31.140 : Piezoelectric devices

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  • DIN EN 60679-1:2018-04

    Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2017); German version EN 60679-1:2017
    4/1/2018 - PDF - German - DIN
    Learn More
    €125.30

  • IEC 62884-3 (2018-03)

    IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
    3/22/2018 - PDF - English - CEI
    Learn More
    €77.00

  • BS EN IEC 63041-2:2018

    Piezoelectric sensors. Chemical and biochemical sensors
    3/21/2018 - Paper - English - BSI
    Learn More
    €139.08

  • BS EN IEC 62604-2:2018

    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality. Guidelines for the use
    3/20/2018 - Paper - English - BSI
    Learn More
    €193.80

  • BS EN IEC 63041-1:2018

    Piezoelectric sensors. Generic specifications
    3/15/2018 - Paper - English - BSI
    Learn More
    €193.80

  • DIN EN 62884-1:2018-02

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017); German version EN 62884-1:2017
    2/1/2018 - PDF - German - DIN
    Learn More
    €169.80

  • DIN EN 60122-4:2018-01

    Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 49/1244/CD:2017)
    1/1/2018 - PDF - English, German - DIN
    Learn More
    €82.60

  • UNE-EN 62884-2:2017

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (Endorsed by Asociación Española de Normalización in January of 2018.)
    1/1/2018 - PDF - English - AENOR
    Learn More
    €75.00

  • IEC 63041-1 (2017-12)

    IEC 63041-1:2017 Piezoelectric sensors - Part 1: Generic specifications
    12/13/2017 - PDF - English - CEI
    Learn More
    €154.00

  • IEC 63041-2 (2017-12)

    IEC 63041-2:2017 Piezoelectric sensors - Part 2: Chemical and biochemical sensors
    12/13/2017 - PDF - English - CEI
    Learn More
    €77.00

  • BS EN 60679-1:2017

    Piezoelectric, dielectric and electrostatic oscillators of assessed quality. Generic specification
    12/13/2017 - Paper - English - BSI
    Learn More
    €225.72

  • IEC 60122-1 AMD 1 (2017-12)

    IEC 60122-1:2002/AMD1:2017 Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
    12/8/2017 - PDF - English - CEI
    Learn More
    €44.00

  • IEC 60122-1 Edition 3.1 (2017-12)

    IEC 60122-1:2002+AMD1:2017 consolidated version Quartz crystal units of assessed quality - Part 1: Generic specification
    12/8/2017 - PDF - English - CEI
    Learn More
    €385.00

  • BS EN 62884-2:2017

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators. Phase jitter measurement method
    12/8/2017 - Paper - English - BSI
    Learn More
    €193.80

  • BS EN 60793-1-33:2017

    Optical fibres. Measurement methods and test procedures - Stress corrosion susceptibility
    12/7/2017 - Paper - English - BSI
    Learn More
    €225.72

  • UNE-EN 60679-1:2017

    Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in December of 2017.)
    12/1/2017 - PDF - English - AENOR
    Learn More
    €83.00

  • IEC 62604-2 (2017-11)

    IEC 62604-2:2017 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
    11/29/2017 - PDF - English - CEI
    Learn More
    €154.00

  • UNE-EN 62884-1:2017

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (Endorsed by Asociación Española de Normalización in November of 2017.)
    11/1/2017 - PDF - English - AENOR
    Learn More
    €108.00

  • DIN EN 60444-8:2017-11

    Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017
    11/1/2017 - PDF - German - DIN
    Learn More
    €96.00

  • JIS C 6704:2017

    Synthetic quartz crystal
    10/20/2017 - PDF - Japanese - JSA
    Learn More
    €50.18

  • BS IEC 62047-30:2017

    Semiconductor devices. Micro-electromechanical devices. Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
    10/9/2017 - Paper - English - BSI
    Learn More
    €139.08

  • BS EN 62884-1:2017

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators. Basic methods for the measurement
    10/4/2017 - Paper - English - BSI
    Learn More
    €271.32

  • NF C93-621-8, NF EN 60444-8 (09/2017)

    Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    9/23/2017 - PDF - French - AFNOR
    Learn More
    €73.94

  • NF C93-621-8, NF EN 60444-8 (09/2017)

    Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    9/23/2017 - PDF - English - AFNOR
    Learn More
    €73.94

  • IEC 62047-30 (2017-09)

    IEC 62047-30:2017 Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
    9/15/2017 - PDF - English - CEI
    Learn More
    €110.00

  • IEC 62884-2 (2017-08)

    IEC 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
    8/30/2017 - PDF - English - CEI
    Learn More
    €154.00

