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  • PR NF C96-228-3, PR NF EN 62228-3 (09/2018)

    Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
    9/14/2018 - Paper - French - AFNOR
    Learn More
    €112.96

  • EIA JESD 22-B112B:2018

    Package Warpage Measurement of Surface-Mount Integrated Circuits at Elevated Temperature
    8/1/2018 - PDF sécurisé - English - EIA
    Learn More
    €62.64

  • UNE-EN IEC 62228-1:2018

    Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in July of 2018.)
    7/1/2018 - PDF - English - AENOR
    Learn More
    €62.00

  • BS EN IEC 62228-1:2018

    Integrated circuits. EMC evaluation of transceivers. General conditions and definitions
    6/12/2018 - Paper - English - BSI
    Learn More
    €116.28

  • PR NF C96-070-2, PR NF EN 62433-1 (05/2018)

    EMC IC modelling - Part 1: General modelling framework
    5/11/2018 - Paper - French - AFNOR
    Learn More
    €94.83

  • PR NF C96-271-1, PR NF EN 63011-1 (04/2018)

    Integrated circuits - Three dimensional integrated circuits - Part 1: General conditions and definitions
    4/27/2018 - Paper - French - AFNOR
    Learn More
    €44.39

  • PR NF C96-271-2, PR NF EN 63011-2 (04/2018)

    Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect
    4/27/2018 - Paper - French - AFNOR
    Learn More
    €44.39

  • DIN EN 60747-16-3:2018-04

    Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009 + A2:2017); German version EN 60747-16-3:2002 + A1:2009 + A2:2017
    4/1/2018 - PDF - German - DIN
    Learn More
    €141.90

  • PR NF C96-260-1, PR NF EN 61967-1 (03/2018)

    Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
    3/9/2018 - Paper - French - AFNOR
    Learn More
    €91.08

  • EIA JESD 8-31:2018

    1.8 V HIGH-SPEED LVCMOS (HS LVCMOS) INTERFACE
    3/1/2018 - PDF sécurisé - English - EIA
    Learn More
    €41.76

  • DIN EN 62435-3 VDE 0884-135-3:2018-02

    Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data (IEC 47/2430/CD:2017)
    2/1/2018 - Paper - German - VDE
    Learn More
    €18.19

  • PR NF C96-435-6, PR NF EN 62435-6 (01/2018)

    Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or Finished Devices
    1/11/2018 - Paper - French - AFNOR
    Learn More
    €49.53

  • IEC 62228-1 (2018-01)

    IEC 62228-1:2018 Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
    1/9/2018 - PDF - English - CEI
    Learn More
    €22.00

  • EIA JEP 176:2018

    ADAPTER TEST BOARD RELIABILITY TEST GUIDELINES
    1/1/2018 - PDF sécurisé - English - EIA
    Learn More
    €48.72

  • BS EN 62433-3:2017

    EMC IC modelling. Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
    12/13/2017 - Paper - English - BSI
    Learn More
    €289.56

  • DIN EN 62090:2017-12

    Product package labels for electronic components using bar code and two- dimensional symbologies (IEC 62090:2017); German version EN 62090:2017
    12/1/2017 - PDF - German - DIN
    Learn More
    €119.60

  • BS EN 62433-2:2017

    EMC IC modelling. Models of integrated circuits for EMI behavioural simulation. Conducted emissions modelling (ICEM-CE)
    11/14/2017 - Paper - English - BSI
    Learn More
    €310.08

  • DIN EN 61967-1 VDE 0847-21-1:2017-11

    Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (IEC 47A/1022/CD:2017)
    11/1/2017 - Paper - German - VDE
    Learn More
    €29.12

  • DIN EN 62433-6 VDE 0847-33-6:2017-11

    EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI) (IEC 47A/1019/CD:2017)
    11/1/2017 - Paper - German - VDE
    Learn More
    €53.63

  • DIN EN 62435-1 VDE 0884-135-1:2017-10

    Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 62435-1:2017); German version EN 62435-1:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €91.70

  • DIN EN 62435-2 VDE 0884-135-2:2017-10

    Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017); German version EN 62435-2:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €65.60

  • DIN EN 62435-5 VDE 0884-135-5:2017-10

    Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (IEC 62435-5:2017); German version EN 62435-5:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €69.60

  • DIN EN 62433-2 VDE 0847-33-2:2017-10

    EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017); German version EN 62433-2:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €192.57

  • DIN EN 62433-3 VDE 0847-33-3:2017-10

    EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) (IEC 62433-3:2017); German version EN 62433-3:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €169.34

  • DIN EN 62433-1 VDE 0847-33-1:2017-10

    Integrated circuits - EMC IC modelling - Part 1: General modelling framework (IEC 47A/1011/CD:2017)
    10/1/2017 - Paper - German - VDE
    Learn More
    €61.54

  • PR NF C96-271-3, PR NF EN 63011-3 (09/2017)

