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31.080 : Semiconductor devices

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  • IEC 62830-6 (2019-07)

    IEC 62830-6:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
    7/25/2019 - PDF - English - CEI
    Learn More
    €142.00

  • PR NF EN IEC 62435-7, C96-435-7PR (07/2019)


    7/1/2019 - Paper - French - AFNOR
    Learn More
    €71.80

  • IEC 60749-20-1 Redline version (2019-06)

    IEC 60749-20-1:2019 RLV Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
    6/26/2019 - PDF - English - CEI
    Learn More
    €317.00

  • IEC 60749-20-1 (2019-06)

    IEC 60749-20-1:2019 Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
    6/26/2019 - PDF - English, French - CEI
    Learn More
    €244.00

  • IEC 60747-16-6 (2019-06)

    IEC 60747-16-6:2019 Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
    6/26/2019 - PDF - English, French - CEI
    Learn More
    €142.00

  • BS IEC 60747-18-1:2019


    6/7/2019 - PDF - English - BSI
    Learn More
    €202.40

  • PR NF EN IEC 60749-18, C96-022-18PR (06/2019)


    6/1/2019 - Paper - French - AFNOR
    Learn More
    €87.16

  • IEC 60747-18-1 (2019-05)

    IEC 60747-18-1:2019 Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
    5/20/2019 - PDF - English - CEI
    Learn More
    €173.00

  • BS IEC 62951-6:2019


    5/15/2019 - PDF - English - BSI
    Learn More
    €202.40

  • BS IEC 63068-1:2019


    5/10/2019 - PDF - English - BSI
    Learn More
    €202.40

  • IEC 63150-1 (2019-05)

    IEC 63150-1:2019 Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
    5/10/2019 - PDF - English, French - CEI
    Learn More
    €203.00

  • IEC 62951-6 (2019-05)

    IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
    5/6/2019 - PDF - English, French - CEI
    Learn More
    €142.00

  • €112.96

  • PR NF EN 120004, C93-120-004PR (05/2019)


    5/1/2019 - Paper - French - AFNOR
    Learn More
    €54.48

  • NF EN IEC 60749-17, C96-022-17 (05/2019)


    5/1/2019 - Paper - French - AFNOR
    Learn More
    €63.42

  • PR NF EN 120003, C93-120-003PR (05/2019)


    5/1/2019 - Paper - French - AFNOR
    Learn More
    €54.48

  • BS IEC 62951-2:2019


    4/30/2019 - PDF - English - BSI
    Learn More
    €121.90

  • BS IEC 62047-36:2019


    4/24/2019 - PDF - English - BSI
    Learn More
    €144.90

  • BS IEC 62047-33:2019


    4/18/2019 - PDF - English - BSI
    Learn More
    €202.40

  • BS IEC 62047-31:2019


    4/17/2019 - PDF - English - BSI
    Learn More
    €144.90

  • IEC 62951-2 (2019-04)

    IEC 62951-2:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
    4/17/2019 - PDF - English, French - CEI
    Learn More
    €41.00

  • BS EN 62612:2013+A2:2018


    4/16/2019 - PDF - English - BSI
    Learn More
    €282.90

  • BS IEC 62047-34:2019


    4/16/2019 - PDF - English - BSI
    Learn More
    €144.90

  • IEC 60749-18 Redline version (2019-04)

    IEC 60749-18:2019 RLV Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
    4/10/2019 - PDF - English - CEI
    Learn More
    €185.00

  • IEC 60749-18 (2019-04)

    IEC 60749-18:2019 Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
    4/10/2019 - PDF - English, French - CEI
    Learn More
    €142.00

  • IEC 62047-31 (2019-04)

    IEC 62047-31:2019 Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials
    4/5/2019 - PDF - English - CEI
    Learn More
    €71.00

  • IEC 62047-33 (2019-04)

    IEC 62047-33:2019 Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
    4/5/2019 - PDF - English - CEI
    Learn More
    €142.00

  • IEC 62047-34 (2019-04)

    IEC 62047-34:2019 Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
    4/5/2019 - PDF - English - CEI
    Learn More
    €71.00

  • IEC 62047-36 (2019-04)

    IEC 62047-36:2019 Semiconductor devices – Micro-electromechanical devices – Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
    4/5/2019 - PDF - English - CEI
    Learn More
    €71.00

  • IEC 60749-17 (2019-03)

    IEC 60749-17:2019 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
    3/28/2019 - PDF - English, French - CEI
    Learn More
    €41.00