  • DIN EN 61240:2017-08

    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (IEC 61240:2016); German version EN 61240:2017)
    8/1/2017 - PDF - German - DIN
    Learn More
    €96.00

  • DIN EN 62276:2017-08

    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016
    8/1/2017 - PDF - German - DIN
    Learn More
    €141.90

  • IEC 60679-1 (2017-07)

    IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1 : Generic specification
    7/26/2017 - PDF - English - CEI
    Learn More
    €220.00

  • IEC 62884-1 (2017-06)

    IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
    6/8/2017 - PDF - English - CEI
    Learn More
    €330.00

  • BS EN 60444-8:2017

    Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
    5/26/2017 - Paper - English - BSI
    Learn More
    €139.08

  • UNE-EN 60444-8:2017

    Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units (Endorsed by Asociación Española de Normalización in May of 2017.)
    5/1/2017 - PDF - English - AENOR
    Learn More
    €67.00

  • DIN EN 60758:2017-04

    Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2016); German version EN 60758:2016
    4/1/2017 - PDF - German - DIN
    Learn More
    €163.80

  • BS EN 61240:2017

    Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules
    1/31/2017 - Paper - English - BSI
    Learn More
    €193.80

  • DIN EN 62604-2:2017-01

    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (IEC 49/1199/CD:2016)
    1/1/2017 - PDF - English, German - DIN
    Learn More
    €108.80

  • BS EN 62276:2016

    Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
    12/31/2016 - Paper - English - BSI
    Learn More
    €255.36

  • IEC 60050-561 AMD 1 (2016-12)

    IEC 60050-561:2014/AMD1:2016 Amendment 1 - International electrotechnical vocabulary - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    12/16/2016 - PDF - English, French - CEI
    Learn More
    €11.00

  • IEC 60444-8 (2016-12)

    IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    12/15/2016 - PDF - English - CEI
    Learn More
    €77.00

  • IEC 60444-8 (2016-12)

    IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    12/15/2016 - PDF - English, French - CEI
    Learn More
    €77.00

  • UNE-EN 60758:2016

    Synthetic Quartz Crystal - Specifications and guidelines for use (Endorsed by AENOR in November of 2016.)
    11/1/2016 - PDF - English - AENOR
    Learn More
    €108.00

  • IEC 61240 (2016-10)

    IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
    10/24/2016 - PDF - English - CEI
    Learn More
    €110.00

  • IEC 62276 (2016-10)

    IEC 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    10/24/2016 - PDF - English, French - CEI
    Learn More
    €220.00

  • IEC 62276 (2016-10)

    IEC 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    10/24/2016 - PDF - English - CEI
    Learn More
    €220.00

  • IEC 61240 (2016-10)

    IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
    10/24/2016 - PDF - English, French - CEI
    Learn More
    €110.00

  • BS EN 60758:2016

    Synthetic quartz crystal. Specifications and guidelines for use
    9/30/2016 - Paper - English - BSI
    Learn More
    €271.32

  • DIN EN 62575-1:2016-09

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (IEC 62575-1:2015); German version EN 62575-1:2016
    9/1/2016 - PDF - German - DIN
    Learn More
    €125.30

  • DIN EN 63041-1:2016-08

    Sensor devices using piezoelectric bulk or surface acoustic waves - Part 1: Generic specifications (IEC 49/1183A/CD)
    8/1/2016 - PDF - English, German - DIN
    Learn More
    €103.00

  • DIN EN 63041-2:2016-08

    Sensor devices using piezoelectric bulk or surface acoustic waves - Part 2: Chemical sensors and Biosensors (IEC 49/1184/CD)
    8/1/2016 - PDF - English, German - DIN
    Learn More
    €108.80

  • DIN EN 60122-1/A1:2016-08

    Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 49/1180/CD:2016)
    8/1/2016 - PDF - English, German - DIN
    Learn More
    €68.30

  • DIN EN 62884-3:2016-08

    Measurement techniques of piezoelectric, dieletiric and electrostatic oscillators - Part 3: Frequency aging test methods (IEC 49/1181/CD)
    8/1/2016 - PDF - English, German - DIN
    Learn More
    €89.00

  • DIN EN 62884-4:2016-08

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4: Short-term frequency stability test methods (IEC 49/1182/CD)
    8/1/2016 - PDF - English, German - DIN
    Learn More
    €103.00

  • IEC 60758 (2016-05)

    IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
    5/18/2016 - PDF - English - CEI
    Learn More
    €297.00

  • IEC 60758 (2016-05)

    IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
    5/18/2016 - PDF - English, French - CEI
    Learn More
    €297.00

  • NF C93-617-1, NF EN 62575-1 (04/2016)