    Integrated circuits - Three dimensional integrated circuits - Part 3 : a model and measurement conditions of through silicon via
    9/29/2017 - Paper - French - AFNOR
    Learn More
    €54.48

  • DIN EN 62435-6 VDE 0884-135-6:2017-09

    Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or Finished Devices (IEC 47/2390/CD:2017)
    9/1/2017 - Paper - German - VDE
    Learn More
    €20.45

  • DIN EN 62228-2 VDE 0847-28-2:2017-09

    Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers (IEC 62228-2:2016); German version EN 62228-2:2017
    9/1/2017 - Paper - German - VDE
    Learn More
    €104.79

  • NF C96-070-3, NF EN 62433-3 (08/2017)

    EMC IC modelling - Part 3 : models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
    8/5/2017 - PDF - French - UTE
    Learn More
    €164.80

  • NF C96-070-3, NF EN 62433-3 (08/2017)

    EMC IC modelling - Part 3 : models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
    8/5/2017 - PDF - English - UTE
    Learn More
    €164.80

  • UNE-EN 62090:2017

    Product package labels for electronic components using bar code and two- dimensional symbologies (Endorsed by Asociación Española de Normalización in August of 2017.)
    8/1/2017 - PDF - English - AENOR
    Learn More
    €80.00

  • BS EN 62090:2017

    Product package labels for electronic components using bar code and two- dimensional symbologies
    7/31/2017 - Paper - English - BSI
    Learn More
    €225.72

  • NF C96-070-2, NF EN 62433-2 (07/2017)

    EMC IC modelling - Part 2 : models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
    7/28/2017 - PDF - French - UTE
    Learn More
    €183.45

  • NF C96-070-2, NF EN 62433-2 (07/2017)

    EMC IC modelling - Part 2 : models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
    7/28/2017 - PDF - English - UTE
    Learn More
    €183.45

  • DIN EN 62435-4 VDE 0847-35-4:2017-07

    Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage (IEC 47/2324/CD:2016)
    7/1/2017 - Paper - German - VDE
    Learn More
    €22.72

  • UNE-EN 62433-3:2017

    EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) (Endorsed by Asociación Española de Normalización in July of 2017.)
    7/1/2017 - PDF - English - AENOR
    Learn More
    €137.00

  • DIN EN 62228-3 VDE 0847-28-3:2017-06

    Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (IEC 47A/1004/CD:2017)
    6/1/2017 - Paper - German - VDE
    Learn More
    €57.53

  • UNE-EN 62433-2:2017

    EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (Endorsed by Asociación Española de Normalización in June of 2017.)
    6/1/2017 - PDF - English - AENOR
    Learn More
    €150.00

  • DIN EN 62433-4 VDE 0847-33-4:2017-05

    EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI) (IEC 62433-4:2016); German version EN 62433-4:2016
    5/1/2017 - Paper - German - VDE
    Learn More
    €183.01

  • IEC 62090 (2017-04)

    IEC 62090:2017 Product package labels for electronic components using bar code and two-dimensional symbologies
    4/11/2017 - PDF - English - CEI
    Learn More
    €220.00

  • DIN EN 62228-1 VDE 0847-28-1:2017-04

    Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (IEC 47A/995/CD:2016)
    4/1/2017 - Paper - German - VDE
    Learn More
    €16.21

  • NF C96-228-2, NF EN 62228-2 (03/2017)

    Integrated circuits - EMC evaluation of transceivers - Part 2 : LIN transceivers
    3/22/2017 - PDF - French - UTE
    Learn More
    €118.29

  • NF C96-228-2, NF EN 62228-2 (03/2017)

    Integrated circuits - EMC evaluation of transceivers - Part 2 : LIN transceivers
    3/22/2017 - PDF - English - UTE
    Learn More
    €118.29

  • UNE-EN 62228-2:2017

    Integrated circuits - EMC Evaluation of transceivers - Part 2: LIN transceivers (Endorsed by Asociación Española de Normalización in March of 2017.)
    3/1/2017 - PDF - English - AENOR
    Learn More
    €86.00

  • BS EN 62228-2:2017

    Integrated circuits. EMC evaluation of transceivers. LIN transceivers
    2/28/2017 - Paper - English - BSI
    Learn More
    €255.36

  • IEC 62433-2 (2017-01)

    IEC 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
    1/27/2017 - PDF - English, French - CEI
    Learn More
    €352.00

  • IEC 62433-3 (2017-01)

    IEC 62433-3:2017 EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
    1/27/2017 - PDF - English, French - CEI
    Learn More
    €352.00

  • IEEE 1149.10:2017

    IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
    1/1/2017 - PDF sécurisé - English - IEEE
    Learn More
    €81.78

  • IEEE 1804:2017

    IEEE Standard for Fault Accounting and Coverage Reporting (FACR) for Digital Modules
    1/1/2017 - PDF sécurisé - English - IEEE
    Learn More
    €45.24

  • ANSI/VITA 68.0:2017

    VPX Compliance Channel Standard
    1/1/2017 - PDF sécurisé - English - VITA
    Learn More
    €21.25

