - English - AENOR
    Learn More
    €27.00

  • UNE-EN 60512-7-1:2010

    Connectors for electronic equipment - Tests and measurements -- Part 7-1: Impact tests (free connectors) - Test 7a: Free fall (repeated) (Endorsed by AENOR in September of 2010.)
    9/1/2010 - PDF - English - AENOR
    Learn More
    €37.00

  • BS EN 60512-20-1:2010

    Connectors for electronic equipment. Tests and measurements. Fire hazard tests. Test 20a. Flammability, needle-flame
    8/31/2010 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-20-3:2010

    Connectors for electronic equipment. Tests and measurements. Fire hazard tests. Test 20c. Flammability, glow-wire
    8/31/2010 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-21-1:2010

    Connectors for electronic equipment. Tests and measurements. R.F. resistance tests. Test 21a. R.F. shunt resistance
    8/31/2010 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-22-1:2010

    Connectors for electronic equipment. Tests and measurements. Capacitance tests. Test 22a. Capacitance
    8/31/2010 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-7-1:2010

    Connectors for electronic equipment. Tests and measurements. Impact tests (free connectors). Test 7a. Free fall (repeated)
    7/31/2010 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-9-5:2010

    Connectors for electronic equipment. Tests and measurements. Endurance tests. Test 9e. Current loading, cyclic
    7/31/2010 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-19-1:2010

    Connectors for electronic equipment. Tests and measurements. Chemical resistance tests. Test 19a. Fluid resistance of pre-insulated crimp barrels
    7/31/2010 - PDF - English - BSI
    Learn More
    €121.90

  • DIN EN 62047-6:2010-07

    Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009); German version EN 62047-6:2010
    7/1/2010 - PDF - German - DIN
    Learn More
    €96.00

  • IEC 60512-8-1 (2010-06)

    IEC 60512-8-1:2010 Connectors for electronic equipment - Tests and measurements - Part 8-1: Static load tests (fixed connectors) - Test 8a: Static load, transverse
    6/10/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-17-1 (2010-06)

    IEC 60512-17-1:2010 Connectors for electronic equipment - Tests and measurements - Part 17-1: Cable clamping tests - Test 17a: Cable clamp robustness
    6/10/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-17-3 (2010-06)

    IEC 60512-17-3:2010 Connectors for electronic equipment - Tests and measurements - Part 17-3: Cable clamping tests - Test 17c: Cable clamp resistance to cable pull (tensile)
    6/10/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-17-4 (2010-06)

    IEC 60512-17-4:2010 Connectors for electronic equipment - Tests and measurements - Part 17-4: Cable clamping tests - Test 17d: Cable clamp resistance to cable torsion
    6/10/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-20-1 (2010-06)

    IEC 60512-20-1:2010 Connectors for electronic equipment - Tests and measurements - Part 20-1: Fire hazard tests - Test 20a: Flammability, needle-flame
    6/10/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-20-3 (2010-06)

    IEC 60512-20-3:2010 Connectors for electronic equipment - Tests and measurements - Part 20-3: Fire hazard tests - Test 20c: Flammability, glow-wire
    6/10/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-21-1 (2010-06)

    IEC 60512-21-1:2010 Connectors for electronic equipment - Tests and measurements - Part 21-1: RF resistance tests - Test 21a: RF shunt resistance
    6/10/2010 - PDF - English, French - CEI
    Learn More
    €10.00

  • IEC 60512-22-1 (2010-06)

    IEC 60512-22-1:2010 Connectors for electronic equipment - Tests and measurements - Part 22-1: Capacitance tests - Test 22a: Capacitance
    6/10/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-23-2 (2010-06)

    IEC 60512-23-2:2010 Connectors for electronic equipment - Tests and measurements - Part 23-2: Screening and filtering tests - Test 23b: Suppression characteristics of integral filters
    6/10/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • BS EN 60512-9-1:2010

    Connectors for electronic equipment. Tests and measurements. Endurance tests. Test 9a. Mechanical operation
    5/31/2010 - PDF - English - BSI
    Learn More
    €121.90

  • IEC 60512-24-1 (2010-03)

    IEC 60512-24-1:2010 Connectors for electronic equipment - Tests and measurements - Part 24-1: Magnetic interference tests - Test 24a: Residual magnetism
    3/24/2010 - PDF - English, French - CEI
    Learn More
    €10.00

  • IEC 60512-19-1 (2010-03)

    IEC 60512-19-1:2010 Connectors for electronic equipment - Tests and measurements - Part 19-1: Chemical resistance tests - Test 19a: Fluid resistance of pre-insulated crimp barrels
    3/24/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-7-1 (2010-03)