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1 : generic specification
    4/23/2016 - PDF - French - AFNOR
    Learn More
    €106.80

  • DIN EN 61338-1-5:2016-04

    Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (IEC 61338-1-5:2015); German version EN 61338-1-5:2015
    4/1/2016 - PDF - German - DIN
    Learn More
    €103.00

  • DIN EN 62604-1:2016-04

    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (IEC 62604-1:2015); German version EN 62604-1:2015
    4/1/2016 - PDF - German - DIN
    Learn More
    €119.60

  • UNE-EN 62575-1:2016

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (Endorsed by AENOR in April of 2016.)
    4/1/2016 - PDF - English - AENOR
    Learn More
    €83.00

  • BS EN 62575-1:2016

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality. Generic specification
    3/31/2016 - Paper - English - BSI
    Learn More
    €225.72

  • PR NF C93-614, PR NF EN 61240 (03/2016)

    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
    3/11/2016 - Paper - French - AFNOR
    Learn More
    €54.48

  • NF C93-628-3, NF EN 61837-3 (01/2016)

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3 : metal enclosure
    1/23/2016 - PDF - French - AFNOR
    Learn More
    €86.53

  • UNE-EN 60862-1:2015

    Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification (Endorsed by AENOR in January of 2016.)
    1/1/2016 - PDF - English - AENOR
    Learn More
    €89.00

  • UNE-EN 61837-3:2015

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures (Endorsed by AENOR in January of 2016.)
    1/1/2016 - PDF - English - AENOR
    Learn More
    €73.00

  • BS EN 61837-3:2015

    Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Metal enclosures
    12/31/2015 - Paper - English - BSI
    Learn More
    €193.80

  • NF C93-631-1, NF EN 60862-1 (12/2015)

    Surface acoustic wave (SAW) filters of assessed quality - Part 1 : generic specification
    12/25/2015 - PDF - French - AFNOR
    Learn More
    €118.29

  • BS EN 60862-1:2015

    Surface acoustic wave (SAW) filters of assessed quality. Generic specification
    11/30/2015 - Paper - English - BSI
    Learn More
    €271.32

  • NF C93-604-1, NF EN 62604-1 (11/2015)

    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1 : generic specification
    11/28/2015 - PDF - French - AFNOR
    Learn More
    €97.45

  • NF C96-627-1-5, NF EN 61338-1-5 (11/2015)

    Waveguide type dielectric resonators - Part 1-5 : general information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
    11/21/2015 - PDF - French - AFNOR
    Learn More
    €86.53

  • IEC 62575-1 (2015-10)

    IEC 62575-1:2015 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
    10/29/2015 - PDF - English, French - CEI
    Learn More
    €220.00

  • UNE-EN 62604-1:2015

    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (Endorsed by AENOR in October of 2015.)
    10/1/2015 - PDF - English - AENOR
    Learn More
    €80.00

  • UNE-EN 61338-1-5:2015

    Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (Endorsed by AENOR in October of 2015.)
    10/1/2015 - PDF - English - AENOR
    Learn More
    €73.00

  • BS EN 62604-1:2015

    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality. Generic specification
    9/30/2015 - Paper - English - BSI
    Learn More
    €225.72

  • BS EN 61338-1-5:2015

    Waveguide type dielectric resonators. General information and test conditions. Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
    9/30/2015 - Paper - English - BSI
    Learn More
    €193.80

  • PR NF C93-616, PR NF EN 62276 (09/2015)

    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    9/23/2015 - Paper - French - AFNOR
    Learn More
    €78.69

  • NF C93-628-4, NF EN 61837-4 (08/2015)

    Surface mounted piezoelectric devices for frequency control and selection - Standard outline and terminal lead connections - Part 4 : hybrid enclosure outline
    8/29/2015 - PDF - French - AFNOR
    Learn More
    €73.94

  • IEC 60862-1 (2015-08)

    IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    8/20/2015 - PDF - English, French - CEI
    Learn More
    €264.00

  • PR NF C93-632, PR NF EN 60758 (08/2015)

    Synthetic quartz crystal - Specifications and guidelines for use
    8/15/2015 - Paper - French - AFNOR
    Learn More
    €104.91

  • IEC 62604-1 (2015-07)

    IEC 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    7/16/2015 - PDF - English, French - CEI
    Learn More
    €220.00

  • IEC 61338-1-5 (2015-06)

    IEC 61338-1-5:2015 Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
    6/25/2015 - PDF - English, French - CEI
    Learn More
    €110.00

  • UNE-EN 61837-4:2015

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines (Endorsed by AENOR in June of 2015.)
    6/1/2015 - PDF - English - AENOR
    Learn More
    €64.00