  • BS IEC 62951-7:2019


    3/6/2019 - PDF - English - BSI
    Learn More
    €144.90

  • BS IEC 62951-5:2019


    3/5/2019 - PDF - English - BSI
    Learn More
    €144.90

  • BS IEC 62951-4:2019


    3/5/2019 - PDF - English - BSI
    Learn More
    €144.90

  • BS IEC 62830-4:2019


    3/5/2019 - PDF - English - BSI
    Learn More
    €236.90

  • PR NF EN 62047-35, C96-050-35PR (03/2019)


    3/1/2019 - Paper - French - AFNOR
    Learn More
    €54.48

  • IEC 62830-4 (2019-02)

    IEC 62830-4:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
    2/27/2019 - PDF - English, French - CEI
    Learn More
    €203.00

  • IEC 62951-4 (2019-02)

    IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
    2/27/2019 - PDF - English, French - CEI
    Learn More
    €71.00

  • IEC 62951-5 (2019-02)

    IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
    2/27/2019 - PDF - English, French - CEI
    Learn More
    €102.00

  • IEC 62951-7 (2019-02)

    IEC 62951-7:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
    2/27/2019 - PDF - English, French - CEI
    Learn More
    €71.00

  • SAE ARP 6338A:2019-02-08

    Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits
    2/8/2019 - PDF - English - SAE
    Learn More
    €73.00

  • BS IEC 63068-2:2019


    2/8/2019 - PDF - English - BSI
    Learn More
    €202.40

  • IEC 63068-1 (2019-01)

    IEC 63068-1:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
    1/30/2019 - PDF - English - CEI
    Learn More
    €142.00

  • IEC 63068-2 (2019-01)

    IEC 63068-2:2019 Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
    1/30/2019 - PDF - English - CEI
    Learn More
    €142.00

  • BS IEC 62047-32:2019


    1/29/2019 - PDF - English - BSI
    Learn More
    €144.90

  • IEC 62047-32 (2019-01)

    IEC 62047-32:2019 Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
    1/24/2019 - PDF - English, French - CEI
    Learn More
    €102.00

  • 19/30364443 DC


    1/4/2019 - PDF - English - BSI
    Learn More
    €23.00

  • ESDA/JEDEC JS-002:2018

    ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level
    1/1/2019 - PDF - English - JEDEC
    Learn More
    €178.64

  • IEC 60050-521 AMD 2 (2018-12)

    IEC 60050-521:2002/AMD2:2018 Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
    12/6/2018 - PDF - English, French - CEI
    Learn More
    €10.00

  • IEC 60050-523 (2018-12)

    IEC 60050-523:2018 International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices
    12/6/2018 - PDF - English, French - CEI
    Learn More
    €142.00

  • DIN EN IEC 62969-3 VDE 0884-69-3:2018-12

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (IEC 62969-3:2018); German version EN IEC 62969-3:2018
    12/1/2018 - Paper - German - VDE
    Learn More
    €74.10

  • BS IEC 62951-3:2018


    11/15/2018 - PDF - English - BSI
    Learn More
    €202.40

  • IEC 62951-3 (2018-11)

    IEC 62951-3:2018 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
    11/7/2018 - PDF - English - CEI
    Learn More
    €142.00

  • DIN EN IEC 60749-20-1:2018-11

    Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 47/2488/CDV:2018); German and English version prEN IEC 60749-20-1:2018
    11/1/2018 - PDF - English, German - DIN
    Learn More
    €147.20

  • 18/30336115 DC


    10/23/2018 - PDF - English - BSI
    Learn More
    €23.00

  • DIN EN IEC 60749-26 VDE 0884-749-26:2018-10

    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018
    10/1/2018 - Paper - German - VDE
    Learn More
    €121.28

  • DIN EN IEC 60749-13:2018-10

    Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018); German version EN IEC 60749-13:2018
    10/1/2018 - PDF - German - DIN
    Learn More
    €89.00

  • DIN EN 60749-18:2018-10

    Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 47/2468/CDV:2018); German and English version prEN 60749-18:2018
    10/1/2018 - PDF - English, German - DIN
    Learn More
    €108.80

  • NF EN IEC 62435-6, C96-435-6 (10/2018)

    Electronic components - Long-term storage of electronic semiconductor devices - Part 6 : packaged or finished devices - Stockage de longue durée des composants électroniques - Partie 6: Dispositifs encapsulés ou finis
    10/1/2018 - Paper - French - AFNOR
    Learn More
    €77.83

  • UNE-EN IEC 62969-4:2018

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in October of 2018.)
    10/1/2018 - PDF - English - AENOR
    Learn More
    €68.00