  • NF C96-070-4, NF EN 62433-4 (12/2016)

    EMC IC modelling - Part 4 : Models of Integrated Circuits for RF immunity behavioural simulation - Conducted Immunity modelling (ICIM-CI)
    12/23/2016 - PDF - French - UTE
    Learn More
    €189.46

  • NF C96-070-4, NF EN 62433-4 (12/2016)

    EMC IC modelling - Part 4 : Models of Integrated Circuits for RF immunity behavioural simulation - Conducted Immunity modelling (ICIM-CI)
    12/23/2016 - PDF - English - UTE
    Learn More
    €189.46

  • UNE-EN 62433-4:2016

    EMC IC modelling - Part 4: Models of Integrated Circuits for RF Immunity behavioural simulation - Conducted Immunity modelling (ICIM-CI) (Endorsed by AENOR in December of 2016.)
    12/1/2016 - PDF - English - AENOR
    Learn More
    €153.00

  • BS EN 62433-4:2016

    EMC IC modelling. Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)
    11/30/2016 - Paper - English - BSI
    Learn More
    €310.08

  • BS IEC 63055:2016

    Format for LSI-Package-Board interoperable design
    11/30/2016 - Paper - English - BSI
    Learn More
    €362.52

  • IEC 62228-2 (2016-11)

    IEC 62228-2:2016 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
    11/18/2016 - PDF - English, French - CEI
    Learn More
    €264.00

  • IEC 63055 (2016-11)

    IEC 63055:2016 Format for LSI-Package-Board Interoperable design
    11/8/2016 - PDF - English - CEI
    Learn More
    €385.00

  • EIA JEP 130B:2016

    Guidelines for Packing and Labeling of Integrated Circuits in Unit Container Packing (Tubes, Trays, and Tape and Reel)
    11/1/2016 - PDF sécurisé - English - EIA
    Learn More
    €46.98

  • EIA JESD 217.01:2016

    Test Methods to Characterize Voiding in Pre-SMT Ball Grid Array Packages
    10/1/2016 - PDF sécurisé - English - EIA
    Learn More
    €75.69

  • DIN EN 62132-1 VDE 0847-22-1:2016-09

    Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (IEC 62132-1:2015); German version EN 62132-1:2016
    9/1/2016 - Paper - German - VDE
    Learn More
    €74.10

  • IEC 62433-4 (2016-05)

    IEC 62433-4:2016 EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
    5/25/2016 - PDF - English, French - CEI
    Learn More
    €352.00

  • NF C96-261-1, NF EN 62132-1 (05/2016)

    Integrated circuits - Measurement of electromagnetic immunity - Part 1 : general conditions and definitions
    5/20/2016 - PDF - French - UTE
    Learn More
    €86.53

  • ASTM F744M-16

    Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
    5/1/2016 - PDF - English - ASTM
    Learn More
    €41.00

  • ASTM F744M-16 + Redline

    Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
    5/1/2016 - PDF - English - ASTM
    Learn More
    €49.00

  • ASTM F773M-16

    Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)
    5/1/2016 - PDF - English - ASTM
    Learn More
    €41.00

  • ASTM F773M-16 + Redline

    Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)
    5/1/2016 - PDF - English - ASTM
    Learn More
    €49.00

  • NF L90-200-60-02, NF EN 16602-60-02 (04/2016)

    Space product assurance - ASIC and FPGA development
    4/9/2016 - Paper - English, French - AFNOR
    Learn More
    €155.29

  • UNE-EN 62132-1:2016

    Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (Endorsed by AENOR in April of 2016.)
    4/1/2016 - PDF - English - AENOR
    Learn More
    €75.00

  • BS EN 62132-1:2016

    Integrated circuits. Measurement of electromagnetic immunity. General conditions and definitions
    3/31/2016 - Paper - English - BSI
    Learn More
    €193.80

  • NEMA ABP 1:2016

    Selective Coordination of Low-Voltage Circuit Breakers
    1/1/2016 - PDF sécurisé - English - NEMA
    Learn More
    €21.25

  • EIA JESD 241:2015

    Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
    12/1/2015 - PDF sécurisé - English - EIA
    Learn More
    €64.38

  • IEC 62132-1 (2015-10)

    IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    10/29/2015 - PDF - English, French - CEI
    Learn More
    €154.00

  • ASTM E1855-15 + Redline

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
    10/1/2015 - PDF - English - ASTM
    Learn More
    €49.00

  • ASTM E1855-15

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
    10/1/2015 - PDF - English - ASTM
    Learn More
    €41.00

  • PD IEC/TR 61967-1-1:2015

    Integrated circuits. Measurement of electromagnetic emissions. General conditions and definitions. Near-field scan data exchange format
    9/30/2015 - Paper - English - BSI
    Learn More
    €271.32

  • EIA JEP 163:2015

    Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits
    9/1/2015 - PDF sécurisé - English - EIA
    Learn More
    €62.64