  • BS EN 61837-4:2015

    Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Hybrid enclosure outlines
    5/31/2015 - Paper - English - BSI
    Learn More
    €139.08

  • IEC 61837-3 (2015-04)

    IEC 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
    4/15/2015 - PDF - English, French - CEI
    Learn More
    €110.00

  • IEC 61837-4 (2015-03)

    IEC 61837-4:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
    3/27/2015 - PDF - English, French - CEI
    Learn More
    €77.00

  • DIN EN 62761:2014-12

    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) (IEC 62761:2014); German version EN 62761:2014
    12/1/2014 - PDF - German - DIN
    Learn More
    €108.80

  • IEC 60050-561 (2014-11)

    IEC 60050-561:2014 International Electrotechnical Vocabulary - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    11/7/2014 - PDF - English, French - CEI
    Learn More
    €363.00

  • NF C93-628-2/A1, NF EN 61837-2/A1 (08/2014)

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2 : ceramic enclosures
    8/9/2014 - PDF - French - AFNOR
    Learn More
    €45.98

  • NF C93-671, NF EN 62761 (07/2014)

    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
    7/18/2014 - PDF - French - AFNOR
    Learn More
    €86.53

  • UNE-EN 62761:2014

    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) (Endorsed by AENOR in July of 2014.)
    7/1/2014 - PDF - English - AENOR
    Learn More
    €74.00

  • UNE-EN 61837-2:2011/A1:2014

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (Endorsed by AENOR in July of 2014.)
    7/1/2014 - PDF - English - AENOR
    Learn More
    €17.00

  • BS EN 62761:2014

    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
    6/30/2014 - Paper - English - BSI
    Learn More
    €193.80

  • NF C93-640-101, NF EN 168101 (06/2014)

    Blank detail specification : quartz crystal units (Capacity approval)
    6/21/2014 - PDF - French - AFNOR
    Learn More
    €60.25

  • NF C93-640-201, NF EN 168201 (06/2014)

    Blank detail specification: quartz crystal units (Qualification approval)
    6/21/2014 - PDF - French - AFNOR
    Learn More
    €73.94

  • NF C93-640-101, NF EN 168101 (06/2014)

    Blank detail specification : quartz crystal units (Capacity approval)
    6/21/2014 - PDF - English - AFNOR
    Learn More
    €60.25

  • NF C93-640-201, NF EN 168201 (06/2014)

    Blank detail specification: quartz crystal units (Qualification approval)
    6/21/2014 - PDF - English - AFNOR
    Learn More
    €73.94

  • JIS C 6760:2014

    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    6/20/2014 - PDF - Japanese - JSA
    Learn More
    €41.86

  • NF C93-610, NF EN 60689 (05/2014)

    Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    5/23/2014 - PDF - French - AFNOR
    Learn More
    €86.53

  • NF C93-621-9, NF EN 60444-9 (05/2014)

    Measurement of quartz crystal unit parameters - Part 9 : measurement of spurious resonances of piezoelectric crystal units
    5/2/2014 - PDF - French - AFNOR
    Learn More
    €73.94

  • IEC 61837-2 Edition 2.1 (2014-03)

    IEC 61837-2:2011+AMD1:2014 consolidated version Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures
    3/14/2014 - PDF - English, French - CEI
    Learn More
    €440.00

  • IEC 61837-2 AMD 1 (2014-03)

    IEC 61837-2:2011/AMD1:2014 Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    3/14/2014 - PDF - English, French - CEI
    Learn More
    €11.00

  • IEC 62761 (2014-02)

    IEC 62761:2014 Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
    2/19/2014 - PDF - English, French - CEI
    Learn More
    €154.00

  • DIN EN 60444-6:2014-02

    Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:2013); German version EN 60444-6:2013
    2/1/2014 - PDF - German - DIN
    Learn More
    €103.00

  • NF C93-621-6, NF EN 60444-6 (02/2014)

    Measurement of quartz crystal unit parameters - Part 6 : measurement of drive level dependence (DLD)
    2/1/2014 - PDF - French - AFNOR
    Learn More
    €86.53

  • DIN EN 60679-3:2014-01

    Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 60679-3:2012); German version EN 60679-3:2013
    1/1/2014 - PDF - German - DIN
    Learn More
    €108.80

  • NF C93-640-100, NF EN 168100 (11/2013)

    Sectional specification : quartz crystal units (Capability Approval)
    11/9/2013 - PDF - French - AFNOR
    Learn More
    €97.45

  • NF C93-640-200, NF EN 168200 (11/2013)

    Sectionnal specification : quartz crystal units (Qualification approval)
    11/9/2013 - PDF - French - AFNOR
    Learn More
    €86.53