  • DIN EN IEC 62969-2 VDE 0884-69-2:2018-09

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (IEC 62969-2:2018); German version EN IEC 62969-2:2018
    9/1/2018 - Paper - German - VDE
    Learn More
    €42.45

  • BS EN IEC 62969-4:2018

    Semiconductor devices. Semiconductor interface for automotive vehicles. Evaluation method of data interface for automotive vehicle sensors
    8/30/2018 - PDF - English - BSI
    Learn More
    €202.40

  • DIN EN IEC 62969-1 VDE 0884-69-1:2018-08

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors (IEC 62969-1:2017); German version EN IEC 62969-1:2018
    8/1/2018 - Paper - German - VDE
    Learn More
    €65.60

  • NF EN IEC 62435-4, C96-435-4 (08/2018)


    8/1/2018 - Paper - French - AFNOR
    Learn More
    €91.08

  • NF EN IEC 62969-4, C96-069-4 (08/2018)

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4 : evaluation method of data interface for automotive vehicle sensors - Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 4: Méthode d'évaluation de l'interface de données destinée aux capteurs de véhicules automobiles
    8/1/2018 - Paper - French - AFNOR
    Learn More
    €77.83

  • UNE-EN IEC 62969-3:2018

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in August of 2018.)
    8/1/2018 - PDF - English - AENOR
    Learn More
    €71.00

  • BS IEC 60747-4:2007+A1:2017


    7/31/2018 - PDF - English - BSI
    Learn More
    €363.40

  • 18/30355458 DC


    7/30/2018 - PDF - English - BSI
    Learn More
    €23.00

  • DIN EN 60749-17 VDE 0884-749-17:2018-07

    Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 47/2465/CDV:2018); German and English version prEN 60749-17:2018
    7/1/2018 - Paper - German - VDE
    Learn More
    €18.19

  • DIN EN IEC 60749-12:2018-07

    Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2017); German version EN IEC 60749-12:2018
    7/1/2018 - PDF - German - DIN
    Learn More
    €54.80

  • BS EN IEC 62969-3:2018

    Semiconductor devices. Semiconductor interface for automotive vehicles. Shock driven piezoelectric energy harvesting for automotive vehicle sensors
    6/28/2018 - PDF - English - BSI
    Learn More
    €202.40

  • 18/30362458 DC


    6/22/2018 - PDF - English - BSI
    Learn More
    €23.00

  • IEC 62969-4 (2018-06)

    IEC 62969-4:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
    6/18/2018 - PDF - English, French - CEI
    Learn More
    €102.00

  • NF EN IEC 62969-3, C96-069-3 (06/2018)

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3 : shock driven piezoelectric energy harvesting for automotive vehicle sensors - Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 3 : Récupération de l'énergie piézoélectrique produite par les chocs pour les capteurs de véhicules automobiles
    6/1/2018 - Paper - French - AFNOR
    Learn More
    €91.08

  • UNE-EN IEC 62969-2:2018

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (Endorsed by Asociación Española de Normalización in June of 2018.)
    6/1/2018 - PDF - English - AENOR
    Learn More
    €62.00

  • UNE-EN 60191-4:2014/A1:2018

    Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (Endorsed by Asociación Española de Normalización in June of 2018.)
    6/1/2018 - PDF - English - AENOR
    Learn More
    €63.00

  • BS EN 60191-4:2014+A1:2018


    5/30/2018 - PDF - English - BSI
    Learn More
    €236.90

  • NF C96-013-4/A1, NF EN 60191-4/A1 (05/2018)

    Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages
    5/18/2018 - PDF - English - UTE
    Learn More
    €77.83

  • 18/30361905 DC


    5/15/2018 - PDF - English - BSI
    Learn More
    €23.00

  • IEC 62969-3 (2018-05)

    IEC 62969-3:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors
    5/7/2018 - PDF - English, French - CEI
    Learn More
    €142.00

  • NF C71-504/A1, NF EN 62504/A1 (05/2018)

    General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions
    5/4/2018 - PDF - English - UTE
    Learn More
    €35.75

  • BS IEC 62951-1:2017

    Semiconductor devices. Flexible and stretchable semiconductor devices. Bending test method for conductive thin films on flexible substrates
    5/4/2018 - PDF - English - BSI
    Learn More
    €144.90

  • BS EN IEC 62969-2:2018

    Semiconductor devices. Semiconductor interface for automotive vehicles. Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors
    5/2/2018 - PDF - English - BSI
    Learn More
    €144.90