  • IEC/TR 61967-1-1 (2015-08)

    IEC TR 61967-1-1:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
    8/28/2015 - PDF - English - CEI
    Learn More
    €330.00

  • DIN IEC/TS 61967-3 VDE V 0847-21-3:2015-08

    Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
    8/1/2015 - Paper - German - VDE
    Learn More
    €81.46

  • DIN IEC/TS 62132-9 VDE V 0847-22-9:2015-08

    Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)
    8/1/2015 - Paper - German - VDE
    Learn More
    €69.60

  • GEIA-STD-0001-2015

    IBIS Interconnect Modeling Specification
    7/1/2015 - PDF - English - GEIA
    Learn More
    €90.10

  • IPC T-50M:2015

    Terms and Definitions for Interconnecting and Packaging Electronic Circuits
    5/1/2015 - Paper - English - IPC
    Learn More
    €156.88

  • IPC T-50M:2015 - Hard Copy

    Terms and Definitions for Interconnecting and Packaging Electronic Circuits
    5/1/2015 - Paper - French - IPC
    Learn More
    €236.38

  • NF C96-500-5, NF EN 165000-5 (02/2015)

    Film and hybrid integrated circuits - Part 5 : procedure for qualification approval
    2/7/2015 - PDF - French - UTE
    Learn More
    €97.45

  • NF C96-500-5, NF EN 165000-5 (02/2015)

    Film and hybrid integrated circuits - Part 5 : procedure for qualification approval
    2/7/2015 - PDF - English - UTE
    Learn More
    €97.45

  • IEEE 1801:2015

    IEEE Standard for Design and Verification of Low-Power, Energy-Aware Electronic Systems
    1/1/2015 - PDF sécurisé - English - IEEE
    Learn More
    €356.70

  • IEEE 61523-4:2015

    IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits
    1/1/2015 - PDF sécurisé - English - IEEE
    Learn More
    €241.86

  • IEEE 2401:2015

    IEEE Standard Format for LSI-Package-Board Interoperable Design
    1/1/2015 - PDF sécurisé - English - IEEE
    Learn More
    €162.69

  • ANSI/VITA 46.11:2015

    System Management on VPX
    1/1/2015 - PDF sécurisé - English - VITA
    Learn More
    €85.00

  • ANSI/VITA 78:2015

    SpaceVPX System Specification
    1/1/2015 - PDF sécurisé - English - VITA
    Learn More
    €85.00

  • ANSI/ESD SP 14.5:2015

    ESD Association Standard Practice for Electrostatic Discharge Sensitivity Testing - Near Field Immunity Scanning - Component/Module/PCB Level
    1/1/2015 - PDF sécurisé - English - ESD
    Learn More
    €118.80

  • PD IEC/TS 61967-3:2014

    Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. Surface scan method
    9/30/2014 - Paper - English - BSI
    Learn More
    €225.72

  • PD IEC/TS 62132-9:2014

    Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. Surface scan method
    9/30/2014 - Paper - English - BSI
    Learn More
    €193.80

  • IEC/TS 61967-3 (2014-08)

    IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
    8/25/2014 - PDF - English, French - CEI
    Learn More
    €220.00

  • IEC/TS 62132-9 (2014-08)

    IEC TS 62132-9:2014 Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
    8/21/2014 - PDF - English, French - CEI
    Learn More
    €187.00

  • EIA JESD 22-A120B:2014

    Test Method for the Measurement of Moisture Diffusivity and Water Solubility in Organic Materials Used in Electronic Devices
    7/1/2014 - PDF sécurisé - English - EIA
    Learn More
    €48.72

  • ASTM F1262M-14

    Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
    6/1/2014 - PDF - English - ASTM
    Learn More
    €41.00

  • DIN EN 62215-3 VDE 0847-23-3:2014-04

    Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 62215-3:2013); German version EN 62215-3:2013
    4/1/2014 - Paper - German - VDE
    Learn More
    €84.90

  • IPC J-STD-030A:2014

    Selection and Application of Board Level Underfill Materials
    3/24/2014 - Paper - English - IPC
    Learn More
    €156.88

  • NF C96-215-3, NF EN 62215-3 (03/2014)

    Integrated circuits - Measurement of impulse immunity - Part 3 : non-synchronous transient injection method
    3/19/2014 - PDF - French - UTE
    Learn More
    €97.45

  • EIA JESD 237:2014

    Reliability Qualification of Power Amplifier Modules
    3/1/2014 - PDF sécurisé - English - EIA
    Learn More
    €58.29

  • NF C96-016-5, NF EN 60747-16-5 (02/2014)

    Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
    2/22/2014 - PDF - French - UTE
    Learn More
    €106.80

  • IEEE 1687:2014

    IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
    1/1/2014 - PDF sécurisé - English - IEEE
    Learn More
    €223.59

  • ANSI/ATIS 0600020:2014

    Test Requirements for Pb-Free Circuit Packs
    1/1/2014 - PDF sécurisé - English - ANSI
    Learn More
    €95.70