    IEC 60512-7-1:2010 Connectors for electronic equipment - Tests and measurements - Part 7-1: Impact tests (free connectors) - Test 7a: Free fall (repeated)
    3/17/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-9-1 (2010-03)

    IEC 60512-9-1:2010 Connectors for electronic equipment - Tests and measurements - Part 9-1: Endurance tests - Test 9a: Mechanical operation
    3/17/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 60512-9-5 (2010-03)

    IEC 60512-9-5:2010 Connectors for electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic
    3/17/2010 - PDF - English, French - CEI
    Learn More
    €20.00

  • BS EN 60603-7:2009+A1:2011

    Connectors for electronic equipment. Detail specification for 8-way, unshielded, free and fixed connectors
    1/31/2010 - PDF - English - BSI
    Learn More
    €282.90

  • UNE-IEC 60050-581:2009 (R2015)

    International Electrotechnical Vocabulary - Part 581: Electromechanical components for electronic equipment.
    11/4/2009 - PDF - Spanish - AENOR
    Learn More
    €96.00

  • JIS C 5630-3:2009 (R2013)

    Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
    3/20/2009 - PDF - Japanese - JSA
    Learn More
    €25.00

  • JIS C 5630-2:2009 (R2013)

    Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
    3/20/2009 - PDF - Japanese - JSA
    Learn More
    €25.00

  • UNE-EN 60512-16-3:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-3: Mechanical tests on contacts and terminations - Test 16c: Contact-bending strength (Endorsed by AENOR in February of 2009.)
    2/1/2009 - PDF - English - AENOR
    Learn More
    €37.00

  • UNE-EN 60512-16-5:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-5: Mechanical tests on contacts and terminations - Test 16e: Gauge retention force (resilient contacts) (Endorsed by AENOR in February of 2009.)
    2/1/2009 - PDF - English - AENOR
    Learn More
    €27.00

  • UNE-EN 60512-16-6:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-6: Mechanical tests on contacts and terminations - Test 16f: Robustness of terminations (Endorsed by AENOR in February of 2009.)
    2/1/2009 - PDF - English - AENOR
    Learn More
    €27.00

  • UNE-EN 60512-16-7:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-7: Mechanical tests on contacts and terminations - Test 16g: Measurement of contact deformation after crimping (Endorsed by AENOR in February of 2009.)
    2/1/2009 - PDF - English - AENOR
    Learn More
    €37.00

  • UNE-EN 60512-16-14:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-14: Mechanical tests on contacts and terminations - Test 16n: Bending strength, fixed male tabs (Endorsed by AENOR in February of 2009.)
    2/1/2009 - PDF - English - AENOR
    Learn More
    €30.00

  • UNE-EN 60512-16-16:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-16: Mechanical tests on contacts and terminations - Test 16p: Torsional strength, fixed male tabs (Endorsed by AENOR in February of 2009.)
    2/1/2009 - PDF - English - AENOR
    Learn More
    €30.00

  • UNE-EN 60512-16-17:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-17: Mechanical tests on contacts and terminations - Test 16q: Tensile and compressive strength, fixed male tabs (Endorsed by AENOR in February of 2009.)
    2/1/2009 - PDF - English - AENOR
    Learn More
    €37.00

  • UNE-EN 60512-16-1:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (Endorsed by AENOR in November of 2008.)
    11/1/2008 - PDF - English - AENOR
    Learn More
    €30.00

  • UNE-EN 60512-16-2:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-2: Mechanical tests on contacts and terminations - Test 16b: Restricted entry (Endorsed by AENOR in November of 2008.)
    11/1/2008 - PDF - English - AENOR
    Learn More
    €27.00

  • UNE-EN 60512-16-4:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-4: Mechanical tests on contacts and terminations - Test 16d: Tensile strength (crimped connections) (Endorsed by AENOR in November of 2008.)
    11/1/2008 - PDF - English - AENOR
    Learn More
    €30.00

  • UNE-EN 60512-16-8:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-8: Mechanical tests on connections and terminations - Test 16h: Insulating grip effectiveness (crimped connections) (Endorsed by AENOR in November of 2008.)
    11/1/2008 - PDF - English - AENOR
    Learn More
    €30.00

  • UNE-EN 60512-16-9:2008

    Connectors for electronic equipment- Tests and measurements- Part 16-9: Mechanical tests on contacts and terminations- Test 16i:Grounding contact spring holding force (Endorsed by AENOR in November of 2008.)
    11/1/2008 - PDF - English - AENOR
    Learn More
    €27.00