  • NF EN 60191-4/A1, C96-013-4/A1 (05/2018)

    Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages - Normalisation mécanique des dispositifs à semiconducteurs - Partie 4 : Système de codification et classification en formes des structures des boîtiers pour dispositifs à semiconducteurs
    5/1/2018 - Paper - French - AFNOR
    Learn More
    €77.83

  • DIN EN 60749-43:2018-05

    Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017); German version EN 60749-43:2017
    5/1/2018 - PDF - German - DIN
    Learn More
    €125.30

  • UNE-EN IEC 60749-13:2018

    Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
    5/1/2018 - PDF - English - AENOR
    Learn More
    €63.00

  • UNE-EN IEC 60749-26:2018

    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by Asociación Española de Normalización in May of 2018.)
    5/1/2018 - PDF - English - AENOR
    Learn More
    €90.00

  • UNE-EN IEC 60191-1:2018

    Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices (Endorsed by Asociación Española de Normalización in May of 2018.)
    5/1/2018 - PDF - English - AENOR
    Learn More
    €76.00

  • BS IEC 60191-2:1966+A20:2018


    5/1/2018 - PDF - English - BSI
    Learn More
    €575.00

  • NF EN 62504/A1, C71-504/A1 (05/2018)

    General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions - Eclairage général - Produits à diode électroluminescente (LED) et équipements associés - Termes et définitions
    5/1/2018 - Paper - French - AFNOR
    Learn More
    €35.75

  • BS EN IEC 60191-1:2018

    Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of discrete devices
    4/30/2018 - PDF - English - BSI
    Learn More
    €236.90

  • BS EN IEC 60749-13:2018

    Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere
    4/30/2018 - PDF - English - BSI
    Learn More
    €144.90

  • BS EN IEC 60749-26:2018


    4/30/2018 - PDF - English - BSI
    Learn More
    €282.90

  • 18/30355802 DC


    4/30/2018 - PDF - English - BSI
    Learn More
    €23.00

  • PR NF C96-271-1, PR NF EN 63011-1 (04/2018)

    Integrated circuits - Three dimensional integrated circuits - Part 1: General conditions and definitions
    4/27/2018 - Paper - French - AFNOR
    Learn More
    €44.39

  • PR NF C96-271-2, PR NF EN 63011-2 (04/2018)

    Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect
    4/27/2018 - Paper - French - AFNOR
    Learn More
    €44.39

  • NF C96-069-2, NF EN IEC 62969-2 (04/2018)

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2 : efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors
    4/27/2018 - PDF - English - UTE
    Learn More
    €63.42

  • BS EN IEC 60749-12:2018

    Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
    4/18/2018 - PDF - English - BSI
    Learn More
    €121.90

  • NF C96-022-13, NF EN IEC 60749-13 (04/2018)

    Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere
    4/13/2018 - PDF - English - UTE
    Learn More
    €77.83

  • PR NF C96-014-1, PR NF EN 63150-1 (04/2018)

    Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
    4/13/2018 - Paper - French - AFNOR
    Learn More
    €71.80

  • IEC 60191-2 AMD 20 (2018-04)

    IEC 60191-2:1966/AMD20:2018 Amendment 20 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
    4/12/2018 - PDF - English - CEI
    Learn More
    €71.00

  • 18/30355426 DC


    4/10/2018 - PDF - English - BSI
    Learn More
    €23.00

  • 18/30350443 DC


    4/10/2018 - PDF - English - BSI
    Learn More
    €23.00

  • BS EN 60747-16-1:2002+A2:2017


    4/10/2018 - PDF - English - BSI
    Learn More
    €303.60

  • NF EN IEC 60749-13, C96-022-13 (04/2018)

    Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 13 : Atmosphère saline
    4/1/2018 - Paper - French - AFNOR
    Learn More
    €77.83

  • UNE-EN IEC 60749-12:2018

    Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
    4/1/2018 - PDF - English - AENOR
    Learn More
    €42.00

  • PR NF EN 62031, C71-250PR (04/2018)

    IEC 62031 Ed. 2: LED modules for general lighting - Safety specifications - IEC 62031 Ed. 2: Modules à LED pour éclairage général - Spécifications de sécurité
    4/1/2018 - Paper - French - AFNOR
    Learn More
    €63.76

  • DIN EN 60747-16-4:2018-04

    Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004 + A1:2009 + A2:2017); German version EN 60747-16-4:2004 + A1:2011 + A2:2017
    4/1/2018 - PDF - German - DIN
    Learn More
    €114.10