  • EIA-944:2013

    Surface Mount Ferrite Chip Bead Qualification Specification
    12/1/2013 - PDF sécurisé - English - EIA
    Learn More
    €67.86

  • UNE-EN 62215-3:2013

    Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (Endorsed by AENOR in November of 2013.)
    11/1/2013 - PDF - English - AENOR
    Learn More
    €81.00

  • BS EN 62215-3:2013

    Integrated circuits. Measurement of impulse immunity. Non-synchronous transient injection method
    10/31/2013 - Paper - English - BSI
    Learn More
    €225.72

  • DIN 51456:2013-10

    Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)
    10/1/2013 - PDF - German - DIN
    Learn More
    €68.30

  • EIA JESD 49A.01:2013

    Procurement Standard for Semiconductor Die Products Including Known Good Die (KGD)
    10/1/2013 - PDF sécurisé - English - EIA
    Learn More
    €52.20

  • NF C96-070-2, NF EN 62433-2 (09/2013)

    EMC IC modelling - Part 2 : models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
    9/21/2013 - PDF - French - UTE
    Learn More
    €128.70

  • IEC 62215-3 (2013-07)

    IEC 62215-3:2013 Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
    7/17/2013 - PDF - English, French - CEI
    Learn More
    €220.00

  • NF C86-213, NF EN 190101 (04/2013)

    Family Specification : Digital Integrated TTL Circuits - Series 54, 64, 74, 84
    4/6/2013 - PDF - French - UTE
    Learn More
    €86.53

  • NF C86-216, NF EN 190102 (04/2013)

    Family Specification : TTL Schottky Digital Integrated Circuits - Series 54S, 64S, 74S, 84S
    4/6/2013 - PDF - French - UTE
    Learn More
    €73.94

  • NF C86-020, NF EN 190000 (04/2013)

    Generic Specification : monolithic integrated circuits
    4/6/2013 - PDF - French - UTE
    Learn More
    €257.38

  • NF C86-219, NF EN 190108 (04/2013)

    Family Specification : TTL Advanced Schottky Digital Integrated Circuits - Series 54AS, 74AS
    4/6/2013 - PDF - French - UTE
    Learn More
    €86.53

  • NF C86-222, NF EN 190109 (04/2013)

    Family specification : Digital Integrated HC MOS Circuits - Series HC/HCT/HCU
    4/6/2013 - PDF - French - UTE
    Learn More
    €118.29

  • NF C86-241, NF EN 190110 (04/2013)

    Blank Detail Specification : Digital Microprocessor Integrated Circuits
    4/6/2013 - PDF - French - UTE
    Learn More
    €86.53

  • NF C86-226, NF EN 190116 (04/2013)

    Family specification : AC MOS Digital Integrated Circuits
    4/6/2013 - PDF - French - UTE
    Learn More
    €97.45

  • NF C86-218, NF EN 190107 (04/2013)

    Family Specification : TTL FAST Digital Integrated Circuits - Series 54F, 74F
    4/6/2013 - PDF - French - UTE
    Learn More
    €86.53

  • NF C86-218, NF EN 190107 (04/2013)

    Family Specification : TTL FAST Digital Integrated Circuits - Series 54F, 74F
    4/6/2013 - PDF - English - UTE
    Learn More
    €86.53

  • NF C86-020, NF EN 190000 (04/2013)

    Generic Specification : monolithic integrated circuits
    4/6/2013 - PDF - English - UTE
    Learn More
    €257.38

  • NF C86-219, NF EN 190108 (04/2013)

    Family Specification : TTL Advanced Schottky Digital Integrated Circuits - Series 54AS, 74AS
    4/6/2013 - PDF - English - UTE
    Learn More
    €86.53

  • NF C86-222, NF EN 190109 (04/2013)

    Family specification : Digital Integrated HC MOS Circuits - Series HC/HCT/HCU
    4/6/2013 - PDF - English - UTE
    Learn More
    €118.29

  • NF C86-213, NF EN 190101 (04/2013)

    Family Specification : Digital Integrated TTL Circuits - Series 54, 64, 74, 84
    4/6/2013 - PDF - English - UTE
    Learn More
    €86.53

  • NF C86-216, NF EN 190102 (04/2013)

    Family Specification : TTL Schottky Digital Integrated Circuits - Series 54S, 64S, 74S, 84S
    4/6/2013 - PDF - English - UTE
    Learn More
    €73.94

  • NF C86-226, NF EN 190116 (04/2013)

    Family specification : AC MOS Digital Integrated Circuits
    4/6/2013 - PDF - English - UTE
    Learn More
    €97.45

  • NF C86-241, NF EN 190110 (04/2013)

    Blank Detail Specification : Digital Microprocessor Integrated Circuits
    4/6/2013 - PDF - English - UTE
    Learn More
    €86.53

  • NF C86-200, NF EN 190100 (03/2013)