  • NF C93-640-100, NF EN 168100 (11/2013)

    Sectional specification : quartz crystal units (Capability Approval)
    11/9/2013 - PDF - English - AFNOR
    Learn More
    €97.45

  • NF C93-640-200, NF EN 168200 (11/2013)

    Sectionnal specification : quartz crystal units (Qualification approval)
    11/9/2013 - PDF - English - AFNOR
    Learn More
    €86.53

  • NF C93-620-3, NF EN 60679-3 (11/2013)

    Quartz crystal controlled oscillators of assessed quality - Part 3 : standard outlines and lead connections
    11/2/2013 - PDF - French - AFNOR
    Learn More
    €86.53

  • UNE-EN 60444-6:2013

    Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (Endorsed by AENOR in November of 2013.)
    11/1/2013 - PDF - English - AENOR
    Learn More
    €71.00

  • BS EN 60444-6:2013

    Measurement of quartz crystal unit parameters. Measurement of drive level dependence (DLD)
    10/31/2013 - Paper - English - BSI
    Learn More
    €193.80

  • UNE-EN 60679-3:2013

    Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (Endorsed by AENOR in August of 2013.)
    8/1/2013 - PDF - English - AENOR
    Learn More
    €75.00

  • BS EN 60679-3:2013

    Quartz crystal controlled oscillators of assessed quality. Standard outlines and lead connections
    7/31/2013 - Paper - English - BSI
    Learn More
    €193.80

  • IEC 60444-6 (2013-06)

    IEC 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
    6/19/2013 - PDF - English, French - CEI
    Learn More
    €110.00

  • IEC 60368-1 Edition 4.1 (2013-05)

    IEC 60368-1:2000+AMD1:2004 consolidated version Piezoelectric filters of assessed quality - Part 1: Genericspecification
    5/28/2013 - PDF - English, French - CEI
    Learn More
    €330.00

  • NF C93-620-1, NF EN 60679-1 (05/2013)

    Quartz crystal controlled oscillators of assessed quality - Part 1 : generic specification
    5/24/2013 - PDF - French - AFNOR
    Learn More
    €153.30

  • NF C93-632, NF EN 60758 (05/2013)

    Synthetic quartz crystal - Specifications and guidelines for use
    5/24/2013 - PDF - French - AFNOR
    Learn More
    €128.70

  • DIN EN 62575-2:2013-05

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use (IEC 62575-2:2012); German version EN 62575-2:2012
    5/1/2013 - PDF - German - DIN
    Learn More
    €103.00

  • NF C93-616, NF EN 62276 (03/2013)

    Single Crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    3/13/2013 - PDF - French - AFNOR
    Learn More
    €106.80

  • UNE-EN 62276:2013

    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by AENOR in March of 2013.)
    3/1/2013 - PDF - English - AENOR
    Learn More
    €86.00

  • NF C93-628-1, NF EN 61837-1 (02/2013)

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1 : plastic moulded enclosure outlines
    2/9/2013 - PDF - French - AFNOR
    Learn More
    €86.53

  • NF C93-604-2, NF EN 62604-2 (01/2013)

    Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2 : guidelines for the use
    1/12/2013 - PDF - French - AFNOR
    Learn More
    €86.53

  • NF C93-617-2, NF EN 62575-2 (01/2013)

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2 : guidelines for the use
    1/12/2013 - PDF - French - AFNOR
    Learn More
    €86.53

  • IEC 60679-3 (2012-12)

    IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
    12/14/2012 - PDF - English, French - CEI
    Learn More
    €154.00

  • NF C93-628-2, NF EN 61837-2 (12/2012)

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2 : ceramic enclosures
    12/1/2012 - PDF - French - AFNOR
    Learn More
    €153.30

  • NF C93-614, NF EN 61240 (12/2012)

    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
    12/1/2012 - PDF - French - AFNOR
    Learn More
    €73.94

  • NF C93-631-2, NF EN 60862-2 (11/2012)

    Surface acoustic wave (SAW) filters of assessed quality - Part 2 : guidelines for the use
    11/1/2012 - PDF - French - AFNOR
    Learn More
    €142.39

  • UNE-EN 62575-2:2012

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use (Endorsed by AENOR in November of 2012.)
    11/1/2012 - PDF - English - AENOR
    Learn More
    €74.00

  • UNE-EN 61240:2012

    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (Endorsed by AENOR in November of 2012.)
    11/1/2012 - PDF - English - AENOR
    Learn More
    €71.00

  • BS EN 62575-2:2012

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality. Guidelines for the use
    10/31/2012 - Paper - English - BSI
    Learn More
    €193.80