  • DIN EN 60747-16-3:2018-04

    Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009 + A2:2017); German version EN 60747-16-3:2002 + A1:2009 + A2:2017
    4/1/2018 - PDF - German - DIN
    Learn More
    €141.90

  • NF EN IEC 62969-2, C96-069-2 (04/2018)

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2 : efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors - Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 2 : Méthodes d'évaluation du rendement de la transmission d'énergie sans fil par résonance pour les capteurs de véhicules automobiles
    4/1/2018 - Paper - French - AFNOR
    Learn More
    €63.42

  • IEC 60191-4 AMD 1 (2018-03)

    IEC 60191-4:2013/AMD1:2018 Amendment 1 - Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
    3/27/2018 - PDF - English, French - CEI
    Learn More
    €71.00

  • IEC 60191-4 Edition 3.1 (2018-03)

    IEC 60191-4:2013+AMD1:2018 consolidated version Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
    3/27/2018 - PDF - English, French - CEI
    Learn More
    €279.00

  • NF C96-022-26, NF EN IEC 60749-26 (03/2018)

    Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
    3/23/2018 - PDF - English - UTE
    Learn More
    €135.47

  • BS EN 60747-16-4:2004+A2:2017


    3/16/2018 - PDF - English - BSI
    Learn More
    €266.80

  • BS IEC 62047-29:2017

    Semiconductor devices. Micro-electromechanical devices. Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
    3/15/2018 - PDF - English - BSI
    Learn More
    €144.90

  • BS EN 61954:2011+A2:2017


    3/14/2018 - PDF - English - BSI
    Learn More
    €282.90

  • IEC 62031 Redline version (2018-03)

    IEC 62031:2018 RLV LED modules for general lighting - Safety specifications
    3/8/2018 - PDF - English - CEI
    Learn More
    €185.00

  • IEC 62031 (2018-03)

    IEC 62031:2018 LED modules for general lighting - Safety specifications
    3/8/2018 - PDF - English, French - CEI
    Learn More
    €142.00

  • IEC 62969-2 (2018-03)

    IEC 62969-2:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors
    3/8/2018 - PDF - English, French - CEI
    Learn More
    €41.00

  • NF EN IEC 60749-12, C96-022-12 (03/2018)

    Semiconductor devices - Mechanical and climatic test methods - Part 12 : vibration, variable frequency - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 12 : Vibrations, fréquences variables
    3/1/2018 - Paper - French - AFNOR
    Learn More
    €48.40

  • NF EN IEC 60749-26, C96-022-26 (03/2018)

    Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 26 : Essai de sensibilité aux décharges électrostatiques (DES) - Modèle du corps humain (HBM)
    3/1/2018 - Paper - French - AFNOR
    Learn More
    €135.47

  • ASTM F1190-18

    Standard Guide for Neutron Irradiation of Unbiased Electronic Components
    3/1/2018 - PDF - English - ASTM
    Learn More
    €43.00

  • ASTM F1190-18 + Redline

    Standard Guide for Neutron Irradiation of Unbiased Electronic Components
    3/1/2018 - PDF - English - ASTM
    Learn More
    €52.00

  • ASTM F1893-18

    Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
    3/1/2018 - PDF - English - ASTM
    Learn More
    €43.00

  • ASTM F1893-18 + Redline

    Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
    3/1/2018 - PDF - English - ASTM
    Learn More
    €52.00

  • UNE-EN IEC 62969-1:2018

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in March of 2018.)
    3/1/2018 - PDF - English - AENOR
    Learn More
    €63.00

  • BS EN 60747-16-3:2002+A2:2017


    2/23/2018 - PDF - English - BSI
    Learn More
    €282.90

  • BS EN IEC 62969-1:2018

    Semiconductor devices. Semiconductor interface for automotive vehicles. General requirements of power interface for automotive vehicle sensors
    2/22/2018 - PDF - English - BSI
    Learn More
    €144.90

  • NF C96-069-1, NF EN IEC 62969-1 (02/2018)

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1 : general requirements of power interface for automotive vehicle sensors
    2/16/2018 - PDF - English - UTE
    Learn More
    €91.08

  • IEC 60749-13 (2018-02)

    IEC 60749-13:2018 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
    2/15/2018 - PDF - English, French - CEI
    Learn More
    €71.00

  • 18/30363340 DC


    2/14/2018 - PDF - English - BSI
    Learn More
    €23.00

  • BS EN 60747-2:2016

    Semiconductor devices. Discrete devices. Rectifier diodes
    2/6/2018 - PDF - English - BSI
    Learn More
    €266.80