    Sectional specification : digital monolithic integrated circuits
    3/6/2013 - PDF - French - UTE
    Learn More
    €142.39

  • NF C86-212, NF EN 190103 (03/2013)

    Family Specification : digital Integrated TTL Low Power Schottky Circuits - Series 54LS, 64LS, 74LS, 84LS
    3/6/2013 - PDF - French - UTE
    Learn More
    €97.45

  • NF C86-217, NF EN 190106 (03/2013)

    Family specification : TTL Advanced Low Power Schottky Digital Integrated Circuits - Series 54ALS, 74ALS
    3/6/2013 - PDF - French - UTE
    Learn More
    €86.53

  • NF C86-212, NF EN 190103 (03/2013)

    Family Specification : digital Integrated TTL Low Power Schottky Circuits - Series 54LS, 64LS, 74LS, 84LS
    3/6/2013 - PDF - English - UTE
    Learn More
    €97.45

  • NF C86-217, NF EN 190106 (03/2013)

    Family specification : TTL Advanced Low Power Schottky Digital Integrated Circuits - Series 54ALS, 74ALS
    3/6/2013 - PDF - English - UTE
    Learn More
    €86.53

  • NF C86-200, NF EN 190100 (03/2013)

    Sectional specification : digital monolithic integrated circuits
    3/6/2013 - PDF - English - UTE
    Learn More
    €142.39

  • DIN EN 62132-8 VDE 0847-22-8:2013-03

    Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012); German version EN 62132-8:2012
    3/1/2013 - Paper - German - VDE
    Learn More
    €65.60

  • NF C96-261-8, NF EN 62132-8 (02/2013)

    Integrated circuits - Measurement of electromagnetic immunity - Part 8 : measurement of radiated immunity - IC stripline method
    2/28/2013 - PDF - French - UTE
    Learn More
    €86.53

  • EIA JEP 170:2013

    Guidelines for Visual Inspection and Control of Flip Chip Type Components (FCxGA)
    1/1/2013 - PDF sécurisé - English - EIA
    Learn More
    €51.33

  • EIA JESD 226:2013

    RF BIASED LIFE (RFBL) TEST METHOD
    1/1/2013 - PDF sécurisé - English - EIA
    Learn More
    €52.20

  • IEEE 1149.1:2013

    IEEE Standard for Test Access Port and Boundary-Scan Architecture
    1/1/2013 - PDF sécurisé - English - IEEE
    Learn More
    €250.56

  • ANSI/VITA 46.6:2013

    Gigabit Ethernet Control Plane on VPX
    1/1/2013 - PDF sécurisé - English - VITA
    Learn More
    €42.50

  • ANSI/VITA 46.0:2013

    VPX Baseline Standard
    1/1/2013 - PDF sécurisé - English - VITA
    Learn More
    €85.00

  • UNE-EN 62132-8:2012

    Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by AENOR in November of 2012.)
    11/1/2012 - PDF - English - AENOR
    Learn More
    €74.00

  • BS EN 62132-8:2012

    Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. IC stripline method
    10/31/2012 - Paper - English - BSI
    Learn More
    €193.80

  • IEC 62132-8 (2012-07)

    IEC 62132-8:2012 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
    7/6/2012 - PDF - English, French - CEI
    Learn More
    €154.00

  • NF C96-016-4/A1, NF EN 60747-16-4/A1 (07/2012)

    Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
    7/1/2012 - PDF - French - UTE
    Learn More
    €60.25

  • DIN EN 61967-8 VDE 0847-21-8:2012-04

    Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (IEC 61967-8:2011); German version EN 61967-8:2011
    4/1/2012 - Paper - German - VDE
    Learn More
    €61.54

  • NF C96-260-8, NF EN 61967-8 (03/2012)

    Integrated circuits - Measurement of electromagnetic emissions - Part 8 : measurement of radiated emissions - IC stripline method
    3/1/2012 - PDF - French - UTE
    Learn More
    €73.94

  • ANSI/VITA 46.7:2012

    Ethernet on VPX Fabric Connector
    1/1/2012 - PDF sécurisé - English - VITA
    Learn More
    €21.25

  • ANSI/VITA 46.3:2012

    Serial RapidIO on VPX Fabric Connector
    1/1/2012 - PDF sécurisé - English - VITA
    Learn More
    €42.50

  • ANSI/VITA 46.4:2012

    PCIExpress (R) on the VPX Fabric Connector
    1/1/2012 - PDF sécurisé - English - VITA
    Learn More
    €21.25

  • UNE-EN 61967-8:2011

    Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by AENOR in January of 2012.)
    1/1/2012 - PDF - English - AENOR
    Learn More
    €68.00

  • BS EN 61967-8:2011

    Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. IC stripline method
    11/30/2011 - Paper - English - BSI
    Learn More
    €139.08

  • NF C96-261-2, NF EN 62132-2 (11/2011)

    Integrated circuits - Measurement of electromagnetic immunity - Part 2 : measurement of radiated immunity - TEM cell and wideband TEM cell method
    11/1/2011 - PDF - French - UTE
    Learn More
    €97.45