  • UNE-EN 61837-1:2012

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines (Endorsed by AENOR in October of 2012.)
    10/1/2012 - PDF - English - AENOR
    Learn More
    €74.00

  • BS EN 61837-1:2012

    Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Plastic moulded enclosure outlines
    9/30/2012 - Paper - English - BSI
    Learn More
    €193.80

  • UNE-EN 60862-2:2012

    Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use (Endorsed by AENOR in September of 2012.)
    9/1/2012 - PDF - English - AENOR
    Learn More
    €108.00

  • DIN EN 62604-2:2012-08

    Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (IEC 62604-2:2011); German version EN 62604-2:2012
    8/1/2012 - PDF - German - DIN
    Learn More
    €108.80

  • IEC 62575-2 (2012-07)

    IEC 62575-2:2012 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
    7/25/2012 - PDF - English, French - CEI
    Learn More
    €154.00

  • IEC 60862-2 (2012-05)

    IEC 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
    5/7/2012 - PDF - English, French - CEI
    Learn More
    €330.00

  • DIN IEC/TS 61994-4-2 DIN SPEC 41994-4-2:2012-05

    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics (IEC/TS 61994-4-2:2011)
    5/1/2012 - PDF - German - DIN
    Learn More
    €32.60

  • IEC 61837-1 (2012-04)

    IEC 61837-1:2012 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
    4/20/2012 - PDF - English, French - CEI
    Learn More
    €154.00

  • DIN IEC/TS 61994-2 DIN SPEC 41994-2:2012-04

    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters (IEC/TS 61994-2:2011)
    4/1/2012 - PDF - German - DIN
    Learn More
    €60.30

  • DIN IEC/TS 61994-3 DIN SPEC 41994-3:2012-04

    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators (IEC/TS 61994-3:2011)
    4/1/2012 - PDF - German - DIN
    Learn More
    €49.40

  • UNE-EN 62604-2:2012

    Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (Endorsed by AENOR in April of 2012.)
    4/1/2012 - PDF - English - AENOR
    Learn More
    €71.00

  • DIN EN 60679-6:2011-12

    Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011); German version EN 60679-6:2011
    12/1/2011 - PDF - German - DIN
    Learn More
    €103.00

  • NF C96-050-7, NF EN 62047-7 (12/2011)

    Semiconductor devices - Micro-electromechanical devices - Part 7 : MEMS BAW filter and duplexer for radio frequency control and selection
    12/1/2011 - PDF - French - AFNOR
    Learn More
    €97.45

  • DIN IEC/TS 61994-4-4 DIN SPEC 41994-4-4:2011-11

    Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices (IEC/TS 61994-4-4:2010)
    11/1/2011 - PDF - German - DIN
    Learn More
    €60.30

  • DD IEC/TS 61994-1:2007

    Piezoelectric and dielectric devices for frequency control and selection. Glossary. Piezoelectric and dielectric resonators
    10/31/2011 - Paper - English - BSI
    Learn More
    €193.80

  • NF C93-620-6, NF EN 60679-6 (10/2011)

    Quartz crystal controlled oscillators of assessed quality - Part 6 : phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
    10/1/2011 - PDF - French - AFNOR
    Learn More
    €86.53

  • UNE-EN 61837-2:2011

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (Endorsed by AENOR in October of 2011.)
    10/1/2011 - PDF - English - AENOR
    Learn More
    €131.00

  • UNE-EN 60679-6:2011

    Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (Endorsed by AENOR in September of 2011.)
    9/1/2011 - PDF - English - AENOR
    Learn More
    €71.00

  • DD IEC/TS 61994-3:2011

    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric and dielectric oscillators
    8/31/2011 - Paper - English - BSI
    Learn More
    €139.08

  • DIN EN 60122-3:2011-08

    Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections (IEC 60122-3:2010); German version EN 60122-3:2010
    8/1/2011 - PDF - German - DIN
    Learn More
    €108.80

  • BS EN 61837-2:2011+A1:2014

    Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Ceramic enclosures
    7/31/2011 - Paper - English - BSI
    Learn More
    €289.56

  • DD IEC/TS 61994-2:2011

    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric and dielectric filters
    7/31/2011 - Paper - English - BSI
    Learn More
    €193.80

  • IEC/TS 61994-3 (2011-07)

    IEC TS 61994-3:2011 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators
    7/26/2011 - PDF - English - CEI
    Learn More
    €77.00

  • DIN EN 62643-1:2011-07

    Electrostatic Micro Electro Mechanical Systems (MEMS) Oscillators of assessed quality - Part 1: Generic specification (IEC 49/939/CD:2011)
    7/1/2011 - PDF - English, German - DIN
    Learn More
    €242.60