  • UNE-EN 60512-16-11:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-11: Mechanical tests on contacts and terminations - Test 16k: Stripping force, solderless wrapped connections (Endorsed by AENOR in November of 2008.)
    11/1/2008 - PDF - English - AENOR
    Learn More
    €30.00

  • UNE-EN 60512-16-13:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-13: Mechanical tests on contacts and terminations - Test 16m: Un-wrapping, solderless wrapped connections (Endorsed by AENOR in November of 2008.)
    11/1/2008 - PDF - English - AENOR
    Learn More
    €27.00

  • UNE-EN 60512-16-18:2008

    Connectors for electronic equipment - Tests and measurements -- Part 16-18: Mechanical tests on contacts and terminations - Test 16r: Deflection of contacts, simulation (Endorsed by AENOR in November of 2008.)
    11/1/2008 - PDF - English - AENOR
    Learn More
    €30.00

  • IEC 60050-581 (2008-09)

    IEC 60050-581:2008 International Electrotechnical Vocabulary (IEV) - Part 581: Electromechanical components for electronic equipment
    9/19/2008 - PDF - English, French - CEI
    Learn More
    €305.00

  • BS EN 61076-7-100:2006

    Connectors for electronic equipment. Product requirements. Cable outlet accessories. Detail specification for a metric cable sealing consisting of an integrated part of heavy-duty rectangular or circular connector hoods and a sealing system
    12/31/2007 - PDF - English - BSI
    Learn More
    €144.90

  • UNE-EN 60512-13-1:2006 CORR:2007

    Connectors for electronic equipment - Tests and measurements -- Part 13-1: Mechanical operation tests - Test 13a: Engaging and separating forces
    5/9/2007 - PDF - Spanish - AENOR
    Learn More
    €0.00

  • UNE-EN 60512-13-2:2006 CORR:2007

    Connectors for electronic equipment - Tests and measurements -- Part 13-2: Mechanical operation tests - Test 13b: Insertion and withdrawal forces
    5/9/2007 - PDF - Spanish - AENOR
    Learn More
    €0.00

  • UNE-EN 60512-12-2:2006 CORR:2007

    Connectors for electronic equipment - Tests and measurements -- Part 12-2: Soldering tests - Test 12b: Solderability, wetting, soldering iron method
    4/25/2007 - PDF - Spanish - AENOR
    Learn More
    €0.00

  • UNE-EN 60512-12-1:2007

    Connectors for electronic equipment - Tests and measurements -- Part 12-1: Soldering tests - Test 12a: Solderability, wetting, solder bath method (IEC 60512-12-1:2006).
    2/7/2007 - PDF - Spanish - AENOR
    Learn More
    €33.00

  • UNE-EN 60512-14-2:2007

    Connectors for electronic equipment - Tests and measurements -- Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage (IEC 60512-14-2:2006).
    2/7/2007 - PDF - Spanish - AENOR
    Learn More
    €36.00

  • UNE-EN 60512-14-4:2007

    Connectors for electronic equipment - Tests and measurements -- Part 14-4: Sealing tests - Test 14d: Immersion - Waterproof (IEC 60512-14-4:2006).
    2/7/2007 - PDF - Spanish - AENOR
    Learn More
    €29.00

  • UNE-EN 60512-14-5:2007

    Connectors for electronic equipment - Tests and measurements -- Part 14-5: Sealing tests - Test 14e: Immersion at low air pressure (IEC 60512-14-5:2006).
    2/7/2007 - PDF - Spanish - AENOR
    Learn More
    €33.00

  • UNE-EN 60512-14-6:2007

    Connectors for electronic equipment - Tests and measurements -- Part 14-6: Sealing tests - Test 14f: Interfacial sealing (IEC 60512-14-6:2006).
    2/7/2007 - PDF - Spanish - AENOR
    Learn More
    €33.00

  • DIN EN 62047-2:2007-02

    Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006); German version EN 62047-2:2006
    2/1/2007 - PDF - German - DIN
    Learn More
    €61.70

  • DIN EN 62047-3:2007-02

    Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006); German version EN 62047-3:2006
    2/1/2007 - PDF - German - DIN
    Learn More
    €54.80

  • UNE-EN 60512-13-1:2006

    Connectors for electronic equipment - Tests and measurements -- Part 13-1: Mechanical operation tests - Test 13a: Engaging and separating forces (IEC 60512-13-1:2006)
    9/13/2006 - PDF - Spanish - AENOR
    Learn More
    €29.00