  • IEC 61967-8 (2011-08)

    IEC 61967-8:2011 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
    8/11/2011 - PDF - English, French - CEI
    Learn More
    €110.00

  • DIN EN 62132-2 VDE 0847-22-2:2011-07

    Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011
    7/1/2011 - Paper - German - VDE
    Learn More
    €74.10

  • UNE-EN 62132-2:2011

    Integrated circuits - Measurement of electromagnetic immunity -- Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (Endorsed by AENOR in July of 2011.)
    7/1/2011 - PDF - English - AENOR
    Learn More
    €74.00

  • DD IEC/TS 62433-1:2011

    EMC IC modelling. General modelling framework
    6/30/2011 - Paper - English - BSI
    Learn More
    €139.08

  • BS EN 62132-2:2011

    Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. TEM cell and wideband TEM cell method
    4/30/2011 - Paper - English - BSI
    Learn More
    €193.80

  • IEC/TS 62433-1 (2011-04)

    IEC TS 62433-1:2011 EMC IC modelling - Part 1: General modelling framework
    4/21/2011 - PDF - English, French - CEI
    Learn More
    €44.00

  • EIA JESD 22-B118:2011

    Semiconductor Wafer and Die Backside External Visual Inspection
    3/1/2011 - PDF sécurisé - English - EIA
    Learn More
    €51.33

  • PD IEC/TR 62433-2-1:2010

    EMC IC modelling. Theory of black box modelling for conducted emission
    2/28/2011 - Paper - English - BSI
    Learn More
    €193.80

  • IEEE 1581:2011

    IEEE Standard for Static Component Interconnection Test Protocol and Architecture
    1/1/2011 - PDF sécurisé - English - IEEE
    Learn More
    €85.26

  • IEEE 1658:2011

    Terminology and Test Methods of Digital-to-Analog Converter Devices
    1/1/2011 - PDF sécurisé - English - IEEE
    Learn More
    €138.33

  • DIN EN 62417:2010-12

    Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
    12/1/2010 - PDF - German - DIN
    Learn More
    €61.70

  • IEC/TR 62433-2-1 (2010-10)

    IEC TR 62433-2-1:2010 EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission
    10/5/2010 - PDF - English, French - CEI
    Learn More
    €187.00

  • UNE-EN 62433-2:2010

    EMC IC modelling -- Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (Endorsed by AENOR in May of 2010.)
    5/1/2010 - PDF - English - AENOR
    Learn More
    €92.00

  • CTA-CEB12-B:2010

    DTV Recommended Practice for Locating and Navigating among ATSC Television Channels (Including PSIP Recommendations)
    4/1/2010 - PDF sécurisé - English - ANSI
    Learn More
    €75.69

  • IEC 62132-2 (2010-03)

    IEC 62132-2:2010 Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
    3/30/2010 - PDF - English, French - CEI
    Learn More
    €154.00

  • IEEE 1241:2010

    Terminology and test methods for analog-to-digital converters
    1/1/2010 - PDF sécurisé - English - IEEE
    Learn More
    €147.90

  • IEEE 605a:2010

    IEEE Guide for Bus Design in Air-Insulated Substations; Amendment 1
    1/1/2010 - PDF sécurisé - English - IEEE
    Learn More
    €69.60

  • EIA JEP 158:2009

    3D Chip Stack with Through-Silicon Vias (TSVS): Identifying, Evaluating and Understanding Reliability Interactions
    11/1/2009 - PDF sécurisé - English - EIA
    Learn More
    €60.03

  • EIA JESD 8-23:2009

    Unified Wide Power Supply Voltage Range CMOS DC Interface Standard for Non-Terminated Digital Integrated Circuits
    10/1/2009 - PDF sécurisé - English - EIA
    Learn More
    €44.37

  • IEEE 1481:2009

    Integrated Circuit (IC) Open Library Architecture (OLA)
    1/1/2009 - PDF sécurisé - English - IEEE
    Learn More
    €251.43

  • ANSI/VITA 46.10:2009

    Rear Transition Module for VPX
    1/1/2009 - PDF sécurisé - English - VITA
    Learn More
    €42.50

  • DIN EN 61967-6:2008-10

    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008
    10/1/2008 - PDF - German - DIN
    Learn More
    €119.60

  • BS IEC 60748-2-20:2008

    Semiconductor devices. Integrated circuits. Digital integrated circuits. Family specification. Low voltage integrated circuits
    9/30/2008 - Paper - English - BSI
    Learn More
    €139.08

  • UNE-EN 61967-6:2002/A1:2008

    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)
    9/1/2008 - PDF - English - AENOR
    Learn More
    €71.00

  • IEC 61967-6 Edition 1.1 (2008-06)

    IEC 61967-6:2002+AMD1:2008 consolidated version Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
    6/24/2008 - PDF - English, French - CEI
    Learn More
    €385.00