  • BS EN 60679-6:2011

    Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
    6/30/2011 - Paper - English - BSI
    Learn More
    €193.80

  • IEC/TS 61994-2 (2011-06)

    IEC TS 61994-2:2011 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters
    6/17/2011 - PDF - English, French - CEI
    Learn More
    €110.00

  • DIN EN 60444-11:2011-06

    Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction (IEC 60444-11:2010); German version EN 60444-11:2010
    6/1/2011 - PDF - German - DIN
    Learn More
    €89.00

  • IEC 61837-2 (2011-05)

    IEC 61837-2:2011 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    5/27/2011 - PDF - English, French - CEI
    Learn More
    €330.00

  • DD IEC/TS 61994-4-2:2011

    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric and dielectric materials. Piezoelectric ceramics
    4/30/2011 - Paper - English - BSI
    Learn More
    €116.28

  • NF C93-629-3, NF EN 60368-3 (04/2011)

    Piezoelectric filters of assessed quality - Part 3 : standard outlines and lead connections
    4/1/2011 - PDF - French - AFNOR
    Learn More
    €73.94

  • NF C93-618-3, NF EN 60122-3 (04/2011)

    Quartz crystal units of assessed quality - Part 3 : standard outlines and lead connections
    4/1/2011 - PDF - French - AFNOR
    Learn More
    €86.53

  • UNE-EN 60122-3:2010

    Quartz crystal units of assessed quality -- Part 3: Standard outlines and lead connections (Endorsed by AENOR in April of 2011.)
    4/1/2011 - PDF - English - AENOR
    Learn More
    €75.00

  • IEC/TS 61994-4-2 (2011-03)

    IEC TS 61994-4-2:2011 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics
    3/8/2011 - PDF - English, French - CEI
    Learn More
    €22.00

  • NF C93-621-11, NF EN 60444-11 (03/2011)

    Measurement of quartz crystal unit parameters - Part 11 : standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
    3/1/2011 - PDF - French - AFNOR
    Learn More
    €73.94

  • UNE-EN 60368-3:2010

    Piezoelectric filters of assessed quality -- Part 3: Standard outlines and lead connections (Endorsed by AENOR in March of 2011.)
    3/1/2011 - PDF - English - AENOR
    Learn More
    €68.00

  • BS EN 60368-3:2010

    Piezoelectric filters of assessed quality. Standard outlines and lead connections
    2/28/2011 - Paper - English - BSI
    Learn More
    €139.08

  • BS EN 60122-3:2010

    Quartz crystal units of assessed quality. Standard outlines and lead connections
    2/28/2011 - Paper - English - BSI
    Learn More
    €193.80

  • UNE-EN 60444-11:2010

    Measurement of quartz crystal unit parameters -- Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction (Endorsed by AENOR in February of 2011.)
    2/1/2011 - PDF - English - AENOR
    Learn More
    €65.00

  • IEEE 1549:2011

    Microwave filter definitions
    1/1/2011 - PDF sécurisé - English - IEEE
    Learn More
    €67.15

  • BS EN 60444-11:2010

    Measurement of quartz crystal unit parameters. Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
    12/31/2010 - Paper - English - BSI
    Learn More
    €139.08

  • IEC 60368-3 (2010-11)

    IEC 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
    11/25/2010 - PDF - English, French - CEI
    Learn More
    €77.00

  • IEC 60122-3 (2010-10)

    IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
    10/11/2010 - PDF - English, French - CEI
    Learn More
    €154.00

  • IEC 60444-11 (2010-10)

    IEC 60444-11:2010 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
    10/7/2010 - PDF - English, French - CEI
    Learn More
    €77.00

  • DD IEC/TS 61994-4-4:2010

    Piezoelectric and dielectric devices for frequency control and selection. Glossary. Materials Materials for surface acoustic wave (SAW) devices
    7/31/2010 - Paper - English - BSI
    Learn More
    €139.08

  • IEC/TS 61994-4-4 (2010-06)

    IEC TS 61994-4-4:2010 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices
    6/24/2010 - PDF - English - CEI
    Learn More
    €77.00

  • BS EN 61029-1:2009+A11:2010

    Safety of transportable motor-operated electric tools. General requirements
    2/28/2010 - Paper - English - BSI
    Learn More
    €289.56

  • DIN EN 60689:2009-08

    Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values (IEC 60689:2008); German version EN 60689:2009
    8/1/2009 - PDF - German - DIN
    Learn More
    €103.00