  • DIN EN 60749-28 VDE 0884-749-28:2018-02

    Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017); German version EN 60749-28:2017
    2/1/2018 - Paper - German - VDE
    Learn More
    €110.67

  • NF EN IEC 62969-1, C96-069-1 (02/2018)

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1 : general requirements of power interface for automotive vehicle sensors - Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 1 : Exigences générales de l'interface d'alimentation destinée aux capteurs des véhicules automobiles
    2/1/2018 - Paper - French - AFNOR
    Learn More
    €91.08

  • PD IEC/TR 63133:2017

    Semiconductor devices. Scan based ageing level estimation for semiconductor devices
    1/29/2018 - PDF - English - BSI
    Learn More
    €144.90

  • IEC 60191-1 (2018-01)

    IEC 60191-1:2018 Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
    1/23/2018 - PDF - English - CEI
    Learn More
    €203.00

  • IEC 60749-26 (2018-01)

    IEC 60749-26:2018 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
    1/15/2018 - PDF - English, French - CEI
    Learn More
    €274.00

  • DIN EN 60749-3:2018-01

    Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017
    1/1/2018 - PDF - German - DIN
    Learn More
    €82.60

  • DIN EN 60749-5:2018-01

    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017); German version EN 60749-5:2017
    1/1/2018 - PDF - German - DIN
    Learn More
    €75.40

  • ESD SP27.1:2018

    ESD Association Standard Practice for the Recommended Information Flow Regarding Potential EOS Issues between Automotive OEM, Tier 1, and Semiconductor Manufacturers
    1/1/2018 - PDF - English - ESD
    Learn More
    €133.65

  • EIA JESD 50C:2018

    Special Requirements for Maverick Product Elimination and Outlier Management
    1/1/2018 - PDF sécurisé - English - EIA
    Learn More
    €52.80

  • DIN EN 61954 VDE 0553-100:2018-01

    Static VAR compensators (SVC) - Testing of thyristor valves (IEC 61954:2011 + A1:2013 + A2:2017); German version EN 61954:2011 + A1:2013 + A2:2017
    1/1/2018 - Paper - German - VDE
    Learn More
    €110.67

  • UNE-EN 60747-16-3:2002/A2:2017

    Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (Endorsed by Asociación Española de Normalización in January of 2018.)
    1/1/2018 - PDF - English - AENOR
    Learn More
    €38.00

  • JIS C 8160:2017

    Non-integrated linear LED lamps with GX16t-5 cap for general lighting services
    12/20/2017 - PDF - Japanese - JSA
    Learn More
    €25.00

  • JIS C 8158:2017

    Self-ballasted LED-lamps for general lighting services by voltage > 50 V
    12/20/2017 - PDF - Japanese - JSA
    Learn More
    €36.27

  • IEC 60749-12 (2017-12)

    IEC 60749-12:2017 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
    12/13/2017 - PDF - English, French - CEI
    Learn More
    €20.00

  • IEC 62969-1 (2017-12)

    IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
    12/13/2017 - PDF - English - CEI
    Learn More
    €71.00

  • IEC 62969-1 (2017-12)

    IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
    12/13/2017 - PDF - English, French - CEI
    Learn More
    €71.00

  • UNE-EN 60747-16-4:2004/A2:2017

    Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (Endorsed by Asociación Española de Normalización in December of 2017.)
    12/1/2017 - PDF - English - AENOR
    Learn More
    €38.00

  • 17/30366375 DC


    11/30/2017 - PDF - English - BSI
    Learn More
    €23.00

  • BS EN 60749-4:2017

    Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)
    11/28/2017 - PDF - English - BSI
    Learn More
    €144.90

  • BS EN 60749-9:2017

    Semiconductor devices. Mechanical and climatic test methods. Permanence of marking
    11/27/2017 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60749-6:2017

    Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature
    11/24/2017 - PDF - English - BSI
    Learn More
    €121.90

  • BS EN 60749-3:2017

    Semiconductor devices. Mechanical and climatic test methods. External visual examination
    11/24/2017 - PDF - English - BSI
    Learn More
    €144.90

  • IEC 62047-29 (2017-11)

    IEC 62047-29:2017 Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
    11/22/2017 - PDF - English - CEI
    Learn More
    €71.00

  • DIN EN 60749-6:2017-11

    Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017
    11/1/2017 - PDF - German - DIN
    Learn More
    €61.70

  • DIN EN 60749-4:2017-11

    Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017); German version EN 60749-4:2017
    11/1/2017 - PDF - German - DIN
    Learn More
    €75.40