  • NF C96-260-6/A1, NF EN 61967-6/A1 (06/2008)

    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6 : measurement of conducted emissions - Magnetic probe method
    6/1/2008 - PDF - French - UTE
    Learn More
    €86.53

  • DIN EN 62132-3:2008-04

    Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method (IEC 62132-3:2007); German version EN 62132-3:2007
    4/1/2008 - PDF - German - DIN
    Learn More
    €103.00

  • IEC 61967-6 AMD 1 (2008-03)

    IEC 61967-6:2002/AMD1:2008 Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
    3/12/2008 - PDF - English, French - CEI
    Learn More
    €110.00

  • IEC 60748-2-20 (2008-02)

    IEC 60748-2-20:2008 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
    2/27/2008 - PDF - English, French - CEI
    Learn More
    €154.00

  • UNE-EN 62132-3:2007

    Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz -- Part 3: Bulk current injection (BCI) method (IEC 62132-3:2007). (Endorsed by AENOR in February of 2008.)
    2/1/2008 - PDF - English - AENOR
    Learn More
    €71.00

  • IEEE 605:2008

    Guide for bus design in air insulated substations
    1/1/2008 - PDF sécurisé - English - IEEE
    Learn More
    €74.82

  • EIA JESD 51-2A:2008

    Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
    1/1/2008 - PDF sécurisé - English - EIA
    Learn More
    €49.59

  • NF C96-261-3, NF EN 62132-3 (01/2008)

    Integrated circuits - Measurement of electromagnetic immunity, 150 KHz to 1 GHz - Part 3 : Bulk Current Injection (BCI) method
    1/1/2008 - PDF - French - UTE
    Learn More
    €86.53

  • BS IEC 62528:2007

    Standard testability method for embedded core-based integrated circuits
    12/31/2007 - Paper - English - BSI
    Learn More
    €335.16

  • BS EN 62132-3:2007

    Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz. Bulk current injection (BCI) method
    11/30/2007 - Paper - English - BSI
    Learn More
    €139.08

  • DD IEC/TS 62215-2:2007

    Integrated circuits. Measurement of impulse immunity. Synchronous transient injection method
    11/30/2007 - Paper - English - BSI
    Learn More
    €193.80

  • IEC 62528 (2007-11)

    IEC 62528:2007 Standard Testability Method for Embedded Core-based Integrated Circuits
    11/7/2007 - PDF - English - CEI
    Learn More
    €363.00

  • IEC 62132-3 (2007-09)

    IEC 62132-3:2007 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
    9/26/2007 - PDF - English, French - CEI
    Learn More
    €110.00

  • IEC/TS 62215-2 (2007-09)

    IEC TS 62215-2:2007 Integrated circuits - Measurement of impulse immunity - Part 2: Synchronous transient injection method
    9/10/2007 - PDF - English - CEI
    Learn More
    €187.00

  • EIA JESD 8-12A.01:2007

    1.2 V +/- 0.1V (Normal Range) and 0.8 - 1.3 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits
    9/1/2007 - PDF sécurisé - English - EIA
    Learn More
    €35.67

  • EIA JESD 8-5A.01:2007

    2.5 V (PLUS OR MINUS) 0.2 V (Normal Range) and 1.8 V - 2.7 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits
    9/1/2007 - PDF sécurisé - English - EIA
    Learn More
    €37.41

  • EIA JESD 8-11A.01:2007

    1.5 V +/- 0.1 V (Normal Range) and 0.9 V - 1.6 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits
    9/1/2007 - PDF sécurisé - English - EIA
    Learn More
    €35.67

  • EIA JESD 8-14A.01:2007

    1.0 V +/- 0.1 V (Normal Range) and 0.7 V - 1.1 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits
    9/1/2007 - PDF sécurisé - English - EIA
    Learn More
    €35.67

  • DD IEC/TS 62404:2007

    Logic digital integrated circuits. Specification for I/O interface model for integrated circuit (IMIC version 1.3)
    3/30/2007 - Paper - English - BSI
    Learn More
    €289.56

  • DD IEC/TS 62228:2007

    Integrated circuits. EMC evaluation of CAN transceivers
    3/30/2007 - Paper - English - BSI
    Learn More
    €255.36

  • EIA JESD 8-3A:2007

    Gunning Transceiver Logic (GTL) Low-Level, High Speed Interface Standard for Digital Integrated Circuits
    3/1/2007 - PDF sécurisé - English - EIA
    Learn More
    €34.80

  • BS IEC 60748-4-3:2006

    Semiconductor devices. Integrated circuits. Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
    2/28/2007 - Paper - English - BSI
    Learn More
    €225.72

  • IEC/TS 62404 (2007-02)

    IEC TS 62404:2007 Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
    2/20/2007 - PDF - English - CEI
    Learn More
    €330.00

  • JIS R 1641:2007

    Measurement method for dielectric of fine ceramic plates at microwave frequency
    2/20/2007 - PDF - Japanese - JSA
    Learn More
    €41.86

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