  • UNE-EN 60512-13-2:2006

    Connectors for electronic equipment - Tests and measurements -- Part 13-2: Mechanical operation tests - Test 13b: Insertion and withdrawal forces (IEC 60512-13-2:2006)
    9/13/2006 - PDF - Spanish - AENOR
    Learn More
    €29.00

  • UNE-EN 60512-12-2:2006

    Connectors for electronic equipment - Tests and measurements -- Part 12-2: Soldering tests - Test 12b: Solderability, wetting, soldering iron method. (IEC 60512-12-2:2006)
    6/21/2006 - PDF - Spanish - AENOR
    Learn More
    €29.00

  • PR NF C01-581 (06/2006)

    International Electrotechnical Vocabulary - Part 581 : electromechanical components for electronic equipment
    6/20/2006 - PDF - English, French - UTE
    Learn More
    €76.92

  • UNE-EN 60512-23-3:2001 CORR:2005

    Electromechanical components for electronic equipment - Basic testing procedures and measuring methods -- Part 23-3: Test 23c: Shielding effectiveness of connectors and accessories.
    12/14/2005 - PDF - Spanish - AENOR
    Learn More
    €0.00

  • UNE-EN 60512-23-7:2005

    Connectors for electronic equipment - Tests and measurements -- Part 23-7: Screening and filtering tests - Test 23g: Effective transfer impedance of connectors
    9/21/2005 - PDF - Spanish - AENOR
    Learn More
    €52.00

  • UNE-IEC 60512-9:2005

    Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 9: Miscellaneous tests
    5/18/2005 - PDF - Spanish - AENOR
    Learn More
    €51.00

  • UNE-IEC 60512-5:2005

    Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 5: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests
    5/18/2005 - PDF - Spanish - AENOR
    Learn More
    €54.00

  • UNE-IEC 60512-7:2005

    Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests
    5/18/2005 - PDF - Spanish - AENOR
    Learn More
    €49.00

  • JIS C 5402-12-7:2005 (R2014)

    Connectors for electronic equipment - Tests and measurements - Part 12-7: Soldering tests - Test 12g: Solderability, wetting balance method
    3/20/2005 - PDF - Japanese - JSA
    Learn More
    €25.00

  • JIS C 5402-20-2:2005 (R2014)

    Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 20-2: Test 20b - Flammability tests - Fireproofness
    3/20/2005 - PDF - Japanese - JSA
    Learn More
    €25.00

  • VDI 2206:2004-06

    Design methodology for mechatronic systems
    6/1/2004 - PDF - English, German - VDI
    Learn More
    €295.88

  • UNE-EN 60512-11-14:2004

    Connectors for electronic equipment - Tests and measurements -- Part 11-14: Climatic tests - Test 11p: Flowing single gas corrosion test
    5/21/2004 - PDF - Spanish - AENOR
    Learn More
    €29.00

  • UNE-EN 60512-11-7:2004

    Connectors for electronic equipment - Tests and measurements -- Part 11- 7: Climatic tests - Test 11g: Flowing mixed gas corrosion test
    4/30/2004 - PDF - Spanish - AENOR
    Learn More
    €29.00

  • UNE-EN 60512-1-4:2003

    Electromechanical components for electronic equipment - Basic testing procedures and measuring methods -- Part 1: General -- Section 4: Test 1d: Contact protection effectiveness (scoop-proof).
    7/18/2003 - PDF - Spanish - AENOR
    Learn More
    €29.00

  • UNE-EN 60512-1:2003

    Connectors for electronic equipment - Tests and measurements. Part 1: General.
    2/14/2003 - PDF - Spanish - AENOR
    Learn More
    €33.00

  • UNE-EN 60512-12-7:2002

    Connectors for electronic equipment - Tests and measurements -- Part 12-7: Soldering tests - Test 12g: Solderability, wetting balance method.
    9/30/2002 - PDF - Spanish - AENOR
    Learn More
    €27.00

  • BS EN 60512-6-2:2002

    Connectors for electronic equipment. Tests and measurements. Dynamic stress tests. Test 6b. Bump
    6/5/2002 - PDF - English - BSI
    Learn More
    €121.90

  • JIS C 5402-19-3:2002 (R2017)

    Connectors for electronic equipment - Tests and measurements - Part 19-3: Chemical resistance tests - Test 19c: Fluid resistance
    3/20/2002 - PDF - Japanese - JSA
    Learn More
    €25.00

  • JIS C 5402-1-3:2002 (R2017)