  • DIN EN 60749-9:2017-11

    Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2017); German version EN 60749-9:2017
    11/1/2017 - PDF - German - DIN
    Learn More
    €61.70

  • DIN EN 61975 VDE 0553-975:2017-11

    High-voltage direct current (HVDC) installations - System tests (IEC 61975:2010 + A1:2016); German version EN 61975:2010 + A1:2017
    11/1/2017 - Paper - German - VDE
    Learn More
    €160.33

  • JIS C 5630-26:2017

    Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
    10/20/2017 - PDF - Japanese - JSA
    Learn More
    €36.27

  • IEC/TR 63133 (2017-10)

    IEC TR 63133:2017 Semiconductor devices - Scan based ageing level estimation for semiconductor devices
    10/11/2017 - PDF - English - CEI
    Learn More
    €102.00

  • BS IEC 62047-30:2017

    Semiconductor devices. Micro-electromechanical devices. Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
    10/9/2017 - PDF - English - BSI
    Learn More
    €202.40

  • UNE-EN 60749-43:2017

    Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (Endorsed by Asociación Española de Normalización in October of 2017.)
    10/1/2017 - PDF - English - AENOR
    Learn More
    €76.00

  • DIN EN 60747-16-1:2017-10

    Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 - A1:2007 - A2:2017); German version EN 60747-16-1:2002 + A1:2007 + A2:2017
    10/1/2017 - PDF - German - DIN
    Learn More
    €163.80

  • DIN EN 62477-1 VDE 0558-477-1:2017-10

    Safety requirements for power electronic converter systems and equipment - Part 1: General (IEC 62477-1:2012 + A1:2016); German version EN 62477-1:2012 + A11:2014 + A1:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €268.93

  • BS EN 60749-43:2017

    Semiconductor devices - Mechanical and climatic test methods. Guidelines for IC reliability qualification plans
    9/22/2017 - PDF - English - BSI
    Learn More
    €236.90

  • IEC 62047-30 (2017-09)

    IEC 62047-30:2017 Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
    9/15/2017 - PDF - English - CEI
    Learn More
    €102.00

  • 17/30355780 DC


    9/6/2017 - PDF - English - BSI
    Learn More
    €23.00

  • NF EN 60749-43, C96-022-43 (09/2017)

    Semiconductor devices - Mechanical and climatic test methods - Part 43 : guidelines for IC reliability qualification plans - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43 : Directives concernant les plans de qualification de la fiabilité des CI
    9/1/2017 - Paper - French - AFNOR
    Learn More
    €112.42

  • NF C96-022-43, NF EN 60749-43 (09/2017)

    Semiconductor devices - Mechanical and climatic test methods - Part 43 : guidelines for IC reliability qualification plans
    9/1/2017 - PDF - English - UTE
    Learn More
    €112.42

  • IEC 60050-521 AMD 1 (2017-08)

    IEC 60050-521:2002/AMD1:2017 Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
    8/30/2017 - PDF - English, French - CEI
    Learn More
    €10.00

  • IEC 62880-1 (2017-08)

    IEC 62880-1:2017 Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
    8/23/2017 - PDF - English - CEI
    Learn More
    €142.00

  • NF C96-016-1/A2, NF EN 60747-16-1/A2 (08/2017)

    Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers
    8/19/2017 - PDF - English - UTE
    Learn More
    €63.42

  • IEC 60747-16-3 Edition 1.2 (2017-08)

    IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 consolidated version Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
    8/16/2017 - PDF - English - CEI
    Learn More
    €305.00

  • IEC 60747-16-3 AMD 2 (2017-08)

    IEC 60747-16-3:2002/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
    8/16/2017 - PDF - English - CEI
    Learn More
    €10.00

  • IEC 60747-16-4 Edition 1.2 (2017-08)

    IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 consolidated version Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
    8/16/2017 - PDF - English - CEI
    Learn More
    €254.00

  • IEC 60747-16-4 AMD 2 (2017-08)

    IEC 60747-16-4:2004/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
    8/16/2017 - PDF - English - CEI
    Learn More
    €10.00

  • BS IEC 62830-2:2017

    Semiconductor devices. Semiconductor devices for energy harvesting and generation. Thermo power based thermoelectric energy harvesting
    8/10/2017 - PDF - English - BSI
    Learn More
    €144.90

  • EIA JESD 30H:2017

    Descriptive Designation System for Electronic-device Packages
    8/1/2017 - PDF sécurisé - English - EIA
    Learn More
    €102.08