  • DIN IEC 60050-561:2009-06

    International Electrotechnical Vocabulary - Chapter 561: Piezoelectric and dielectric devices for frequency control and selection (IEC 49/851/CD:2009)
    6/1/2009 - PDF - English, German - DIN
    Learn More
    €163.80

  • UNE-EN 60689:2009

    Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values (Endorsed by AENOR in June of 2009.)
    6/1/2009 - PDF - English - AENOR
    Learn More
    €71.00

  • BS EN 60689:2009

    Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    4/30/2009 - Paper - English - BSI
    Learn More
    €193.80

  • UNE-EN 60758:2009

    Synthetic quartz crystal - Specifications and guidelines for use (Endorsed by AENOR in March of 2009.)
    3/1/2009 - PDF - English - AENOR
    Learn More
    €96.00

  • IEC 60689 (2008-11)

    IEC 60689:2008 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    11/27/2008 - PDF - English - CEI
    Learn More
    €110.00

  • IEC 60689 (2008-11)

    IEC 60689:2008 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    11/27/2008 - PDF - English, French - CEI
    Learn More
    €110.00

  • DD IEC/TS 61994-4-1:2007

    Piezoelectric and dielectric devices for frequency control and selection. Glossary. Piezoelectric materials. Synthetic quartz crystal
    5/30/2008 - Paper - English - BSI
    Learn More
    €116.28

  • DD IEC/TS 61994-4-3:2008

    Piezoelectric and dielectric devices for frequency control and selection. Glossary. Materials. Materials for dielectric devices
    5/30/2008 - Paper - English - BSI
    Learn More
    €116.28

  • JIS C 6703:2008

    Crystal filters
    3/20/2008 - PDF - Japanese - JSA
    Learn More
    €41.86

  • IEC/TS 61994-4-3 (2008-02)

    IEC TS 61994-4-3:2008 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices
    2/22/2008 - PDF - English - CEI
    Learn More
    €22.00

  • DIN EN 60444-9:2007-12

    Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007
    12/1/2007 - PDF - German - DIN
    Learn More
    €82.60

  • UNE-EN 60679-1:2007

    Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification (IEC 60679-1:2007). (Endorsed by AENOR in September of 2007.)
    9/1/2007 - PDF - English - AENOR
    Learn More
    €131.00

  • IEC/TS 61994-1 (2007-08)

    IEC TS 61994-1:2007 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
    8/30/2007 - PDF - English - CEI
    Learn More
    €154.00

  • IEC/TS 61994-4-1 (2007-08)

    IEC TS 61994-4-1:2007 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
    8/29/2007 - PDF - English - CEI
    Learn More
    €44.00

  • JIS C 6701:2007

    Generic specification of quartz crystal units
    8/20/2007 - PDF - Japanese - JSA
    Learn More
    €46.02

  • JIS C 6710:2007

    Generic specification of crystal controlled oscillators
    8/20/2007 - PDF - Japanese - JSA
    Learn More
    €55.77

  • UNE-EN 60444-9:2007

    Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007). (Endorsed by AENOR in August of 2007.)
    8/1/2007 - PDF - English - AENOR
    Learn More
    €67.00

  • BS EN 60444-9:2007

    Measurement of quartz crystal unit parameters. Measurement of spurious resonances of piezoelectric crystal units
    5/31/2007 - Paper - English - BSI
    Learn More
    €139.08

  • IEC 60444-9 (2007-02)

    IEC 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
    2/20/2007 - PDF - English - CEI
    Learn More
    €77.00

  • JIS R 1641:2007

    Measurement method for dielectric of fine ceramic plates at microwave frequency
    2/20/2007 - PDF - Japanese - JSA
    Learn More
    €41.86

  • IEC 60444-9 (2007-02)

    IEC 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
    2/20/2007 - PDF - English, French - CEI
    Learn More
    €77.00

  • UNE-EN 61337-1:2004

    Filters using waveguide type dielectric resonators -- Part 1: Generic specification (IEC 61337-1:2004). (Endorsed by AENOR in September of 2006.)
    9/1/2006 - PDF - English - AENOR
    Learn More
    €75.00

  • DIN EN 61338-1-4:2006-06

    Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency (IEC 61338-1-4:2005); German version EN 61338-1-4:2006
    6/1/2006 - PDF - German - DIN
    Learn More
    €108.80

  • DIN IEC 61994-1:2006-06

    Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators (IEC 49/755/CD:2006)
    6/1/2006 - PDF - English, German - DIN
    Learn More
    €96.00

  • NF C96-627-1-4, NF EN 61338-1-4 (04/2006)

    Waveguide type dielectric resonators - Part 1-4 : general information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimeter-wave frequency
    4/1/2006 - PDF - French - AFNOR
    Learn More
    €97.45

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