    Connectors for electronic equipment - Tests and measurements - Part 1-3: General examination - Test 1c: Electrical engagement length
    3/20/2002 - PDF - Japanese - JSA
    Learn More
    €25.00

  • JIS C 5402-1-4:2002 (R2017)

    Connectors for electronic equipment - Tests and measurements - Part 1-4: General examination - Test 1d: Contact protection effectiveness (scoop-proof)
    3/20/2002 - PDF - Japanese - JSA
    Learn More
    €25.00

  • JIS C 5402-11-1:2002 (R2017)

    Connectors for electronic equipment - Tests and measurements - Part 11-1: Climatic tests - Test 11a: Climatic sequence
    3/20/2002 - PDF - Japanese - JSA
    Learn More
    €25.00

  • JIS C 5402-11-8:2002 (R2017)

    Connectors for electronic equipment - Tests and measurements - Part 11-8: Climatic tests - Test 11h: Sand and dust
    3/20/2002 - PDF - Japanese - JSA
    Learn More
    €25.00

  • JIS C 5402-12-6:2002 (R2017)

    Connectors for electronic equipment - Tests and measurements - Part 12-6: Soldering tests - Test 12f: Sealing against flux and cleaning solvents in machine soldering
    3/20/2002 - PDF - Japanese - JSA
    Learn More
    €25.00

  • UNE-EN 60512-23-3:2001

    Electromechanical components for electronic equipment - Basic testing procedures and measuring methods -- Part 23-3: Test 23c: Shielding effectiveness of connectors and accessories.
    12/31/2001 - PDF - Spanish - AENOR
    Learn More
    €47.00

  • UNE-EN 60512-20-2:2001

    Electromechanical components for electronic equipment - Basic testing procedures and measuring methods -- Part 20-2: Test 20b - Flammability tests - Fireproofness.
    12/21/2001 - PDF - Spanish - AENOR
    Learn More
    €46.00

  • DIN EN 60512-12-7:2001-11

    Connectors for electronic equipment - Tests and measurements - Part 12-7: Soldering tests; Test 12g: Solderability, wetting balance method (IEC 60512-12-7:2001); German version EN 60512-12-7:2001
    11/1/2001 - PDF - German - DIN
    Learn More
    €47.60

  • EIA JESD 75-1:2001

    Ball Grid Array Pinouts Standardized for 16, 18 and 20-Bit Logic Functions Using a 54 Ball Package
    10/1/2001 - PDF sécurisé - English - EIA
    Learn More
    €33.44

  • BS EN 60512-12-7:2001

    Electromechanical components for electronic equipment. Basic testing procedures and measuring methods. Soldering tests. Test 12g. Solderability, wetting balance method. Section 7: Test 12g: Solderability, wetting balance method
    8/15/2001 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-20-2:2001

    Electromechanical components for electronic equipment. Basic testing procedures and measuring methods. Test 20b. Flammability tests. Fireproofness. Section 2: Test 20b - Fireproofness
    7/15/2001 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60512-6-5:2001

    Electromechanical components for electronic equipment. Basic testing procedures and measuring methods. Dynamic stress tests. Test 6e. Random vibration. Section 5: Test 6e: Random vibration
    7/15/2001 - PDF - English - BSI
    Learn More
    €121.90

  • EIA JESD 75-2:2001

    Ball Grid Array Pinouts Standardized for 16-Bit Logic Functions
    7/1/2001 - PDF sécurisé - English - EIA
    Learn More
    €33.44

  • EIA JESD 75-3:2001

    Ball Grid Array Pinouts Standardized for 8-Bit Logic Functions
    7/1/2001 - PDF sécurisé - English - EIA
    Learn More
    €32.56

  • DIN EN 60512-20-2:2001-04

    Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 20-2: Test: 20b: Flammability tests; Fireproofness (IEC 60512-20-2:2000); German version EN 60512-20-2:2000
    4/1/2001 - PDF - German - DIN
    Learn More
    €61.70

  • NF C93-400-20-2, NF EN 60512-20-2 (03/2001)

    Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 20-2 : test 20b - Flammability tests - Fireproofness
    3/1/2001 - PDF - French - UTE
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    €77.83

  • UNE-EN 60512-11-8:2000

    ELECTROMECHANICAL COMPONENTS FOR ELECTRONIC EQUIPMENT. BASIC TESTING PROCEDURES AND MEASURING METHODS. PART 11: CLIMATIC TESTS. SECTION 8: TEST 11H. SAND AND DUST.
    12/26/2000 - PDF - Spanish - AENOR
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    €29.00

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