  • UNE-EN 60749-28:2017

    Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.)
    8/1/2017 - PDF - English - AENOR
    Learn More
    €80.00

  • UNE-EN 60749-5:2017

    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in August of 2017.)
    8/1/2017 - PDF - English - AENOR
    Learn More
    €42.00

  • UNE-EN 61954:2011/A2:2017

    Static VAR compensators (SVC) - Testing of thyristor valves (Endorsed by Asociación Española de Normalización in August of 2017.)
    8/1/2017 - PDF - English - AENOR
    Learn More
    €24.00

  • DIN EN 60747-16-6:2017-08

    Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (IEC 47E/568/CD:2017)
    8/1/2017 - PDF - English, German - DIN
    Learn More
    €114.10

  • NF EN 60747-16-1/A2, C96-016-1/A2 (08/2017)

    Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers - Dispositifs à semiconducteurs - Partie 16-1 : circuits intégrés hyperfréquences - Amplificateurs
    8/1/2017 - Paper - French - AFNOR
    Learn More
    €63.42

  • BS EN 60749-5:2017

    Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test
    7/20/2017 - PDF - English - BSI
    Learn More
    €144.90

  • NF C96-435-2, NF EN 62435-2 (07/2017)

    Electronic components - Long-term storage of electronic semiconductor devices - Part 2 : deterioration mechanisms
    7/14/2017 - PDF - English - UTE
    Learn More
    €91.08

  • NF C96-435-1, NF EN 62435-1 (07/2017)

    Electronic components - Long-term storage of electronic semiconductor devices - Part 1: general
    7/14/2017 - PDF - English - UTE
    Learn More
    €102.58

  • BS EN 60749-28:2017

    Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
    7/10/2017 - PDF - English - BSI
    Learn More
    €266.80

  • NF EN 62435-2, C96-435-2 (07/2017)

    Electronic components - Long-term storage of electronic semiconductor devices - Part 2 : deterioration mechanisms - Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 2 - Mécanismes de détérioration
    7/1/2017 - Paper - French - AFNOR
    Learn More
    €91.08

  • NF EN 62435-1, C96-435-1 (07/2017)

    Electronic components - Long-term storage of electronic semiconductor devices - Part 1: general - Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 1: Généralités
    7/1/2017 - Paper - French - AFNOR
    Learn More
    €102.58

  • UNE-EN 60749-3:2017

    Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (Endorsed by Asociación Española de Normalización in July of 2017.)
    7/1/2017 - PDF - English - AENOR
    Learn More
    €57.00

  • UNE-EN 60749-4:2017

    Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (Endorsed by Asociación Española de Normalización in July of 2017.)
    7/1/2017 - PDF - English - AENOR
    Learn More
    €42.00

  • UNE-EN 60749-6:2017

    Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (Endorsed by Asociación Española de Normalización in July of 2017.)
    7/1/2017 - PDF - English - AENOR
    Learn More
    €38.00

  • UNE-EN 60749-9:2017

    Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
    7/1/2017 - PDF - English - AENOR
    Learn More
    €42.00

  • UNE-EN 60747-16-1:2002/A2:2017

    Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by Asociación Española de Normalización in July of 2017.)
    7/1/2017 - PDF - English - AENOR
    Learn More
    €35.00

  • IEC 60749-43 (2017-06)

    IEC 60749-43:2017 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
    6/15/2017 - PDF - English, French - CEI
    Learn More
    €203.00

  • 17/30343732 DC


    6/5/2017 - PDF - English - BSI
    Learn More
    €23.00

  • IPC 7091:2017

    Design and Assembly Process Implementation of 3D Components
    6/1/2017 - Paper - English - IPC
    Learn More
    €176.00

  • DIN EN 60700-2 VDE 0553-2:2017-06

    Thyristor valves for high voltage direct current (HVDC) power transmission - Part 2: Terminology (IEC 60700-2:2016); German version EN 60700-2:2016
    6/1/2017 - Paper - German - VDE
    Learn More
    €69.60

  • NF C96-435-5, NF EN 62435-5 (05/2017)

    Electronic components - Long-term storage of electronic semiconductor devices - Part 5 - die and wafer devices
    5/19/2017 - PDF - English - UTE
    Learn More
    €91.08

  • NF EN 62435-5, C96-435-5 (05/2017)

    Electronic components - Long-term storage of electronic semiconductor devices - Part 5 - die and wafer devices - Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 5 - Dispositifs de puces et plaquettes
    5/1/2017 - Paper - French - AFNOR
    Learn More
    €91.08

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